JJG 180: Evolution and historical versions
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| JJG 180-2004 | English | RFQ |
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3 days [Need to translate]
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Clearance Detector of Rolling Stock Gauge for Standard Gauge Railway
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JJG 180-2004
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| JJG 180-2002 | English | 559 |
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3 days [Need to translate]
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Crystal Oscillator inside the Electrical Measurement Instrument
| Obsolete |
JJG 180-2002
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| JJG 180-1978 | English | 199 |
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2 days [Need to translate]
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Verification Regulation of Quartz Crystal Oscillator within Electronic Counter
| Obsolete |
JJG 180-1978
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Standard similar to JJG 180-2004 JJG 249 JJG 404 JJG 134 Basic data | Standard ID | JJG 180-2004 (JJG180-2004) | | Description (Translated English) | Clearance Detector of Rolling Stock Gauge for Standard Gauge Railway | | Sector / Industry | Metrology & Measurement Industry Standard | JJG 180-2002: Crystal Oscillator inside the Electrical Measurement Instrument---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Crystal Oscillator inside the Electrical Measurement Instrument
National Metrology Verification Regulations of the People's Republic
Quartz crystal oscillator in electronic measuring instrument
Released on November 11,.2002
Implementation of.2003-05-04
The General Administration of Quality Supervision, Inspection and Quarantine issued
Replace JJG 180-1978
This regulation was approved by the General Administration of Quality Supervision, Inspection and Quarantine on November 4,.2002, and
It will take effect on May 4,.2003.
Focal Point. National Time Frequency Measurement Technical Committee
Main drafting unit. China Institute of Metrology
Participated in the drafting unit. Jiangsu Institute of Metrology and Testing Technology
Sichuan Xinghua Time Frequency Technology Co., Ltd.
This procedure entrusts the National Time Frequency Measurement Technical Committee to explain
The main drafters of this procedure.
Zhang Aimin (China Institute of Metrology)
Participate in the drafters.
Li Liming (China Institute of Metrology)
Qiu Feng (Jiangsu Institute of Metrology and Testing Technology)
Yang Lin (Sichuan Xinghua Time Frequency Technology Co., Ltd.)
table of Contents
1 Scope (1)
2 Overview (1)
3 Metrological performance requirements (1)
3.1 Boot Characteristics (1)
3.2 Daily frequency fluctuations (1)
3.3 Daily aging rate (1)
3.4 1 second frequency stability (1)
3.5 Frequency reproducibility (1)
3.6 Frequency accuracy (1)
4 General technical requirements (1)
5 measuring instrument control (1)
5.1 Verification conditions (1)
5.2 Verification items and verification methods (2)
5.3 Processing of verification results (7)
5.4 Verification cycle (7)
Appendix A The format of the verification certificate of the crystal oscillator in the electronic measuring instrument with crystal frequency output (8)
Appendix B Internal calibration of the certificate of the crystal oscillator in the electronic measuring instrument without crystal frequency output (9)
Calibration procedure for quartz crystal oscillator in electronic measuring instruments
1 Scope
This procedure is applicable to the first verification, subsequent verification and inspection of quartz crystal oscillators in electronic measuring instruments.
Test.
2 Overview
A quartz crystal oscillator (hereinafter referred to as a crystal oscillator) is fabricated using a piezoelectric effect of a quartz crystal. Crystal oscillator by type
It is a common crystal oscillator, a temperature-compensated crystal oscillator and a constant-temperature crystal oscillator. Ordinary crystal oscillator by quartz resonator, oscillation circuit, automatic gain control
The circuit, the amplifying circuit and the power circuit are composed; the temperature-compensated crystal oscillator also has a temperature compensation circuit; the constant temperature crystal oscillator has a single layer
Or double-layer incubator and temperature control circuit. Different types of crystal oscillators have different technical specifications. Crystal oscillator is widely used in electricity
Sub-measurement instruments (such as frequency synthesizers, time interval generators, electronic counters, time interval measuring instruments, etc.)
For internal time-frequency standards, internal crystal oscillator specifications, especially frequency accuracy, directly affect these electronic measurements.
The metering performance of the measuring instrument.
3 Metrological performance requirements
3.1 boot characteristics. 10-6~10-11
3.2 Daily frequency fluctuation. 10-6~10-11
3.3 Daily aging rate. 10-6~10-11
3.4 1 second frequency stability. 10-8~10-12
3.5 Frequency reproducibility. 10-6~10-11
3.6 Frequency accuracy. 10-5~10-10
4 General technical requirements
The front or rear panel of the electronic measuring instrument equipped with the crystal to be inspected shall have the following marks. manufacturer, instrument
Model number, instrument serial number and logo. When the instrument is sent for inspection, it must be accompanied by the instruction manual and the verification certificate of the previous verification.
book.
5 measuring instrument control
Measurement instrument control includes initial verification, subsequent verification, and in-use inspection.
5.1 Verification conditions
5.1.1 Measurement standards
Reference frequency
The output frequency is 1MHz, 5MHz, 10MHz. The frequency stability should be better than 3 times the stability of the detected crystal frequency.
Other technical indicators such as daily aging rate, startup characteristics, frequency accuracy, etc. should be one order of magnitude better than the crystal being examined.
5.1.2 Auxiliary equipment
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