| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| YS/T 1160-2016 | English | 249 |
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Days<=3
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Silicon powder-quantitative phase analysis. Determination of silicon dioxide content. Value K method of X-ray diffraction
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YS/T 1160-2016
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YS/T 1160-2016
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