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GB/T 17626.3-2023 PDF English

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GB/T 17626.3-2023: Electromagnetic compatibility - Testing and measurement techniques - Part 3: Radiated, radio-frequency, electromagnetic field immunity test
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GB/T 17626.3: Evolution and historical versions

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GB/T 17626.3-2023English905 Add to Cart 0-9 seconds. Auto-delivery Electromagnetic compatibility - Testing and measurement techniques - Part 3: Radiated, radio-frequency, electromagnetic field immunity test Valid
GB/T 17626.3-2016English395 Add to Cart 0-9 seconds. Auto-delivery Electromagnetic compatibility -- Testing and measurement techniques -- Radiated, radio-frequency, electromagnetic field immunity test Obsolete
GB/T 17626.3-2006English200 Add to Cart 0-9 seconds. Auto-delivery Electromagnetic compatibility -- Testing and measurement techniques -- Radiated, radio-frequency, electromagnetic field immunity test Obsolete
GB/T 17626.3-1998English799 Add to Cart 3 days Electromagnetic compatibility--Testing and measurement techniques--Radiated, radio-frequency, electromagnetic field immunity test Obsolete

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GB/T 17626.3-2023: Electromagnetic compatibility - Testing and measurement techniques - Part 3: Radiated, radio-frequency, electromagnetic field immunity test


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GB NATIONAL STANDARD OF THE PEOPLE’S REPUBLIC OF CHINA ICS 33.100.20 CCS L 06 GB/T 17626.3-2023 / IEC 61000-4-3.2020 Replacing GB/T 17626.3-2016 Electromagnetic compatibility - Testing and measurement techniques - Part 3.Radiated, radio-frequency, electromagnetic field immunity test [IEC 61000-4-3.2020, Electromagnetic compatibility (EMC) - Part 4-3.Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test, IDT] Issued on: DECEMBER 28, 2023 Implemented on: JULY 01, 2024 Issued by. State Administration for Market Regulation; Standardization Administration of the People's Republic of China.

