GB/T 42977-2023 PDF English
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GB/T 42977-2023: Nanotechnology - Nano-enabled optoelectrical display - Optical reliability assessment for quantum dot enabled light conversion film
---This is an excerpt. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.), auto-downloaded/delivered in 9 seconds, can be purchased online: https://www.ChineseStandard.net/PDF.aspx/GBT42977-2023
GB
NATIONAL STANDARD OF THE
PEOPLE’S REPUBLIC OF CHINA
ICS 31.120
CCS G 31
Nanotechnology - Nano-enabled optoelectrical display -
Optical reliability assessment for quantum dot enabled light
conversion film
Issued on: SEPTEMBER 07, 2023
Implemented on: APRIL 01, 2024
Issued by. State Administration for Market Regulation;
National Standardization Administration.
Table of Contents
Foreword... 3
Introduction... 4
1 Scope... 5
2 Normative references... 5
3 Terms and definitions... 6
4 Instruments and equipment... 6
5 Optical reliability test conditions... 9
6 Test samples... 10
7 Optical reliability test operation procedure... 11
8 Optical performance test method and data processing... 11
9 Optical reliability judgment index... 14
10 Measurement uncertainty... 15
11 Test report... 15
Appendix A (Informative) Optical reliability test report template... 17
References... 18
Nanotechnology - Nano-enabled optoelectrical display -
Optical reliability assessment for quantum dot enabled light
conversion film
1 Scope
This document provides a method for measuring the optical reliability and reliability
judgment indicators of quantum dot enabled light conversion film (Q-LCF).
This document is applicable to the optical reliability measurement of quantum dot
enabled light conversion film for liquid crystal display devices; other film materials
with light conversion function shall use this standard as a reference.
2 Normative references
The contents of the following documents constitute essential clauses of this document
through normative references in the text. Among them, for dated references, only the
version corresponding to that date applies to this document; for undated references, the
latest version (including all amendments) applies to this document.
GB/T 2423.1 Environmental testing for electric and electronic products - Part 2.Test
methods - Tests A. Cold
GB/T 2423.2 Environmental testing for electric and electronic products - Part 2.Test
methods - Tests B. Dry heat
GB/T 2423.3 Environmental testing - Part 2.Testing method - Test Cab. Damp heat,
steady state
GB/T 2423.22 Environmental testing - Part 2.Test methods - Test N. Change of
temperature
GB 19510.1-2009 Controlgear for electric light sources - Part 1.General and safety
requirements
GB/T 42976-2023 Nanotechnology - Nano-enabled optoelectrical display -
Measurement of optical performance for quantum dot enabled light conversion film
3 Terms and definitions
The terms and definitions as defined in GB/T 42976-2023, as well as the following
terms and definitions, apply to this document.
3.1
Optical reliability
The ability of a product to achieve specified optical performance under specified
conditions and within a specified time.
[Source. GB/T 33721-2017, 3.2, modified]
3.2
Invalid edge
The edge area where the quantum dot enabled light conversion film fails due to
obvious optical performance degradation.
4 Instruments and equipment
4.1 Reliability test platform equipment
4.1.1 Overview
The optical reliability test of the quantum dot enabled light conversion film is divided
into illumination test and storage test, according to the conditions of accelerated aging
test with or without light irradiation. The illumination test is carried out on the
illumination test platform; the storage test is carried out on the storage test platform.
4.1.2 Illumination test platform
4.1.2.1 Structure
The structure of the illumination test platform is as shown in Figure 1, which consists
of a brightness enhancement film, a sample stage, a backlight system. The brightness
enhancement film, the sample stage, the backlight system are stacked from top to
bottom and have the same normal line.
4.2.3 Hot-cold shock test chamber. Temperature range is -40 °C ~ 100 °C; temperature
accuracy is ≤ 1 °C; the use of the test chamber shall comply with the requirements of
GB/T 2423.22.
4.2.4 Constant temperature and humidity test chamber. Temperature range is 0 °C ~
100 °C; temperature accuracy is ≤ 1 °C; the maximum humidity test range covers at
least 98% relative humidity, at a relative humidity accuracy of ≤ 5%; the use of the test
chamber shall comply with the requirements of GB/T 2423.3.
4.2.5 Room temperature test chamber. It shall be a dark chamber; the illumination
inside the chamber is ≤ 0.1 lx. The atmospheric pressure and temperature inside the
chamber are consistent with those in the storage room. The temperature is required to
be constant at 23 °C ± 2 °C and the relative humidity is 50% ± 10%.
4.3 Optical performance test platform
The optical performance test platform shall meet the requirements of GB/T 42976-2023.
4.4 Film ruler
The film ruler, which has a measuring range of 100 mm or larger and a minimum scale
of ≤ 0.1 mm.
4.5 Optical microscope
The optical microscope shall have its own light source and the test accuracy shall be ≤
0.1 mm.
5 Optical reliability test conditions
5.1 Test type and cycle
The optical reliability test of quantum dot enabled light conversion film can be divided
into constant condition aging test and periodic cycle test. The test cycle of the constant
condition aging test is set according to the accelerated aging test conditions and reached
an agreement with the user. The conventional constant condition aging test cycle should
be 1000 h. The periodic cycle aging test is usually a cold and hot shock test, which
should be carried out 100 cycles.
Note. Only one type of aging test condition is tested for a single sample. If other aging tests are
added, the initial sample that has not undergone reliability tests needs to be taken.
