| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| GB/T 13388-2009 | English | 259 |
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Days<=3
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Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques
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GB/T 13388-2009
| Valid |
GB/T 13388-2009
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