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JJF 1236-2010 English PDF

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JJF 1236-2010: Calibration Specification for Semiconductor Device Curve Tracers
Status: Valid

JJF 1236: Evolution and historical versions

Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)StatusPDF
JJF 1236-2010English599 Add to Cart 5 days [Need to translate] Calibration Specification for Semiconductor Device Curve Tracers Valid JJF 1236-2010
JJF 1236-1990English199 Add to Cart 2 days [Need to translate] O.T.N.of the Primary Standard for the 1100000N Force standard Machine Obsolete JJF 1236-1990

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Basic data

Standard ID JJF 1236-2010 (JJF1236-2010)
Description (Translated English) Calibration Specification for Semiconductor Device Curve Tracers
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard A56
Classification of International Standard 17.220
Word Count Estimation 26,228
Date of Issue 2010-01-05
Date of Implementation 2010-04-05
Quoted Standard GB/T 13973-1992; GB/T 13974-1992
Regulation (derived from) ?AQSIQ Announcement 2010 No.3;
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine
Summary This standard applies to its plug-in unit or accessory device has a semiconductor tube curve tracers (hereinafter referred to as tracers) calibration.

JJF 1236-2010: Calibration Specification for Semiconductor Device Curve Tracers

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration Specification for Semiconductor Device Curve Tracers People's Republic of China National Metrology Technical Specifications Semiconductor curve tracers calibration specification Issued on. 2010-01-05 2010-04-05 implementation The State Administration of Quality Supervision, Inspection and Quarantine released Semiconductor curve tracers calibration specification This specification by the State Administration of Quality Supervision, Inspection and Quarantine approved on January 5, 2010, and from From April 5, 2010 implemented. Focal point. the National Radio Technical Commission metering The main drafting units. China Electronics Standardization Institute Participated in the drafting unit. Beijing Radio Instrument Factory Shanghai New Electronic Instrument Co., Ltd. The specification of the National Radio Technical Commission responsible for the interpretation of measurement The main drafters of this specification. Chenlian Qi (China Electronics Standardization Institute) In Lihong (China Electronics Standardization Institute) Liu Chong (China Electronics Standardization Institute) Drafters participate. Cai Fuming (Beijing Radio Instrument Factory) Xu Changfeng (Shanghai New Electronic Instrument Co., Ltd.)

table of Contents

1 Scope (1) 2. Referenced Documents (1) 3 Terms (1) 4 Overview (1) 5 Metrological characteristics (2) 5.1 Calibration signal (2) 5.2 Y-axis portion (2) 5.3 X-axis portion (2) 5.4 stepped portion (2) 5.5 Collector power limiting resistor (2) 6 calibration conditions (3) Environmental conditions 6.1 (3) 6.2 Calibration with a standard device and other equipment (3) 7 Calibration methods and calibration items (3) 7.1 calibration items (3) 7.2 Calibration method (4) Presentation 8 calibration results (15) 9 Recalibration interval (15) Appendix A calibration certificate (16) B Measurement Uncertainty instance appendix (19) Semiconductor curve tracers calibration specification

1 Scope

This instruction applies to semiconductor curve tracers with a plug-in unit or accessory device (hereinafter referred to as tracers) Calibration.

2 Citations

GB/T 13973-1992 semiconductor curve tracers general technical requirements GB/T 13974-1992 semiconductor curve tracers test methods Use this code should pay attention to using the currently valid version of the documents cited.

3 Terms

3.1 collector current backflow end colectorcurrentcircuitfluencepoint Back end of the collector current flowing through the current sampling resistor, the symbol "▽" representation. 3.2 staircase signal normalizing circuit normalizedcircuitofstepsignal Staircase signal "normalization circuit" may have a variety of different magnitudes staircase signal (V/level or A/level), by Appropriate scaled, post-treatment becomes unity 1V/value stage processing circuit.

4 Overview

Tracer from the host section (display and control section), the insertion unit (including Y deflection unit, X deflection Unit, the collector voltage of the scanning unit, staircase signal unit) and the slave device and other components, as shown in a block diagram Shown. Tracer is mainly used for all two-terminal, three-terminal semiconductor device analysis and DC parameters measurements. Widely Used in various electronic components production, scientific research and the use of other departments. Each unit block diagram in Figure 1 Tracer

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