| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| GB/T 22572-2008 | English | 134 |
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Days<=3
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Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for estimating depth resolution parameters with multiple delta-layer reference materials
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GB/T 22572-2008
| Valid |
GB/T 22572-2008
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