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JJF 1159-2006 English PDF

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JJF 1159-2006: Calibration Specification for Quadrupole Inductively Coupled Plasma Mass Spectrometers
Status: Valid

Standard ID	Contents [version]	USD	STEP2	[PDF] delivered in	Standard Title (Description)	Status	PDF
JJF 1159-2006	English	469	Add to Cart	3 days [Need to translate]	Calibration Specification for Quadrupole Inductively Coupled Plasma Mass Spectrometers	Valid	JJF 1159-2006

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Basic data

Standard ID	JJF 1159-2006 (JJF1159-2006)
Description (Translated English)	Calibration Specification for Quadrupole Inductively Coupled Plasma Mass Spectrometers
Sector / Industry	Metrology & Measurement Industry Standard
Classification of Chinese Standard	A61
Classification of International Standard	17
Word Count Estimation	18,198
Date of Issue	12/8/2006
Date of Implementation	2007-03-08
Quoted Standard	JJF 1001-1998, JJF 1059-1999, JJF 1071-2000, GB/T 15481-2000, GB/T 6041-2002, JJF 1120-2004
Regulation (derived from)	AQSIQ Announcement No. 187 of 2006
Issuing agency(ies)	General Administration of Quality Supervision, Inspection and Quarantine
Summary	This standard applies to quadrupole inductively coupled plasma mass spectrometer calibration of key performance indicators. Other types of inductively coupled plasma mass spectrometer calibration can be implemented by reference.

JJF 1159-2006: Calibration Specification for Quadrupole Inductively Coupled Plasma Mass Spectrometers

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration Specification for Quadrupole Inductively Coupled Plasma Mass Spectrometers National Metrology Technical Specification of the People's Republic Quadrupole inductively coupled plasma Mass spectrometer calibration specification Released on.2006-12-08 2007-03-08 implementation The General Administration of Quality Supervision, Inspection and Quarantine issued Quadrupole inductively coupled plasma Mass spectrometer calibration specification This specification was approved by the General Administration of Quality Supervision, Inspection and Quarantine on December 8,.2006, and It will take effect on March 8,.2007. Focal Point. National Physical and Chemical Metrology Technical Committee Drafted by. China Institute of Metrology This specification is interpreted by the National Physical and Chemical Metrology Technical Committee. Drafters of this specification. Wang Jun (China Institute of Metrology) Bohai (China Institute of Metrology) Zhao Motian (China Institute of Metrology)

1 Scope (1) 2 Citations (1) 3 terms and units of measurement (1) 3.1 Quality range (1) 3.2 resolution (1) 3.3 Detection limit (1) 3.4 Sensitivity (1) 3.5 Abundance sensitivity (1) 3.6 Background noise (2) 3.7 Oxide ion yield (2) 3.8 Double Charged Ion Yield (2) 3.9 Quality stability (2) 3.10 Flushing time (2) 3.11 Isotope abundance ratio (2) 3.12 Short-term stability (2) 3.13 Long-term stability (2) 4 Overview (2) 4.1 ion source (2) 4.2 Quadrupole Mass Analyzer (2) 4.3 Ion Detector (2) 4.4 Computer System (3) 4.5 Vacuum System (3) 4.6 Power Supply System (3) 5 Measurement characteristics (3) 6 Calibration conditions (3) 6.1 Laboratory environmental conditions (3) 6.2 Standard materials and reagents for calibration (3) 7 Calibration items and calibration methods (4) 7.1 Visual inspection (4) 7.2 Background noise calibration (4) 7.3 Detection limit calibration (4) 7.4 Sensitivity calibration (4) 7.5 Abundance sensitivity calibration (4) 7.6 Oxide ion yield calibration (5) 7.7 Double Charge Ion Yield Calibration (5) 7.8 Quality Stability Calibration (5) 7.9 Resolution Calibration (5) 7.10 Flushing time calibration (5) 7.11 Isotope abundance ratio calibration (5) 7.12 Short-term stability calibration (5) 7.13 Long-term stability calibration (6) 8 calibration result expression (6) 9 re-study interval (6) Appendix A Calibration Record Format (7) Appendix B Calibration Certificate Format (10) Quadrupole Inductively Coupled Plasma Mass Spectrometer Calibration Specification

1 Scope of application

This specification applies to the calibration of the main performance indicators of a quadrupole inductively coupled plasma mass spectrometer. Other types of electricity Calibration of the inductively coupled ion mass spectrometer can be performed with reference to the implementation.

2 Citations

JJF 1001-1998 General Terms and Definitions JJF 1059-1999 "Measurement and Expression of Measurement Uncertainty" JJF 1071-2000 "Rules for the Preparation of National Metrology Calibration Specifications" GB/T 15481-2000 "General requirements for testing and calibration laboratory capabilities" GB/T 6041-2002 General Principles of Mass Spectrometry Methods JJF 1120-2004 "Calibration Specification for Thermal Ionization Isotope Mass Spectrometer" Use of this specification should be done with the current valid version of the above cited documents.

3 terms and units of measure

3.1 Quality range The mass range represents the mass interval of the element (isotope) that the mass spectrometer can measure, in atomic mass. Unit u. 3.2 resolution The resolution is expressed as the peak width at 10% of the peak height of an element, in units of u. 3.3 Detection limit The minimum limit mass concentration of an element that can be measured by a mass spectrometer. The representation method is n of an element in a blank solution The mass concentration corresponding to the standard deviation of 3 times of the sub-measurement result. Unit ng·L-1. 3.4 Sensitivity The signal response (count) obtained by the element concentration unit on the mass spectrometer detector, in units of Mcps/ (mg·L-1). 3.5 Abundance sensitivity Abundance sensitivity characterizes a strong ion peak of mass M at the adjacent mass M 1 (or M-1) The effect of a front or trailing peak on an adjacent peak. Dimensionless. The abundance sensitivity is expressed by the following formula. δ=IM 1IM Or δ=IM-1IM (1) Where. δ---abundance sensitivity, dimensionless; IM---mass is the signal intensity of M strong ion peak, cps; IM-1---the tailing signal intensity of the ion peak of mass M at the mass M-1 position, cps; IM 1---Tail signal strength at the mass M 1 position of the ion peak of mass M, cps.

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