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JJG 2051-2021: Measuring Instruments for the D. C. Resistance
Status: Valid JJG 2051: Evolution and historical versions
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| JJG 2051-2021 | English | 189 |
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Measuring Instruments for the D. C. Resistance
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JJG 2051-2021
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| JJG 2051-1990 | English | 239 |
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Verification Scheme of Measuring Instruments for the D.C. Resistancei0 10, , rn.
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JJG 2051-1990
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PDF similar to JJG 2051-2021
Basic data | Standard ID | JJG 2051-2021 (JJG2051-2021) | | Description (Translated English) | Measuring Instruments for the D. C. Resistance | | Sector / Industry | Metrology & Measurement Industry Standard | | Classification of Chinese Standard | A55 | | Word Count Estimation | 8,858 | | Issuing agency(ies) | State Administration for Market Regulation | JJG 2051-2021: Measuring Instruments for the D. C. Resistance---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Measuring Instruments for the DCResistance
National Metrological Verification System of the People's Republic of China
DC resistance measuring instruments
Released on 2021-02-23
2021-03-01 implementation
Issued by the State Administration for Market Regulation
DC resistance measuring instrument verification system table
Replacing JJG 2051-1990
Focal point. National Electromagnetic Metrology Technical Committee
Drafting unit. China Institute of Metrology
China Testing Technology Research Institute
This verification system table is entrusted to the National Electromagnetic Metrology Technical Committee to be responsible for the interpretation
The main drafters of this verification system table.
Qing He (China Institute of Metrology)
Shao Haiming (Chinese Academy of Metrology)
Hou Xiaojing (China Academy of Testing Technology)
Participating drafters.
Li Zhengkun (China Institute of Metrology)
Liang Bo (China Institute of Metrology)
Lu Yunfeng (China Institute of Metrology)
Jianhua Peng (China Academy of Testing Technology)
Li Shuwei (China Academy of Testing Technology)
table of Contents
Introduction (Ⅱ)
1 Scope (1)
2 Measurement basis (1)
2.1 National Resistance Benchmark (1)
2.2 Resistance sub-reference (1)
2.3 Resistance working benchmark (1)
2.4 Delivery method (1)
3 Measurement standards (1)
3.1 First-class resistance standards (1)
3.2 Second-class resistance standard (2)
3.3 Delivery method (2)
4 Work measuring instruments (2)
5 Block diagram of the verification system for DC resistance measuring instruments (3)
Introduction
This verification system table is compiled in accordance with JJF1104-2003 "Rules for the Compilation of National Metrological Verification System Tables".
This verification system table replaces JJG 2051-1990 "DC Resistance Measuring Instruments", and the main technical changes are as follows.
---The national resistance benchmark is changed from a physical benchmark to a quantum benchmark;
---Extend the nominal value range of DC resistance measuring instruments to 1014Ω;
---Cancel the resistance comparison benchmark;
---The first-class resistance standard device is increased by 106Ω, 107Ω;
---The second-class resistance standard device is increased by 108Ω, 109Ω;
---The uncertainty expression is changed from k=3 to k=2.
The previous editions of this verification system table are as follows.
---JJG 2051-1990.
DC resistance measuring instrument verification system table
1 Scope
This calibration system table is suitable for the value of DC resistance measuring instruments with a nominal resistance value of 10-4Ω~1014Ω
transfer.
This verification system table specifies the purpose of the national benchmark, the full set of basic measuring instruments included in the benchmark, and the basic
Metrology parameters and the transfer process of the resistance value from the national standard to the working measurement instrument through the measurement standard instrument
Order, and indicate its uncertainty and basic verification method.
2 Measurement basis
2.1 National Resistance Benchmark
2.1.1 The unit of resistance in my country is recorded as Ω. The national resistance benchmark is used to reproduce the unit value of resistance in my country.
2.1.2 The National Resistance Standard is set by the Quantum Hal Resistance (Quantum Hal
Resistance, which can be abbreviated as QHR) and its comparison device (low temperature current comparator), its value is
12906.4037297Ω.
2.1.3 The relative standard uncertainty of the national resistance standard is 2.4×10-10.
2.2 Resistance sub-reference
The resistance sub-reference is composed of the resistance sub-reference group and its comparison device, with a nominal value of 1Ω. Allowance of a single sub-reference device
The per-year change is ±0.2×10-6, and the relative expanded uncertainty of the transition transfer method is (0.02~0.1)×10-6
(k=2).
2.3 Resistance working benchmark
The resistance working benchmark is composed of a resistance working benchmark (group) and a comparison calibration device. The resistance working benchmark
(Group) Including nominal values of 10-3Ω, 10-2Ω, 10-1Ω, 1Ω, 10Ω, 102Ω, 103Ω, 104Ω,
A total of 9 reference devices (groups) of 105Ω, a single working reference device allows annual changes not to exceed ± (0.5~2)×10-6,
The relative expanded uncertainty is (0.25~1)×10-6 (k=2).
2.4 Delivery method
The resistance reference adopts the transition transfer method and the same nominal value transfer method to transfer the value to the lower level measurement standard.
3 Measurement standards
Resistance measurement standards are divided into two levels, first-class and second-class. The first-class resistance standard includes a nominal value of 10-3Ω,
10-2Ω, 10-1Ω, 1Ω, 10Ω, 102Ω, 103Ω, 104Ω, 105Ω, 106Ω, 107Ω total 11 standards
The device and the resistance comparison calibration device. Second-class resistance standard In addition to the above 11 nominal values of the standard and resistance comparison calibration device
Outside, there are 108Ω and 109Ω standard devices and their corresponding comparison and calibration devices.
3.1 First-class resistance standards
In the first-class resistance standard device, the allowable annual change of 1Ω is ±1×10-6, and the relative expanded uncertainty is 0.5×
10-6 (k=2); the allowable annual change of 10-1Ω, 10Ω, 102Ω, 103Ω, 104Ω is ±3×10-6, relative
The extended uncertainty is 1.5×10-6 (k=2); the allowable years of 10-3Ω, 10-2Ω, 105Ω, 106Ω, 107Ω
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