GB/T 34986-2017 PDF English
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Methods for product accelerated testing
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GB/T 34986-2017: Methods for product accelerated testing---This is an excerpt. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.), auto-downloaded/delivered in 9 seconds, can be purchased online: https://www.ChineseStandard.net/PDF.aspx/GBT34986-2017
NATIONAL STANDARD OF THE
PEOPLE’S REPUBLIC OF CHINA
ICS 03.120.01;03.120.30
L 05
GB/T 34986-2017 / IEC 62506.2013
Methods for product accelerated testing
(IEC 62506.2013, IDT)
Issued on. NOVEMBER 01, 2017
Implemented on. MAY 01, 2018
Issued by. General Administration of Quality Supervision, Inspection and
Quarantine;
Standardization Administration of the People’s Republic of China.
Table of Contents
Foreword... 4
Introduction... 6
1 Scope... 8
2 Normative references... 8
3 Terms, definitions, symbols and abbreviations... 9
3.1 Terms and definitions... 9
3.2 Symbols and abbreviated terms... 11
4 General description of the accelerated test methods... 13
4.1 Cumulative damage model... 13
4.2 Classification, methods and types of test acceleration... 15
5 Accelerated test models... 19
5.1 Type A. qualitative accelerated tests... 19
5.2 Type B and C. Quantitative accelerated test methods... 27
5.3 Failure mechanisms and test design... 32
5.4 Determination of stress levels, profiles and combinations in use and test – stress
modelling... 33
5.5 Multiple stress acceleration methodology – Type B tests... 33
5.6 Single and multiple stress acceleration for Type B tests... 36
5.7 Acceleration of quantitative reliability tests... 48
5.8 Accelerated reliability compliance or evaluation tests... 57
5.9 Accelerated reliability growth testing... 59
5.10 Guidelines for accelerated testing... 60
6 Accelerated testing strategy in product development... 61
6.1 Accelerated testing sampling plan... 61
6.2 General discussion about test stresses and durations... 62
6.3 Testing components for multiple stresses... 63
6.4 Accelerated testing of assemblies... 63
6.5 Accelerated testing of systems... 63
6.6 Analysis of test results... 64
7 Limitations of accelerated testing methodology... 64
Annex A (informative) Highly accelerated limit test (HALT)... 66
Annex B (informative) Accelerated reliability compliance and growth test design... 71
Annex C (informative) Comparison between HALT and conventional accelerated
testing... 88
Annex D (informative) Estimating the activation energy, Ea... 89
Annex E (informative) Calibrated accelerated life testing (CALT)... 91
Annex F (informative) Example on how to estimate empirical factors... 94
Annex G (informative) Determination of acceleration factors by testing to failure... 99
Bibliography... 103
Foreword
This Standard was drafted in accordance with the rules given in GB/T 1.1-2009.
This Standard uses the translation method to equivalently adopt IEC 62506.2013
“Methods for product accelerated testing”.
The documents of our country that have a consistent correspondence with the
international documents that are referenced in this Standard are as follows.
-- GB/T 5080.1-2012, Reliability testing - Part 1.Test conditions and statistical test
principles (IEC 60300-3-5.2001, IDT)
This Standard, compared with IEC 62506.2013, makes the following editorial changes.