5.2 Accelerated aging test conditions
5.2.1 Constant temperature aging test
The constant temperature aging test determines the optical reliability of the quantum
dot enabled light conversion film, by setting a single acceleration factor of temperature.
It is divided into low temperature test and high temperature test. The low temperature
test is carried out in a low temperature test chamber (4.2.2). The temperature in the
chamber shall be set to -40 °C. The high temperature test is carried out in a high
temperature test chamber (4.2.1). The conventional high temperature test temperature
shall be set to 65 °C. The test conditions can also be negotiated with the user.
5.2.2 Constant temperature and humidity aging test
The constant temperature and humidity aging test determines the optical reliability of
the quantum dot enabled light conversion film, by setting a double acceleration factor
of temperature and humidity. The constant temperature and humidity aging test is
carried out in a constant temperature and humidity test chamber (4.2.4). The
conventional constant temperature and humidity test temperature should be set to 60 °C;
the humidity shall be set to 90% relative humidity. It should not exceed 65 °C and 95%
relative humidity. The test conditions can also be negotiated with the user.
5.2.3 Cold-hot shock aging test
The cold-hot shock aging test determines the optical reliability of the quantum dot
enabled light conversion film, by setting the temperature acceleration factor. It is carried
out in a thermal shock test chamber (4.2.3). The low temperature condition should be
set to -40 °C; the high temperature test condition should be set to 85 °C; the transition
temperature in the cycle should be set to 25 °C. The maintenance time of a single cycle
of high and low temperature test should be 30 minutes; the single heating/cooling time
should be less than 5 minutes. The test conditions can also be negotiated with the user.
5.2.4 Light aging test
The light aging test can be divided into high temperature light aging test and constant
temperature and humidity light aging test. The light test platform (4.1.2) is placed in an
appropriate test chamber (4.2) for the test. The temperature conditions of the high
temperature light aging test are set according to 5.2.1; the temperature and humidity
conditions of the constant temperature and humidity light aging test are set according
to 5.2.2.The lighting conditions are set according to the average irradiance on the
surface directly exposed to light of the test sample, which should be selected from Table
1.
The temperature of the light aging test condition should be 40 °C; the humidity shall be
85% relative humidity; the light intensity should be the light source component 1 in
Table 1.
6 Test samples
Quantum dot enabled light conversion film test samples shall be selected from products
8.1.2 Test nodes
During the optical reliability test, the changes in optical performance shall be recorded.
The test nodes shall be 0 h, 24 h, 72 h, 168 h, 336 h, 504 h, 1000 h, 2000 h, 3000 h. The
test node setting can also be negotiated with the user.
8.2 Test method
8.2.1 Optical performance test
Based on the contents of Chapter 8 and Chapter 9 of GB/T 42976-2023, test brightness
L, chromaticity coordinates (x, y), light conversion efficiency LCE.
8.2.2 Invalid edge test
8.2.2.1 Overview
After the quantum dot enabled light conversion film has been subjected to the
accelerated aging test, the maximum invalid edge can be tested as one aspect of optical
reliability evaluation. The invalid edge test method can be divided into the optical
microscope test method and the film ruler test method.
8.2.2.2 Optical microscope to measure the maximum invalid edge
The optical microscope test steps are as follows.
a) Place the test sample flat on the stage of the optical microscope; fix it;
b) Find the edge area of the test sample in the field of view; select an objective lens
with a suitable magnification; take an image after focusing clearly;
c) Measure the maximum width of the invalid edge on the edge of the sample in the
image;
d) Select more than 3 different areas on the edge of the sample, to repeat the above
steps; obtain the maximum value, which is recorded as the maximum invalid edge
d of the sample.
8.2.2.3 Film ruler to measure the maximum invalid edge
The film ruler test steps are as follows.
a) Place the quantum dot enabled light conversion film test sample flat on the stage;
b) Irradiate the sample with an ultraviolet light source (see Figure 2); the peak
wavelength of the ultraviolet light source should be 395 nm ~ 415 nm;
c) Invalid edges can be seen on the edges of the sample with the naked eye; use a
10 Measurement uncertainty
Depending on the instrument, experimental conditions, testing personnel's operating
specifications, the uncertainty of the optical reliability measurement of quantum dot
enabled light conversion film varies to a certain extent.
In order to provide an appropriate test background, an uncertainty assessment shall be
given in the test report. Identify the important sources of uncertainty (Type A
uncertainty and Type B uncertainty) for the various test methods in this document in
order of importance. The report should include the evaluation of Type A and Type B
uncertainty and how they are combined to give the total expanded uncertainty of the
measurement.
Any change in the experimental steps changes the composition of the uncertainty. Once
the measurement steps are changed, the uncertainty evaluation shall be reviewed.
The uncertainty of light conversion efficiency can be found in Chapter 7 of GB/T
37664.1-2019.
11 Test report
The test report shall include but is not limited to the following.
a) The standard number based on which the test is based;
b) The name and number of the test sample;
c) The type, specification, quantity of the test sample;
d) The model of the test instrument and equipment;
e) Standard measurement conditions and standard setting conditions (test conditions
of instruments and equipment);
f) Chromaticity and brightness test results;
g) Light conversion efficiency test results;
h) Maximum invalid edge test results;
i) Standard test environment conditions (temperature, humidity, darkroom);
j) Test laboratory;
k) Test personnel.
......
Source: Above contents are excerpted from the full-copy PDF -- translated/reviewed by: www.ChineseStandard.net / Wayne Zheng et al.
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