JJG 570: Evolution and historical versions
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| JJG 570-2006 | English | 639 |
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Verification Regulation of Capacitance Comparators
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JJG 570-2006
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| JJG 570-1988 | English | 319 |
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Verification Regulation of Capacitance Comparator
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JJG 570-1988
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PDF similar to JJG 570-2006
Basic data | Standard ID | JJG 570-2006 (JJG570-2006) | | Description (Translated English) | Verification Regulation of Capacitance Comparators | | Sector / Industry | Metrology & Measurement Industry Standard | | Classification of Chinese Standard | A52 | | Classification of International Standard | 17.040 | | Word Count Estimation | 16,14 | | Date of Issue | 2006-03-08 | | Date of Implementation | 2006-09-08 | | Older Standard (superseded by this standard) | JJG 570-1988 | | Quoted Standard | State Administration of Quality Supervision, Inspection and Quarantine Notice 2006 No. 33 | | Regulation (derived from) | State Administration of Quality Supervision, Inspection and Quarantine Notice 2006 No. 33 | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine | | Summary | This standard applies to range not greater than 2000��m, resolution of 1nm ~ 0. 5��m capacitive micrometer initial verification, testing and use of follow-up inspection. | JJG 570-2006: Verification Regulation of Capacitance Comparators---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Verification Regulation of Capacitance Comparators
National Metrology Verification Regulations of the People's Republic
Capacitive micrometer
Released on.2006-03-08
2006-09-08 implementation
The General Administration of Quality Supervision, Inspection and Quarantine issued
Capacitance micrometer verification procedure
CapacitanceComp
Arators
Replace JJG 570-1988
This regulation was approved by the General Administration of Quality Supervision, Inspection and Quarantine on March 8,.2006, and since.2006.
It will take effect on September 8th.
Focal Point. National Geometric Quantity Engineering Measurement Technology Committee
Main drafting unit. Henan Institute of Metrology
Tianjin University
This regulation entrusts the National Geometric Quantity Engineering Parametric Measurement Technical Committee to explain
The main drafters of this procedure.
Ren Fangping (Henan Institute of Metrology)
Huang Yuzhu (Henan Institute of Metrology)
Jia Xiaojie (Henan Institute of Metrology)
Zheng Yizhong (Tianjin University)
Participate in the drafters.
Ge Weisan (Henan Institute of Metrology)
table of Contents
1 Scope (1)
2 Citations (1)
3 Overview (1)
4 Metrological performance requirements (2)
4.1 indication repeatability (2)
4.2 Response time (2)
4.3 indication error (2)
4.4 Discrimination (2)
4.5 Stability (2)
4.6 Zero adjustment range (2)
4.7 Measurement performance requirements of pointer type capacitance micrometer (2)
5 General technical requirements (2)
5.1 Appearance (2)
5.2 Interaction of various parts (2)
6 measuring instrument control (2)
6.1 Verification conditions (2)
6.2 Verification project (3)
6.3 Verification method (3)
6.4 Processing of verification results (5)
6.5 verification period (5)
Appendix A Verification Certificate and Verification Result Notice (inside page) format (6)
Appendix B Technical requirements for standard baffles (7)
Appendix C Verification of Pointer Capacitance Micrometer (8)
Appendix D Measurement Uncertainty Analysis of Capacitance Micrometer Indication Error (9)
Capacitance micrometer verification procedure
1 Scope
This procedure is applicable to the first time of a capacitive micrometer with a range of not more than.2000μm and a resolution of 1nm~0.5μm.
Verification, follow-up verification and in-use inspection.
2 Citations
JJF1001-1998 general measurement terms and definitions
JJF1059-1999 Measurement Uncertainty Evaluation and Representation
JJF1094-2002 technical specifications for measuring instrument characteristics
When using this procedure, care should be taken to use the currently valid version of the above cited documents.
3 Overview
Capacitive micrometer is a non-contact precision measuring instrument using the principle of capacitance frequency modulation or capacitance calculation.
Geometric measurement in the mechanical, plastic and other industries. The appearance of the capacitive micrometer and sensor is shown in Figure 1. Capacitive
The micrometer can be equipped with a complete set of sensors.
Figure 1 Electrical box of a capacitive micrometer
1-display; 2-zero potentiometer; 3-sensor input
Figure 2 Sensor of a capacitive micrometer
1-sensor; 2-cable
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