| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| GB/T 45720-2025 | English | 454 |
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Days<=3
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Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
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GB/T 45720-2025
| Valid |
GB/T 45720-2025
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