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 GB/T 39137-2020: Determination for the orientation of refractory metal single crystal
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 Basic data             | Standard ID | GB/T 39137-2020 (GB/T39137-2020) |           | Description (Translated English) | Determination for the orientation of refractory metal single crystal |           | Sector / Industry | National Standard (Recommended) |           | Classification of Chinese Standard | H26 |           | Classification of International Standard | 77.040.20 |           | Word Count Estimation | 6,685 |           | Date of Issue | 2020-10-11 |           | Date of Implementation | 2021-09-01 |           | Regulation (derived from) | National Standard Announcement No. 21 of 2020 |           | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 39137-2020: Determination for the orientation of refractory metal single crystal---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.Determination for the orientation of refractory metal single crystal
ICS 77.040.20
H26
National Standards of People's Republic of China
Refractory metal single crystal crystal orientation determination method
2020-10-11 released
2021-09-01 implementation
State Administration for Market Regulation
Issued by the National Standardization Management Committee
 ForewordThis standard was drafted in accordance with the rules given in GB/T 1.1-2009.
This standard was proposed by China Nonferrous Metals Industry Association.
This standard is under the jurisdiction of the National Nonferrous Metals Standardization Technical Committee (SAC/TC243).
Drafting organizations of this standard. Northwest Research Institute of Nonferrous Metals, Xi'an Hantang Analysis and Testing Co., Ltd., Xi'an Jiaotong University, Guangdong Provincial Industrial Branch
Analysis and Testing Center, China Institute of Atomic Energy, Beijing Mining and Metallurgical Technology Group Co., Ltd.
The main drafters of this standard. Liu Jingyan, Bai Xinfang, Shi Xuexue, Hu Zhongwu, Chang Lu, Li Laiping, Zhang Hui, Li Yang, Sun Daxiang, Zheng Jianping,
Wang Zhendong, Zhang Deming, Wang Luyan.
Refractory metal single crystal crystal orientation determination method1 ScopeThis standard specifies the X-ray diffraction method to determine the angle between the crystal orientation of the cubic refractory metal single crystal and the surface normal of the macroscopic sample.
This standard is applicable to the determination of the angle between the crystal orientation of the cubic refractory metal single crystal and the normal direction of the surface of the macroscopic sample.2 Normative referencesThe following documents are indispensable for the application of this document. For dated reference documents, only the dated version applies to this article
Pieces. For undated references, the latest version (including all amendments) applies to this document.
GB/T 8170 Numerical rounding rules and the expression and determination of limit values
Technical conditions of JB/T 9400 X-ray diffractometer
JY/T 009 General rules of multi-crystal X-ray diffraction method for rotating target3 Terms and definitionsThe following terms and definitions defined in JY/T 009 apply to this document.
3.1
φ axis
The axis on which the sample stage rotates around the normal to the sample surface.
3.2
ω angle
The angle between the incident X-ray and the sample surface.
3.3
ω scan
Continuously change the ω angle and record the measurement mode of the diffraction intensity.4 PrincipleThe cross-section or cutting surface of the single crystal will deviate from a certain low-index crystal plane by a few degrees. The deviation angle is the single crystal crystal orientation and macro
Observe the normal angle (off angle) of the sample surface.
When a beam of X-rays is incident on the crystal plane of the index, the index in the crystal represents a set of atomic structures that are parallel to each other and equally spaced.
When the optical path difference between adjacent planes satisfies the Bragg equation, diffraction will occur. At this time, the incident X-ray and the crystal plane
The included angle is called the Bragg angle and is denoted as θB. Use a counter to detect the diffraction line, and determine the direction of the crystal plane according to the position where it appears, and
The deviation of the crystal plane from the cross section or cut surface can be calculated by the azimuth relationship between this direction and the normal direction of the sample surface.5 Equipment5.1 The X-ray diffractometer is composed of X-ray source, parallel light accessories, sample stage, and detector, and should meet the requirements of JB/T 9400.
 
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