HOME
Cart(0)
Quotation
About-Us
Policy
PDFs
Standard-List
www.ChineseStandard.net
Database: 189760 (18 Oct 2025)
SJ/T 11765-2020 English PDF
US$189.00 ยท In stock
Delivery: <= 3 days.
True-PDF full-copy in English will be manually translated and delivered via email.
SJ/T 11765-2020
: (Testing method for low frequency noise parameters of transistors)
Status: Valid
Standard ID
Contents [version]
USD
STEP2
[PDF] delivered in
Standard Title (Description)
Status
PDF
SJ/T 11765-2020
English
189
Add to Cart
3 days [Need to translate]
(Testing method for low frequency noise parameters of transistors)
Valid
SJ/T 11765-2020
PDF similar to SJ/T 11765-2020
Standard similar to SJ/T 11765-2020
SJ/T 11141
SJ/T 11281
GB/T 18910.2
SJ/T 1477
SJ/T 1480
SJ/T 1472
Basic data
Standard ID
SJ/T 11765-2020 (SJ/T11765-2020)
Description (Translated English)
(Testing method for low frequency noise parameters of transistors)
Sector / Industry
Electronics Industry Standard (Recommended)
Classification of Chinese Standard
L42;L44
Word Count Estimation
8,815
Date of Issue
2020-12-09
Date of Implementation
2021-04-01
Regulation (derived from)
Ministry of Industry and Information Technology Announcement No. 48 (2020)
Issuing agency(ies)
Ministry of Industry and Information Technology