| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| YS/T 679-2018 | English | 599 |
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Days<=5
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Test methods for minority carrier diffusion length in extrinsic semiconductors. Surface photovoltage method
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YS/T 679-2018
| Valid |
YS/T 679-2018
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