GM/T 00052021 PDF in English
GM/T 00052021 (GM/T00052021, GMT 00052021, GMT00052021)
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Randomness test specification
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Randomness test specification
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GM/T 00052021: PDF in English (GMT 00052021) GM/T 00052021
CRYPTOGRAPHIC INDUSTRY STANDARD
OF THE PEOPLE’S REPUBLIC OF CHINA
ICS 35.030
CCS L 80
Replacing GM/T 00052012
Randomness test specification
ISSUED ON: OCTOBER 18, 2021
IMPLEMENTED ON: MAY 01, 2022
Issued by: State Cryptography Administration
Table of Contents
Foreword ... 3
1 Scope ... 5
2 Normative references ... 5
3 Terms and definitions... 5
4 Symbols ... 6
5 Randomness test method ... 8
5.1 Singlebit frequency test method ... 8
5.2 Inblock frequency test method ... 8
5.3 Poker test method ... 9
5.4 Overlapping subsequence test method ... 10
5.5 Test method for total number of runs ... 11
5.6 Test method for run distribution ... 12
5.7 Test method for inblock maximum run ... 13
5.8 Binary derivation test method ... 14
5.9 Autocorrelation test method ... 15
5.10 Matrix rank test method ... 16
5.11 Test method for cumulative sum ... 17
5.12 Approximate entropy test method ... 18
5.13 Linear complexity test method ... 19
5.14 Test method for Maurer general statistics ... 20
5.15 Discrete Fourier test method ... 22
6 Determination of randomness test ... 23
6.1 Overview ... 23
6.2 Determination of sample passing rate ... 23
6.3 Determination of sample distribution uniformity ... 23
6.4 Determination of randomness test results ... 24
Annex A (normative) Sample length and test setting ... 25
Annex B (informative) Principle of randomness test ... 27
Annex C (informative) Examples of randomness test results ... 38
Randomness test specification
1 Scope
This document specifies the randomness test indicators and test methods applicable to
binary sequence.
2 Normative references
There are no normative references in this document.
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
3.1 binary sequence
A bit string consisting of "0" and "1".
NOTE: Unless otherwise specified, the sequences referred to in this document are all binary
sequences.
3.2 randomness hypothesis
When testing the randomness of a binary sequence, it is first assumed that the sequence
is random. This hypothesis is called the null hypothesis or the null hypothesis, denoted
as H0. The hypothesis contrary to the null hypothesis, that is, the sequence is not random,
is called the alternative hypothesis, denoted as Hα.
3.3 randomness test
A function or procedure for binary sequence test. It can be used to judge whether to
accept the randomness null hypothesis.
3.4 significance level
The probability of incorrectly judging random sequences as nonrandom sequences in
randomness test.
3.5 sample
Binary sequences for randomness test.
3.6 sample group
A collection of multiple samples.
3.7 sample length
The number of bits in the sample.
3.8 sample size
The number of samples in the sample group.
3.9 test parameter
Parameters that need to be set for randomness test.
4 Symbols
The following symbols apply to this document.
d: The number of bits for the logical left shift of the sequence in autocorrelation test.
H0: Original hypothesis (null hypothesis).
Hα: Alternative hypothesis.
K: The number of Lbit subsequences of the sequence to be tested in the general
statistical test.
L: General statistical neutron sequence length.
Li: The linear complexity of subsequence in the linear complexity test.
M: The number of rows of the matrix in the matrix rank test.
m: The bit length of the subsequence.
N: The number of mbit subsequences in an nbit sequence to be tested.
n: The bit length of the binary sequence to be tested.
Q: The number of columns of the matrix in the matrix rank test, or the number of Lbit
subsequences of the initial sequence in the general statistical test.
V: Statistical value.
Xi: 2εi1.
α: Significance level for sample passing rate test.
αT: Significance level used for sample distribution uniformity test.
ε: Binary sequence to be tested.
ε': A new sequence generated according to certain rules on the basis of ε.
π: The proportion of 1 in the binary sequence to be tested.
Σ: Summation symbol.
*: Multiplication, sometimes omitted.
ln(x): The natural logarithm of x.
log2(x): The base 2 logarithm of x.
: The largest integer not greater than x.
max: Take the maximum value from several elements.
min: Take the minimum value from several elements.
Φ(x): Cumulative distribution function of standard normal distribution.
P_value: A metric to measure the randomness of a sample, which is used to determine
the passing rate of the sample.
Q_value: A metric to measure the randomness of samples, which is used to determine
the uniformity of sample distribution.
erfc: Complementary Error Function.
igamc: Incomplete Gamma Function.
Vn(obs): The total number of runs in the binary sequence to be tested.
ApEn(m): Approximate entropy of the binary sequence to be tested.
modulus(x): The operation used to calculate the modulus value of the complex
coefficient x.
: The first statistic in overlapping subsequence test.
: The second statistic in overlapping subsequence test.
Step 5: Calculate .
Test settings are as required in Annex A. See B.11 for the test principle.
5.11.3 Result determination
Compare the result of P_value calculated in 5.11.2 with α. If P_value≥α, it is considered
that the sequence to be tested passes the test of the cumulative sum, otherwise it fails to
pass the test of the cumulative sum.
