| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| GB/T 25188-2010 | English | 229 |
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Days<=3
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Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy
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GB/T 25188-2010
| Valid |
GB/T 25188-2010
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