| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| GB/T 31225-2014 | English | 229 |
Add to Cart
|
Days<=3
|
Test method for the thickness of silicon oxide on Si substrate by ellipsometer
|
GB/T 31225-2014
| Valid |
GB/T 31225-2014
|