| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| GB/T 14146-2009 | English | 359 |
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Days<=3
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Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
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GB/T 14146-2009
| Obsolete |
GB/T 14146-2009
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