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JJF 1682-2017 English PDF

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JJF 1682-2017: Calibration Specification for Grating Micrometers
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Basic data

Standard ID JJF 1682-2017 (JJF1682-2017)
Description (Translated English) Calibration Specification for Grating Micrometers
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard A52
Word Count Estimation 24,296
Date of Issue 2017-11-20
Date of Implementation 2018-05-20
Older Standard (superseded by this standard) JJG 989-2004
Regulation (derived from) AQSIQ Notice 2017 No. 103
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine

JJF 1682-2017: Calibration Specification for Grating Micrometers

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
(Grating Micrometer Calibration Specification) National Metrology Technical Specification of the People's Republic Grating type micrometer calibration specification Released on.2017-11-20 2018-05-20 implementation The General Administration of Quality Supervision, Inspection and Quarantine issued Grating type micrometer calibration specification Replace JJG989-2004 Focal Point. National Geometric Quantity Engineering Measurement Technology Committee Main drafting unit. Institute of Optoelectronic Technology, Chinese Academy of Sciences China Testing Technology Research Institute Participated in the drafting unit. Anhui Institute of Metrology This specification entrusts the National Geometric Quantity Engineering Parametric Measurement Technical Committee to explain The main drafters of this specification. Cao Xuedong (Institute of Optoelectronic Technology, Chinese Academy of Sciences) Xiaolong (Institute of Optoelectronic Technology, Chinese Academy of Sciences) Zhaoqing (China Testing Technology Research Institute) Participate in the drafters. Fan Tianquan (Institute of Optoelectronic Technology, Chinese Academy of Sciences) Ma Lin (Anhui Institute of Metrology) Hu Qi (Institute of Optoelectronic Technology, Chinese Academy of Sciences)

table of Contents

Introduction (II) 1 Scope (1) 2 References (1) 3 terms (1) 3.1 indication error range (1) 4 Overview (1) 5 Measurement characteristics (1) 5.1 Force measurement (1) 5.2 Change of indication value caused by radial force of the measuring rod (1) 5.3 Repeatability (1) 5.4 indication error range (3) 5.5 Drift (3) 6 Calibration conditions (3) 6.1 Environmental conditions (3) 6.2 Calibration Items and Calibration Standards (4) 7 Calibration method (5) 7.1 Force measurement (5) 7.2 Change in indication of the rod caused by radial force (5) 7.3 Repeatability (5) 7.4 indication error range (5) 7.5 Drift (8) 8 Calibration result expression (8) 9 re-study interval (8) Appendix A Calibration Error Range Calibration Uncertainty Evaluation (Measurement Device Method) (9) Appendix B Evaluation of Uncertainty of Calibration Error Range (Measurement Block - Micrometer Verifier Combination Method) (13) Appendix C Indicator Error Range Calibration Uncertainty Evaluation (Quantum Block Measurement Method) (16) Appendix D Calibration Certificate Contents and Inner Page Format (19)

Introduction

The preparation of this specification is JJF 1071-2010 "Rules for the preparation of national metrological calibration specifications", JJF 1001-2011 "General Measurement Terms and Definitions" and JJF 1059.1-2012 "Measurement Uncertainty Assessment and Representation" based and in accordance with. This specification replaces JJG989-2004 "Grating type micrometer". Compared with JJG989-2004, in addition to editorial changes, the main technical changes of this specification are as follows. --- This specification cancels the three general technical requirements of "appearance", "interaction of various parts" and "anti-interference"; --- This specification changes the accuracy level from "×× level" to "××μm level" and adds Two accuracy levels of “0.1 μm class” and “0.2 μm class”; --- This specification changes the calibration of the indication error to the calibration of the indication error range; --- This specification changes the measurement method of indication error from fixed zero to floating zero; --- This specification adds "quantity block measurement method" to the calibration method of indication error range. The previous versions of this specification were released. ---JJG989-2004. Grating type micrometer calibration specification

1 Scope

This specification applies to 0.1~m stage stroke of 0~10mm, 0.2μm stage stroke of 0~25mm, 0.5μm The grating stroke micrometer calibration is 0~50mm, 1μm grade ~10μm grade stroke is 0~100mm.

2 reference files

This specification refers to the following documents. JB/T 10030-2012 grating line displacement measuring device JB/T 10080.2-2011 grating line displacement measuring systems - part 2 For dated references, only dated versions apply to this specification; undated quotations The latest version (including all amendments) applies to this specification.

3 terms

3.1 indication error range rangeofindicationerror The difference between the largest and the smallest of the indicated value errors.

4 Overview

A grating type micrometer (hereinafter referred to as a micrometer) is also called a grating micrometer, a grating length meter or an photoelectric length measuring instrument. Using the grating pair as the measuring component, the line displacement is converted into a photoelectric signal, processed by the circuit and the displacement is displayed numerically A length precision measuring instrument. Micrometers are divided into two types according to their structure. integral and split. Integrated micrometer The sensor is integrated with the display unit. The split type micrometer mainly consists of a sensor (including signal cable) and a digital display meter. Part of the composition. The schematic diagram of the overall micrometer is shown in Figure 1. Schematic diagram of the structure of the split micrometer is shown in Figure 2.

5 Measurement characteristics

5.1 Force measurement Calibrate according to the manufacturer's instructions or other technical documents. 5.2 The change of indication value caused by the radial force of the measuring rod Calibrate according to the manufacturer's instructions or other technical documents. 5.3 Repeatability Repeatability should be in accordance with Table 1.

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