5.12 Approximate entropy test method
5.12.1 Overview
Approximate entropy test evaluates its randomness by comparing the frequency of m
bit overlapping subsequence modes with the frequency of m+1bit overlapping
subsequence modes. Calculate the frequency difference between the mbit overlapping
subsequence mode and the m+1bit overlapping subsequence mode. A small difference
value indicates that the sequence to be tested has regularity and continuity. A large
difference value indicates that the sequence to be tested has irregularity and
discontinuity. For any m, the approximate entropy of the random sequence shall be
approximately equal to ln2.
5.12.2 Test steps
The approximate entropy test steps are as follows.
Step 1: Construct a new sequence ε' from the sequence ε to be tested. The construction
method is as follows: Add the m1 bits of data at the beginning of the sequence ε to the
end of the sequence ε to get ε'. The length of the new sequence ε' is n'=n+m1.
Step 2: Count the frequency of occurrence of the sequence mode of m bits for all 2m in
n. Denote the frequency of occurrence of the mbit mode i1i2…im as vi1i2…im.
Step 3: For all j (0≤j≤2m1), calculate , of which j is the decimal value
corresponding to the mbit mode i1i2…im.
5.15.3 Result determination
Compare the result of P_value calculated in 5.15.2 with α. If P_value≥α, it is considered
that the sequence to be tested passes the discrete Fourier test, otherwise it fails the
discrete Fourier test.
6 Determination of randomness test
6.1 Overview
It shall use the 15 randomness test methods specified in Chapter 5 and the test settings
specified in Annex A to test the randomness of the binary sequence sample group. A
randomness test method corresponds to at least one randomness test item. If a
randomness test method adopts different test parameter settings (see Annex A for details)
or has different test modes (such as the inblock maximum run test method, cumulative
sum test method), or has multiple statistical values (such as overlapping subsections)
sequence test method), it shall be tested as a separate random test item. The passing rate
and distribution uniformity of each test item in the binary sequence sample group shall
be respectively subjected to determination of conformity. For example, the test method
of cumulative sum includes two modes: forward cumulative sum and backward
cumulative sum. The forward cumulative sum and the backward cumulative sum shall
be tested as 2 independent test items. The passing rate and distribution uniformity of
the forward cumulative sum and backward cumulative sum of the binary sequence
sample group are respectively judged for conformity.
This document determines the sample size in the binary sequence sample group to be
1000.
6.2 Determination of sample passing rate
For each randomness test item, count the number of samples whose P _value is greater
than or equal to α in the binary sequence sample group. The significance level
determined by this document for sample passing rate test is α=0.01.
Let the sample size be s. When the number of samples passing a test item is greater than
or equal to , then the sample group shall be considered to pass this
test, otherwise it fails this test. For example, if the sample size is 1000, the number of
samples that pass the test item shall be greater than or equal to 981.
6.3 Determination of sample distribution uniformity
For each randomness test item, the Q_value value of each sample in the binary sequence
Maurer general statistics (referred to as general statistics) test mainly tests whether the
sequence to be tested can be compressed losslessly. If the sequence to be tested can be
significantly compressed, the sequence is considered nonrandom, because random
sequences cannot be significantly compressed.
General statistics test can be used to test various characteristics of the sequence to be
tested. But this does not mean that general statistics test is an assembly of the previous
tests. General statistics test takes a completely different approach from other tests.
Certain statistical defects of the sequence to be tested can be tested. A sequence can be
tested by general statistics if and only if the sequence is incompressible.
General statistics test requires a large amount of data. It divides the sequence into
subsequences of length L. Then the sequence to be tested is divided into two parts: the
initial sequence and the test sequence. The initial sequence includes Q subsequences. Q
shall be greater than or equal to 10*2L. The test sequence includes K subsequences. K
shall be greater than or equal to 1000*2L. Therefore, the sequence length n shall be
greater than or equal to 10*2L*L +1000*2L*L. The value range of L shall be 1≤L≤16.
The value of L shall not be less than 6. Obviously, when L=6, n is at least 387840. When
the sequence length n is constant, take .
First, traverse the initial sequence (unit is blocks) from the beginning. Find the last
occurrence of each Lbit pattern in the initial sequence (block number). If an Lbit mode
does not appear in the initial sequence, set its position to 0. After that, the test sequence
is traversed from the beginning. Obtain an Lbit subsequence each time. Calculate the
difference between the position of this subsequence and the position of the last
occurrence before it. That is the block number subtraction. Record the subtraction result
as the distance len. Then take the base 2 logarithm of the distance len. Finally, add all
the logarithm results. In this way, the statistical value shall be obtained:
Calculate the expected value:
In fact, the expected value of fn is the expected value of the random variable log2G.
Where, G=GL is the geometric distribution with parameters 12L. The geometric
distribution is defined as: Let the probability of a successful Bernoulli experiment be p,
and take the random variable X as the number of independent Bernoulli experiments
performed before the success, then:
...... Source: Above contents are excerpted from the PDF  translated/reviewed by: www.chinesestandard.net / Wayne Zheng et al.
