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GA/T 1062-2013 English PDF

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GA/T 1062-2013: Calibration specifications for IC-card cursor test system
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GA/T 1062-2013English319 Add to Cart 3 days [Need to translate] Calibration specifications for IC-card cursor test system GA/T 1062-2013

PDF similar to GA/T 1062-2013


Standard similar to GA/T 1062-2013

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Basic data

Standard ID GA/T 1062-2013 (GA/T1062-2013)
Description (Translated English) Calibration specifications for IC-card cursor test system
Sector / Industry Public Security (Police) Industry Standard (Recommended)
Classification of Chinese Standard A52
Classification of International Standard 17.040.01
Word Count Estimation 9,968
Date of Issue 2013-04-01
Date of Implementation 2013-05-01
Quoted Standard JJF 1033-2008; JJF 1059
Regulation (derived from) Industry standard filing notice 2014 No. 4 (total 172)
Issuing agency(ies) Ministry of Public Security
Summary This standard specifies the IC card cursor test system measurement performance requirements, general technical requirements, calibration conditions, calibration items and calibration methods. This standard applies to IC card cursor test system for the fir

GA/T 1062-2013: Calibration specifications for IC-card cursor test system

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration specifications for IC-card cursor test system ICS 17.040.01 A52 People's Republic of China Public Security Industry Standards IC card system calibration specification test cursor Issued on. 2013-04-01 2013-05-01 implementation People's Republic of China Ministry of Public Security

Foreword

This standard was drafted in accordance with GB/T 1.1-2009 given rules. The standard proposed by First Research Institute of Ministry of Public Security. This standard by the Ministry of Public Security Public Security Applications Standardization Technical Committee. This standard is mainly drafted by. First Research Institute of Ministry of Public Security. The main drafters of this standard. Wang Min, Zhang Hao, Wang Zhigang, Teng Xu, Lu Yuhua, Tian Xin. IC card system calibration specification test cursor

1 Scope

This standard specifies the requirements for performance measurement cursor IC card test system, general technical requirements, calibration conditions, calibration and calibration items method. This standard applies to IC card cursor test system for the first time calibration, calibration and subsequent in-service inspection.

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein Member. For undated references, the latest edition (including any amendments) applies to this document. JJF1033-2008 appraisal measurement standard specification JJF1059 Evaluation and Expression of Uncertainty in Measurement

3 Terms and Definitions

The following terms and definitions apply to this document. 3.1 IC card system IC-cardcursortestsystem test cursor For detecting the four corners of the IC card equipment cursor size data quality. System by the detector (camera, lens, light source), and IPC XPE operating system and cursor test software and other components.

4 metering performance requirements

4.1 metric standard model geometry measurement error should not exceed ± 0.01mm. 4.2 cursor size indication error should not exceed ± 0.1mm. 4.3 repeatability should not exceed 0.1mm.

5 General technical requirements

5.1 Appearance IC card cursor test system (hereinafter referred to as the test system) shall be marked with the name plate, indicating the product name, specifications, serial number, manufacturer name. 5.2 Requirements 5.2.1 The test system should be placed in a stable and reliable, in a horizontal state of the table to use. 5.2.2 The test system should not affect the normal operation of a variety of injuries. Each separate instrument intact, cables to ensure reliable operation. 5.2.3 The test system should be able to work properly.

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