Table of Contents

Foreword... 5 Introduction... 10 1 Scope... 15 2 Normative references... 16 3 Terms, definitions and abbreviated terms... 16 3.1 Terms and definitions... 16 3.2 Abbreviated terms... 22 4 General... 23 5 Test levels and frequency ranges... 23 5.1 Selection of test level... 23 5.2 Test frequency ranges... 25 6 Test equipment... 26 6.1 Test instrumentation... 26 6.2 Description of the test facility... 27 6.3 Uniform field area (UFA)... 28 6.3.1 Characteristics of the UFA... 28 6.3.2 Constant field strength level setting method... 32 6.3.3 Constant power level setting method... 34 7 Test setup... 35 7.1 General... 35 7.2 Arrangement of table-top equipment... 36 7.3 Arrangement of floor-standing equipment... 39 7.4 Arrangement of wiring... 40 7.5 Arrangement of human body-mounted equipment... 41 8 Test procedure... 41 8.1 General... 41 8.2 Laboratory reference conditions... 42 8.2.1 General... 42 8.2.2 Climatic conditions... 42 8.2.3 Electromagnetic conditions... 42 8.3 Execution of the test... 42 8.4 Step sizes... 44 9 Evaluation of test results... 44 10 Test report... 45 Annex A (informative) Rationale for the choice of modulation for tests related to the protection against RF emissions from digital radio services... 47 A.1 Summary of available modulation methods... 47 A.2 Experimental results... 48 A.3 Secondary modulation effects... 51 A.4 Conclusion... 51 Annex B (informative) Field generating antennas... 52 B.1 Biconical antenna... 52 B.2 Log-periodic antenna... 52 B.3 Combination antennas... 52 B.4 Horn antenna and double ridge wave guide antenna... 52 Annex C (informative) Use of anechoic chambers... 53 C.1 General anechoic chamber information... 53 C.2 Use of ferrite-lined chambers at frequencies above 1 GHz... 54 C.2.1 Problems caused by the use of ferrite-lined chambers for radiated field immunity tests at frequencies above 1 GHz... 54 C.2.2 Solutions to reduce reflections... 54 Annex D (informative) Amplifier compression and non-linearity... 56 D.1 Objective of limiting amplifier distortion... 56 D.2 Possible problems caused by harmonics and saturation... 56 D.3 Limiting the harmonic content in the field... 57 D.4 Effect of linearity characteristic on the immunity test... 57 D.4.1 General... 57 D.4.2 Evaluation method of the linearity characteristic... 57 Annex E (informative) Guidance for product committees on the selection of test levels ... 61 E.1 General... 61 E.2 Test levels related to general purposes... 61 E.3 Test levels related to the protection against RF emissions from digital radio telephones ... 62 E.4 Special measures for fixed transmitters... 64 Annex F (informative) Selection of test methods... 65 Annex G (informative) Cable layout details... 67 G.1 Intentions of EUT setup for radiated immunity test... 67 G.2 Cable in the field... 67 G.3 Cables leaving the test area... 67 G.4 Turning the EUT cabinets... 68 Annex H (informative) Examples of test setups for large and heavy EUTs... 69 H.1 EUTs with bottom fed cables... 69 H.2 EUTs with overhead cables... 70 H.3 EUTs with multiple cables and AEs... 71 H.4 Large EUTs with side fed cables and multiple UFA windows... 72 Annex I (informative) Testing with multiple signals... 74 I.1 General... 74 I.2 Intermodulation... 74 I.3 Power requirements... 75 I.4 Level setting requirements... 76 I.5 Linearity and harmonics checks... 76 I.6 EUT performance criteria with multiple signals... 77 Annex J (normative) Measurement uncertainty due to test instrumentation... 78 J.1 General... 78 J.2 Uncertainty budgets for level setting... 78 J.2.1 Definition of the measurand... 78 J.2.2 MU contributors of the measurand... 78 J.2.3 Calculation examples for expanded uncertainty... 79 J.2.4 Explanation of terms... 80 J.3 Application... 81 J.4 Reference documents... 81 Annex K (informative) Calibration method for E-field probes... 82 K.1 Overview... 82 K.2 Probe calibration requirements... 82 K.2.1 General... 82 K.2.2 Calibration frequency range... 83 K.2.3 Frequency steps... 83 K.2.4 Field strength... 83 K.3 Requirements for calibration instrumentation... 84 K.3.1 General... 84 K.3.2 Harmonics and spurious signals... 84 K.3.3 Linearity check for probe... 85 K.3.4 Determination of the gain of the standard horn antennas... 86 K.4 Field probe calibration in anechoic chambers... 87 K.4.1 Calibration environments... 87 K.4.2 Validation of anechoic chambers for field probe calibration... 87 K.4.3 Probe calibration procedure... 94 K.5 Other probe calibration environments and methods... 97 K.5.1 General... 97 K.5.2 Field probe calibration using TEM cells... 97 K.5.3 Field probe calibration using waveguide chambers... 98 K.5.4 Field probe calibration using open-ended waveguides... 99 K.5.5 Calibration of field probes by gain transfer method... 99 K.6 Reference documents... 100 Bibliography... 101

