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YS/T 1160-2016 English PDF

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YS/T 1160-2016: Silicon powder-quantitative phase analysis. Determination of silicon dioxide content. Value K method of X-ray diffraction
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YS/T 1160-2016English249 Add to Cart 3 days [Need to translate] Silicon powder-quantitative phase analysis. Determination of silicon dioxide content. Value K method of X-ray diffraction   YS/T 1160-2016

PDF similar to YS/T 1160-2016


Standard similar to YS/T 1160-2016

GB/T 7999   YS/T 600   GB/T 14849.2   YS/T 1179.3   YS/T 1177   YS/T 5435   

Basic data

Standard ID YS/T 1160-2016 (YS/T1160-2016)
Description (Translated English) Silicon powder-quantitative phase analysis. Determination of silicon dioxide content. Value K method of X-ray diffraction
Sector / Industry Nonferrous Metallurgy Industry Standard (Recommended)
Classification of Chinese Standard H12
Classification of International Standard 29.045
Word Count Estimation 7,736
Date of Issue 2016-07-11
Date of Implementation 2017-01-01
Regulation (derived from) Notice of the Ministry of Industry and Information Technology (2016 No. 37)
Issuing agency(ies) Ministry of Industry and Information Technology
Summary This standard specifies the method for determining the silica content of industrial silicon powder.

YS/T 1160-2016: Silicon powder-quantitative phase analysis. Determination of silicon dioxide content. Value K method of X-ray diffraction


---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Silicon powder-quantitative phase analysis.Determination of silicon dioxide content.Value K method of X-ray diffraction ICS 29.045 H12 People's Republic of China Nonferrous Metals Industry Standard Quantitative phase analysis of industrial silicon powder Determination of silica content X-ray diffraction K-value method ValueK methodofX-raydiffraction Released on.2016-07-11 2017-01-01 implementation Ministry of Industry and Information Technology of the People's Republic of China

Foreword

This standard was drafted in accordance with the rules given in GB/T 1.1-2009. This standard is proposed and managed by the National Nonferrous Metals Standardization Technical Committee (SAC/TC243). This standard was drafted. Kunming Institute of Metallurgy, Guangzhou Nonferrous Metal Research Institute, National Nonferrous Metals and Electronic Materials Analysis and Testing Center, Yunnan Yongchang Silicon Industry Co., Ltd., Tongbiao Standard Technology Service Co., Ltd. The main drafters of this standard. Li Heping, Hu Yaodong, Yuan Wei, Jin Ziqin, Gao Wei, Yang Lin, Zhang Jing, Wang Shuming, Li Yang, Wang Zhongying, Wang Jianbo. Quantitative phase analysis of industrial silicon powder Determination of silica content X-ray diffraction K-value method

1 Scope

This standard specifies the method for determining the silica content of industrial silicon powder. This standard applies to the determination of silica content in industrial silicon powder, the measurement range is ≥ 1%.

2 Normative references

The following documents are indispensable for the application of this document. For dated references, only the dated version applies to this article. Pieces. For undated references, the latest edition (including all amendments) applies to this document. GB/T 8170 Numerical Rounding Rules and Representation and Determination of Limit Values

3 Principle of the method

When X-rays illuminate the crystalline material, diffraction will occur, and each crystalline material has its own specific diffraction characteristics. Under certain conditions, The intensity of diffraction produced by a substance in a mixed substance is proportional to the content. Measuring the intensity of the diffraction line, when the measured substance and the known content are referenced After the intensity of the diffraction line of the substance is determined, the measured substance can be quantitatively analyzed.

4 reagents and materials

4.1 Anhydrous ethanol, analytically pure. 4.2 Reference substance α-Al2O3, analytically pure. 4.3 SiO2, analytically pure. 4.4 Frosted glass, the thickness of the matte surface is 0.1mm, and the area is not less than 8cm×8cm.

5 Instruments and equipment

5.1 X-ray diffractometer. 5.2 Analytical balance, the sensitivity is 0.1mg. 5.3 Agate mortar. 5.4 Sample frame.

6 sample preparation

α-Al2O3, SiO2 and the sample should pass through a 0.0374mm standard sieve.

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