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Database: 189760 (18 Oct 2025)
SJ/T 11499-2015 English PDF
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SJ/T 11499-2015
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Test method for measuring electrical properties of monocrystalline silicon carbide
Obsolete
SJ/T 11499-2015
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Basic data
Standard ID
SJ/T 11499-2015 (SJ/T11499-2015)
Description (Translated English)
Test method for measuring electrical properties of monocrystalline silicon carbide
Sector / Industry
Electronics Industry Standard (Recommended)
Classification of Chinese Standard
H83
Classification of International Standard
29.045
Word Count Estimation
12,190
Date of Issue
2015-04-30
Date of Implementation
2015-10-01
Quoted Standard
GB/T 14264; GB/T 30867-2014
Regulation (derived from)
Ministry of Industry and Information Technology Announcement (2015 No. 28)
Issuing agency(ies)
Ministry of Industry and Information Technology
Summary
This Standard specifies the material conductivity type silicon carbide products, resistivity, mobility and carrier concentration of the test method. This Standard applies to (-263.15 ~ 426.85) within the temperature range ��, the resistivity at 1 �� 10 ^ 5��cm less crystalline silicon carbide single crystal 6H and 4H electrical performance testing.