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GB/T 18735-2014 English PDF

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GB/T 18735-2014: Microbeam analysis -- General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope (AEM/EDS)
Status: Valid

GB/T 18735: Evolution and historical versions

Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)StatusPDF
GB/T 18735-2014English259 Add to Cart 3 days [Need to translate] Microbeam analysis -- General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope (AEM/EDS) Valid GB/T 18735-2014
GB/T 18735-2002English279 Add to Cart 3 days [Need to translate] General specification of analytical electron microscopy (AEM / EDS) nanometer thin standard Obsolete GB/T 18735-2002

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Basic data

Standard ID GB/T 18735-2014 (GB/T18735-2014)
Description (Translated English) Microbeam analysis -- General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope (AEM/EDS)
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard G04
Classification of International Standard 71.040.50
Word Count Estimation 11,191
Date of Issue 7/24/2014
Date of Implementation 3/1/2015
Older Standard (superseded by this standard) GB/T 18735-2002
Quoted Standard GB/T 4930-2008; GB/T 21636-2008
Regulation (derived from) National Standards Bulletin No. 19, 2014
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary This standard specifies the analysis of electron microscopy (AEM/EDS) that is equipped with a transmission electron microscope or scanning electron microscope equipped with an X-ray attachment spectroscopy (EDS), measuring the scale factor of the nano-thi

GB/T 18735-2014: Microbeam analysis -- General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope (AEM/EDS)


---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Microbeam analysis. General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope (AEM/EDS) ICS 71.040.50 G04 National Standards of People's Republic of China Replacing GB/T 18735-2002 Microbeam analysis analysis electron microscope (AEM/EDS) Nano-thin standard general specification referencematerialsforanalyticaltransmissionelectronmicroscope (AEM/EDS) Issued on. 2014-07-24 2015-03-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released

Table of Contents

Preface Ⅰ Introduction Ⅱ 1 Scope 1 2 Normative references 1 3 Terms and definitions 4 thin standard technical requirements 2 Detection Study Material 3 5 5.1 detection equipment 3 5.2 sample stage 3 5.3 measurement conditions and method 3 5.4 Standard discrimination based on thin 4 6 Standard Classification 4 6.1 Determination of the chemical composition of thin Sample 4 6.2 Thin standard level determined 4 7 Packaging and storage 4 7.1 Standard Package 4 7.2 Transport 4 7.3 safekeeping 5 7.4 Validity of the standard 5 Reference 6

Foreword

This standard was drafted in accordance with GB/T 1.1-2009 given rules. This standard replaces GB/T 18735-2002 "Analysis of electron microscopy (AEM/EDS) nano-thin standard universal norms." This standard compared with GB/T 18735-2002 main changes are as follows. --- English name changed to. "micro-beam analysis analysis electron microscope (AEM/EDS) nano-thin standard universal norms" and "Microbeam ananlysis-Generalguideforthespecificationofnanometerthinreferencematerialsforana- lyticaltransmissionelectronmicroscope (AEM/EDS) "; --- Modify the contents of the scope of application (see Chapter 1); --- Update and increase the reference standard (see Chapter 2); --- Additions and modifications to the terms and definitions, formulas and principles in the following terms be expressed in the comments (see Chapter 3); --- The "standard" to "thin standard" (see Chapter 4, Chapter 5); --- Chemical modification of the thin standard value and the number of thin standard requirements (see 4.1, 4.2); --- Increased computing illustration description and comments on the standard thin thickness requirements (see 4.3); --- Increased explanatory comment on thin standard stability requirements (see 4.4); --- The "carbon support network" to "ultra-thin carbon support network" (see 4.5); --- Added "instrumentation" and "sample stage" sub-title (see 5.1, 5.2); --- The "sample" to "research material" (see 5.1,5.2,5.3.4); --- Adds several commonly used typical operating voltage value analysis (see 5.3.1); --- Modify the sample and measuring the number of elements in X-ray intensity measured statistical measurement requirements (see 5.3.3,5.3.5 and 5.3.8); --- Increasing the scale factor when measuring the reference element explanatory note (see 5.3.6); --- Modifications and additions expanded uncertainty and uncertainty scale factor KA-B and the corresponding comments (see 5.3.8 and 5.3.9); --- Revised standard thin discriminating basis (see 5.4); --- Increasing the standard classification (see Chapter 6); --- Contribute to increased understanding of the standards required by reference. The standard micro-beam analysis by the National Standardization Technical Committee (SAC/TC38) and focal points. This standard was drafted. Wuhan University of Technology. The main drafters of this standard. Sun Zhenya. This standard was first released in December 2002, this is the first revision.

Introduction

The criteria specified in this standard, mainly for electron microscope analysis, X-ray spectrometer that is equipped with a transmission electron microscope attachment (AEM/EDS) method that is based on the ratio of Cliff-Lorimer method, can ignore the effect of X-ray absorbing substrate samples were inorganic thin samples When quantitative elemental analysis, measurement scale factor KA-B nano-thin general principles common specification and test method standard samples required. To further Develop quantitative analysis of standard AEM foundation. The standards for the conduct quantitative elemental particles and micro electron microscope analysis of the sample analyzed, in particular to adapt to the rapid development of nano-materials Component quantitative analysis and high acceleration voltage transmission electron microscope analysis of the development, the establishment of quantitative analysis method based on the comparison of standard samples, quantitative increase Analytical accuracy has a positive role in guiding. Microbeam analysis analysis electron microscope (AEM/EDS) Nano-thin standard general specification

1 Scope

This standard specifies the analysis of electron microscopy (AEM/EDS) that is equipped with a transmission electron microscope or scanning electron microscope equipped with X-ray energy attachments Spectroscopy (EDS), measuring the scale factor KA-B nano-thin standard technical requirements, test conditions and measurement methods. This standard applies to the use of electron microscopy analysis (AEM/EDS) micro-area element of the inorganic thin samples of quantitative analysis. This standard does not include Machines and biological standards.

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein Member. For undated references, the latest edition (including any amendments) applies to this document. GB/T 4930-2008 micro-beam electron microprobe analysis standard sample analysis the technical conditions Guidelines (ISO 14595.2003, IDT) GB/T 21636-2008 micro beam analysis electron probe microanalysis (EPMA) Terminology (ISO 23833.2006, IDT)

3 Terms and Definitions

GB/T 21636-2008 define the following terms and definitions apply to this document. 3.1 Analysis of electron microscopy analyticaltransmissionelectronmicroscope Means is equipped with X-ray energy dispersive spectroscopy (EDS) transmission electron microscope or a transmission electron microscope equipped with a scanning attachment can be performed simultaneously on Micro Elemental analysis. 3.2 Critical thickness criticalthickness TS Under certain acceleration voltage absorption effect of the X-ray region of the sample analysis can be ignored and do not need the maximum absorption correction when thickness. Note. TS available critical thickness formula (1). TS = 1 (5ρ | μB-μA | cscα) (1) Where. ρ --- density of the sample; ΜA --- A characteristic element of the X-rays in the sample mass absorption coefficient; Characterized μB --- element B X-rays in the sample mass absorption coefficient; α --- X-ray spectrometer associated X-ray detection angle. 3.3 Scaling factor ratiofactor KA-B At a certain voltage, the known composition and thickness less than or equal to the critical thickness of thin samples, from the same micro-elements measured simultaneously

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