Foreword

This document was drafted in accordance with the rules given in GB/T 1.1-2020 "Directives for standardization - Part 1.Rules for the structure and drafting of standardizing documents". This document is Part 3 of GB/T(Z) 17626 "Electromagnetic compatibility - Testing and measurement techniques". The following parts of GB/T(Z) 17626 have been issued. - GB/T 17626.1-2006, Electromagnetic compatibility -- Testing and measurement techniques -- Overview of immunity tests - GB/T 17626.2-2018, Electromagnetic compatibility -- Testing and measurement techniques -- Electrostatic discharge immunity test - GB/T 17626.3-2023, Electromagnetic compatibility -- Testing and measurement techniques -- Part 3.Radiated, radio-frequency, electromagnetic field immunity test - GB/T 17626.4-2018, Electromagnetic compatibility -- Testing and measurement techniques -- Electrical fast transient/burst immunity test - GB/T 17626.5-2019, Electromagnetic compatibility -- Testing and measurement techniques -- Surge immunity test - GB/T 17626.6-2017, Electromagnetic compatibility -- Testing and measurement techniques -- Immunity to conducted disturbances, induced by radio-frequency fields - GB/T 17626.7-2017, Electromagnetic compatibility -- Testing and measurement techniques -- General guide on harmonics and inter-harmonics measurements and instrumentation, for power supply systems and equipment connected thereto - GB/T 17626.8-2006, Electromagnetic compatibility (EMC) -- Part 4-8.Testing and measurement techniques -- Power frequency magnetic field immunity test - GB/T 17626.9-2011, Electromagnetic compatibility -- Testing and measurement techniques -- Pulse magnetic field immunity test - GB/T 17626.10-2017, Electromagnetic compatibility -- Testing and measurement techniques -- Damped oscillatory magnetic field immunity test - GB/T 17626.11-2023, Electromagnetic compatibility -- Testing and measurement techniques -- Part 11.Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase - GB/T 17626.12-2023, Electromagnetic compatibility -- Testing and measurement techniques -- Part 12.Ring wave immunity test - GB/T 17626.13-2006, Electromagnetic compatibility (EMC) -- Testing and measurement techniques -- Harmonics and inter-harmonics including mains signaling at a.c. power port low frequency immunity test - GB/T 17626.14-2005, Electromagnetic compatibility -- Testing and measurement techniques -- Voltage fluctuation immunity test - GB/T 17626.15-2011, Electromagnetic compatibility -- Testing and measurement techniques -- Flicker meter -- Functional and design specifications - GB/T 17626.16-2007, Electromagnetic compatibility -- Testing and measurement techniques -- Test for immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz - GB/T 17626.17-2005, Electromagnetic compatibility -- Testing and measurement techniques -- Ripple on d.c. input power port immunity test - GB/T 17626.18-2016, Electromagnetic compatibility -- Testing and measurement techniques -- Damped oscillatory wave immunity test - GB/T 17626.19-2022, Electromagnetic compatibility -- Testing and measurement techniques -- Part 19.Test for immunity to conducted, differential mode disturbances and signaling in the frequency range 2 kHz to 150 kHz at a. c. power ports - GB/T 17626.20-2014, Electromagnetic compatibility -- Testing and measurement techniques -- Emission and immunity testing in transverse electromagnetic (TEM) waveguide - GB/T 17626.21-2014, Electromagnetic compatibility -- Testing and measurement techniques -- Reverberation chamber test methods - GB/T 17626.22-2017, Electromagnetic compatibility (EMC) -- Testing and measurement techniques -- Radiated emissions and immunity measurements in fully anechoic rooms (FARs) - GB/T 17626.24-2012, Electromagnetic compatibility -- Testing and measurement techniques -- Test methods for protective devices for HEMP conducted disturbance - GB/T 17626.27-2006, Electromagnetic compatibility (EMC) -- Testing and measurement techniques -- Unbalance immunity test - GB/T 17626.28-2006, Electromagnetic compatibility (EMC) -- Testing and measurement techniques -- Variation of power frequency immunity test - GB/T 17626.29-2006, Electromagnetic compatibility (EMC) -- Testing and measurement techniques -- Voltage dips short interruptions and voltage variations on d.c. input power port immunity tests - GB/T 17626.30-2023, Electromagnetic compatibility -- Testing and measurement techniques -- Part 30.Power quality measurement methods - GB/T 17626.31-2021, Electromagnetic compatibility -- Testing and measurement techniques -- Part 31.AC mains ports broadband conducted disturbance immunity test - GB/Z 17626.33-2023, Electromagnetic compatibility -- Testing and measurement techniques -- Part 33.Measurement methods for high-power transient parameters - GB/T 17626.34-2012, Electromagnetic compatibility -- Testing and measurement techniques -- Voltage dips, short interruptions and voltage variations immunity tests for equipment with mains current more than 16 A per phase - GB/T 17626.39-2023, Electromagnetic