-- “a minimum 30 000 h per year” in the original text 5.2.3.1.3 is wrong; it shall be
“a minimum 3 000 h per year”;
-- “as the time compression may influence the stress acceleration” in the original text
5.2.3.2.1 is wrong; it shall be “as the event compression may influence the stress
acceleration”;
-- “Equation (3) presents a rather accurate way of expressing the overall item failure
rate with applied stresses” in the original text 5.5 is wrong; it shall be “Equation
(4) presents a rather accurate way of expressing the overall item failure rate with
applied stresses";
-- “n1/N1”, “l1/L1” and “αi is the time at the ith stress level” in the original text 5.6.3.2
are wrong; they shall be “ni/Ni”, “li/Li” and “αi is the ratio of the time at the ith
stress level to the life under applied loads”;
-- S in equation (B.22) in the original Annex B shall be NS;
-- “One in this group failed after 700 cycles and 10 after 1000 cycles.” and “In this
second test group B, 4 failed after 300 cycles, 10 after 400 cycles, and additional
5 after 500 cycles” in Annex F of the original text are wrong; they shall be “One
in this group failed after 700 cycles and 3 after 1 000 cycles.” and “In this second
test group B, 5 failed after 300 cycles, 10 after 400 cycles, and additional 5 after
500 cycles.”;
-- “265V” in Figure G.1 of Annex G of the original text is wrong; it shall be “25V”;
the curve fitting equation, equation (G.1) and equation (G.2) in Figure G.2 are
wrong and corrected.
This Standard was proposed by the Ministry of Industry and Information Technology
of the People's Republic of China.
This Standard shall be under the jurisdiction of National Technical Committee 24 on
Electric and Electronic Reliability and Maintainability of Standardization
Administration of China (SAC/TC 24).
The drafting organizations of this Standard. The Fifth Institute of Electronics, Ministry
of Industry and Information Technology, Wuhu Saibao Information Industry
Technology Research Institute Co., Ltd., Institute of Electronic Engineering, Chinese
Academy of Engineering Physics, The 60th Research Institute of the General Staff, The
29th Research Institute of China Electronics Technology Group Corporation, Zhongxing
Telecommunication Equipment Corporation, Shenzhen TCL New Technology Ltd.,
Hisense Group Co., Ltd., Chongqing Electric Power Research Institute, The 28th
Research Institute of China Electronics Technology Group Corporation, Shanghai
Institute of Process Automation & Instrumentation, AVIC 301 Institute.
The drafters of this Standard. Wang Xuekong, Hu Xianghong, Li Kai, Cheng Debin,
Gao Jun, Li Jing, Xie Limei, Liu Yazhi, Zhu Liang, Jiang Nianchao, Li Yan, You
Rongxian, Fan Weiqi, Liu Fenglei, Ji Jing, Zhang Ying, Li Jiajia, Wu Yueqin.
1 Scope
This standard provides guidance on the application of various accelerated test
techniques for measurement or improvement of product reliability. Identification of
potential failure modes that could be experienced in the use of a product/item and their
mitigation is instrumental to ensure dependability of an item.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this
document and are indispensable for its application. For dated references, only the
edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
3 Terms, definitions, symbols and abbreviations
ratio between the item failure distribution characteristics or reliability measures (e.g.,
failure intensities) of an item when it is subject to stresses in expected use and those the
item acquires when the higher-level stresses are applied for achieving a shorter test
duration
4 General description of the accelerated test methods
Type C tests are mostly used for estimation of the life time of components where wear
out in active use is the dominating failure mode; for example, switches, keyboards,
relays, connectors or bearings. The data from these tests are often analyzed using the
Weibull distribution, and often in the form of the so-called “sudden death test” (see IEC
60605-2).
5 Accelerated test models
The goal in accelerated testing is to measure the reliability and verify acceptable
reliability performance of the product within a short period of time.
The advantage of the Type C2 test is that in a short time, by speeding up the stress
repetition, the cumulative damage can be reproduced within a much shorter time than
in regular use.
6 Accelerated testing strategy in product development
Assemblies are often tested for each stress type separately. But since there are more
interactions possible in an assembly than in a component, combined stresses are more
important for assemblies. Often assemblies have a size and a function suitable for a
HALT test since HALT test often do not work well with small items (components) or
large items (systems).
7 Limitations of accelerated testing methodology
There are several major limitations of accelerated reliability testing methodologies
shown in the following list (which is not exhaustive).
......
Source: Above contents are excerpted from the full-copy PDF -- translated/reviewed by: www.ChineseStandard.net / Wayne Zheng et al.
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