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GB/T 43939-2024: General test methods for servo circuits of quartz flexible accelerometers for space applications
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| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 43939-2024 | English | 439 |
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General test methods for servo circuits of quartz flexible accelerometers for space applications
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GB/T 43939-2024
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Basic data | Standard ID | GB/T 43939-2024 (GB/T43939-2024) | | Description (Translated English) | General test methods for servo circuits of quartz flexible accelerometers for space applications | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | L55 | | Classification of International Standard | 49.035 | | Word Count Estimation | 22,228 | | Date of Issue | 2024-04-25 | | Date of Implementation | 2024-08-01 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 43939-2024: General test methods for servo circuits of quartz flexible accelerometers for space applications
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ICS 49:035
CCSL55
National Standards of People's Republic of China
Quartz flexure accelerometer servo circuit for aerospace
General test methods
forspaceapplications
2024-08-01 Implementation
State Administration for Market Regulation
The National Standardization Administration issued
Table of Contents
Preface III
1 Scope 1
2 Normative references 1
3 Terms and Definitions 1
4 General requirements 2
4:1 Circuit under test 2
4:2 Test instruments and equipment 2
4:3 Test Environment 3
4:4 Testers 3
5 Test Method 3
5:1 Quiescent Current (IDD) 3
5:2 Output Noise Voltage (VN) 4
5:3 1g output voltage (Vog ) 5
5:4 -1g output voltage (Vog-) 6
5:5 Output DC saturation voltage (Vsat) 6
5:6 Maximum output current (Imax) 7
5:7 Peak output voltage (Vop) 8
5:8 Step Response 9
5:9 Frequency Characteristics 12
5:10 Irradiation 13
Foreword
This document is in accordance with the provisions of GB/T 1:1-2020 "Guidelines for standardization work Part 1: Structure and drafting rules for standardization documents"
Drafting:
Please note that some of the contents of this document may involve patents: The issuing organization of this document does not assume the responsibility for identifying patents:
This document was proposed and coordinated by the National Technical Committee for Standardization of Aerospace Technology and Its Applications (SAC/TC425):
This document was drafted by: Xi'an Microelectronics Technology Research Institute and China Aerospace Times Electronics Co:, Ltd:
The main drafters of this document are: Zhu Jun, Wang Junfeng, Zheng Dongfei, Ruan Xiaoming, Xu Xin, Zhang Ming, Wan Huanhuan, Hu Qiaoyu and Liu Zhengyu:
Quartz Flexure Accelerometer Servo for Aerospace
General circuit test methods
1 Scope
This document describes the parameter test methods of the quartz flexure accelerometer servo circuit (hereinafter referred to as the "circuit"):
This document is applicable to the test of quartz flexible accelerometer servo circuit parameters and can be used as a reference for other accelerometer servo circuits:
2 Normative references
The contents of the following documents constitute the essential clauses of this document through normative references in this document:
For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to
This document:
GB 50611-2010 Electronic Engineering Anti-static Design Specification
3 Terms and definitions
The following terms and definitions apply to this document:
3:1
Accelerometer
A mechanical device that can convert acceleration into capacitance difference and together with the servo circuit constitutes an acceleration sensor:
Note: The quartz flexure accelerometer servo circuit requires a matching accelerometer for testing:
3:2
Quiescent current
When the accelerometer is in the 0g state (g represents the acceleration of gravity of the earth) and there is no other input signal excitation, the current flowing into the measured object through the power supply terminal
The current in a circuit:
3:3
Output noise voltageoutputnoisevoltage
The AC voltage generated at the output due to noise or interference in the circuit itself:
3:4
1g output voltage1g output voltage
When the accelerometer is in the 1g state, the DC voltage value measured on the sampling resistor at the output end of the circuit:
3:5
-1g output voltage
When the accelerometer is in the -1g state, the DC voltage value measured on the sampling resistor at the output end of the circuit:
3:6
The maximum DC voltage that a circuit can output:
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