compatibility -- Testing and measurement techniques -- Part 39.Radiated fields in close proximity immunity test This document replaces GB/T 17626.3-2016 "Electromagnetic compatibility -- Testing and measurement techniques -- Radiated, radio-frequency, electromagnetic field immunity test". Compared with GB/T 17626.3-2016, in addition to the structural and editorial changes, the main technical changes in this document are as follows. - Add the content of immunity test of RF sources adjacent to EUT (see Chapter 1 of this Edition); - Delete the definitions of Ec, Et, independent window method, induction field, Pc and scanning (see 3.10, 3.11, 3.14, 3.15, 3.20, 3.24 of Edition 2016); - Add the definitions of common mode absorption device, intermodulation, modulation factor, and reference ground plane (see 3.1.8, 3.1.17, 3.1.20, 3.1.24 of this Edition); - Add abbreviated terms (see 3.2 of this Edition); - Delete the test levels for digital wireless phones and other radio frequency transmitting devices (see 5.2 of Edition 2016); - Delete the 0.8m requirement for insulating tables and UFAs in the facility layout (see Figure 2 of Edition 2016); - Delete the requirement for the lower edge of 0.8 m in the picture in the UFA feature (see Figure 3 of Edition 2016); - Delete the description that the product is not too big, heavy and safe and can be placed on a 0.8m high insulation table for testing (see 7.2 of Edition 2016); - Add the requirement to use common mode absorbing devices to decouple cables (see 7.4 of this Edition); - Delete the upper limit requirement of the general test level frequency range (see 5.1 of Edition 2016); - Change the content of field calibration, changing "field calibration" to "level setting" (see 6.3 of this Edition; 6.2 of Edition 2016). This document identically adopts IEC 61000-4-3.2020 "Electromagnetic compatibility (EMC) - Part 4-3.Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test". This document has made the following minimal editorial changes. - To coordinate with existing standards, the name of the standard is changed to "Electromagnetic compatibility - Testing and measurement techniques - Part 3. Radiated, radio-frequency, electromagnetic field immunity test". Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. The issuing authority shall not be held responsible for identifying any or all such patent rights. This document was proposed by and shall be under the jurisdiction of National Technical Committee on Electromagnetic Compatibility of Standardization Administration of China (SAC/TC 246). The drafting organizations of this document. Shanghai Electrical Apparatus Research Institute, Ruifeng Radio Frequency Technology (Shanghai) Co., Ltd., Wuhu Saibao Robot Industry Technology Research Institute Co., Ltd., Hubei Institute of Medical Device Quality Supervision and Inspection, Shenzhen Zhiwei Intelligent Technology Co., Ltd., Xihua University, Zhejiang Medical Device Inspection Institute, China Merchants Jinling Shipbuilding (Nanjing) Co., Ltd., State Grid Sichuan Electric Power Company Marketing Service Center, Hunan Electric Power Research Institute Testing Group Co., Ltd., Shanghai Quality Supervision and Inspection Technology Research Institute, China Electric Power Science Research Institute Co., Ltd., Jiangsu Construction Vocational and Technical College, Shanghai Institute of Measurement and Testing Technology, China Electronics Technology Standardization Institute, China Academy of Information and Communications Technology, Lenovo (Beijing) Co., Ltd., Chengdu Xintong Software Co., Ltd., Guangdong Medical Equipment Quality Supervision and Inspection Institute, Zhangzhou Shiruite Optoelectronics Technology Co., Ltd., Shenzhen Hengyunchang Vacuum Technology Co., Ltd., Shenzhen Oumi Intelligent Technology Co., Ltd., Qianyu Micro-Nano Technology (Shenzhen) Co., Ltd., Shenzhen Lifu Medical Technology Co., Ltd. Company, Shenzhen Zhongke Supercomputer Technology Co., Ltd., Shenzhen Zhaoxin Microelectronics Co., Ltd., Qiyin Technology (Shenzhen) Co., Ltd., University of Science and Technology of China, Guangdong Zhongbi South China Testing Technology Co., Ltd., Hisense (Guangdong) Air Conditioning Co., Ltd., Dongdian Testing Technology Service (Tianjin) Co., Ltd., Shanghai Electrical Equipment Testing Institute Co., Ltd., Shanghai Tianwei Certification Technology Co., Ltd. Main drafters of this document. Hou Yixiao, Jin Xin, Wei Neng, Luo Yuxiang, Xu Yang, Chen Dongshan, Liu Xiaoxu, Xu Ke, Li Guorong, Liu Lina, Zhou Taiping, Chen Yegang, Wang Zhongge, Li Ni, Wang Yong, Xuanyuan Yunjia, Tian Heqing, Fu Hongying, Zhang Qiang, An Shaogeng, Lu Feiyan, Wei Bin, Zhang Ruizhao, Cai Yongbin, Le Weiping, Peng Jiong, Xu Di, Pan Shaohui, Ming Zhukui, Wang Xin, Li Ting, Tu Zhijian, Lu Yanhan, Zhang Meng, Zhang Rui, Bie Qingfeng. Versions of standard substituted by this document are. - It was GB/T GB/T 13926.3-1992 that was first issued in 1992; - It was first revised as GB/T 17626.3-1998 in 1998.The second revision was in 2006.The third revision was in 2016.

1 Scope

This document is applicable to the immunity requirements of electrical and electronic equipment to radiated electromagnetic energy. It establishes test levels and the required test procedures.

2 Normative references

The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. GB/T 4365-2003, Electrotechnical terminology -- Electromagnetic compatibility [IEC60050 (161).1990, IDT]

3 Terms, definitions and abbreviated terms

For the purposes of this document, the following terms and definitions apply. 3.1 Terms and definitions For the purposes of this document, the terms and definitions given in IEC 60050-161 and the following apply. 3.1.1 amplitude modulation; AM modulation in which the amplitude of a periodic carrier is a given function, generally linear, of the instantaneous values of the modulating signal

4 General

Electronic equipment can, in some manner, be affected by electromagnetic radiation. This radiation is frequently generated by various sources, such as small hand-held radio transceivers, fixed-station radio and television transmitters, vehicle radio transmitters and industrial electromagnetic sources. Many of these services use modulation techniques with a nonconstant envelope.

5 Test levels and frequency ranges

5.1 Selection of test level This document does not suggest that a single test level is applicable over the entire frequency range. The product committees shall select the frequency range(s) to be tested as well as the appropriate test level(s). See Annex E giving guidance for product committees on the selection of test levels. 5.2 Test frequency ranges This document defines testing in the frequency range above 80 MHz, limited only by the capability of the test instrumentation.

6 Test equipment

6.1 Test instrumentation The following types of test equipment are recommended. - Anechoic chamber. - EMI filters. - RF signal generator(s). - Power amplifiers. - Field generating antennas. - Isotropic field sensor. - Power measurement device for the forward power. a directional coupler and a power meter may be used, or a forward power detector or monitor could be inserted between amplifier and antenna. 6.2 Description of the test facility Because of the magnitude of the field strengths generated, the tests shall be made in a shielded enclosure in order to comply with various national and international laws prohibiting interference with radio communications.

7 Test setup

7.1 General All testing of equipment shall be performed in a configuration as close as possible to actual installation conditions. 7.2 Arrangement of table-top equipment The equipment to be tested is placed in the test facility on a non-conductive table within the UFA.

8 Test procedure

8.1 General The test procedure includes. - test level, frequency range(s) and test modulation; - the verification of the laboratory reference conditions, including a pre-check of the generated field strength. 8.2 Laboratory reference conditions 8.2.1 General In order to minimize the effect of environmental parameters on test results, the test shall be carried out in climatic and electromagnetic reference conditions as specified in 8.2.2 and 8.2.3.

9 Evaluation of test results

The test results shall be classified in terms of the loss of function or degradation of performance of the equipment under test, relative to a performance level defined by its manufacturer or the requestor of the test or agreed between the manufacturer and the purchaser of the product. ......
Source: Above contents are excerpted from the full-copy PDF -- translated/reviewed by: www.ChineseStandard.net / Wayne Zheng et al.


      

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