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JJF 1160-2006

JJF 1160-2006_English: PDF (JJF1160-2006)
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JJF 1160-2006English329 Add to Cart 3 days Calibration Specification of Small and Medium Scale Digital Integrated Circuit Testing System JJF 1160-2006 Valid JJF 1160-2006

BASIC DATA
Standard ID JJF 1160-2006 (JJF1160-2006)
Description (Translated English) Calibration Specification of Small and Medium Scale Digital Integrated Circuit Testing System
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard A56
Classification of International Standard 17.220
Word Count Estimation 14,151
Date of Issue 2006/12/8
Date of Implementation 2007-03-08
Quoted Standard JJF 1059-1999
Drafting Organization Information Industry, Ministry of Electronics Industry Standardization Institute
Administrative Organization National radio measurement technology committee
Regulation (derived from) AQSIQ Announcement No. 187 of 2006
Summary This standard applies to test clock frequencies less than 10MHz, no time measuring unit small and medium scale digital integrated circuit test equipment calibration.

JJF 1160-2006
Calibration Specification of Small and Medium Scale Digital Integrated Circuit Testing System
National Metrology Technical Specification of the People's Republic
Small and medium scale digital integrated circuits
Test equipment calibration specification
Released on.2006-12-08
2007-03-08 implementation
The General Administration of Quality Supervision, Inspection and Quarantine issued
Small and medium scale digital integrated circuits
Test equipment calibration specification
This specification was approved by the General Administration of Quality Supervision, Inspection and Quarantine on December 8,.2006, and
Implemented on March 8,.2007.
Focal Point. National Radio Measurement Technology Committee
Drafting unit. Institute of Electronics Industry Standardization, Ministry of Information Industry
This specification is interpreted by the National Radiometric Technical Committee.
The main drafters of this specification.
Chen Dawei (Institute of Electronics Industry Standardization, Ministry of Information Industry)
Wu Jingyan (Institute of Electronics Industry Standardization, Ministry of Information Industry)
Participate in the drafters.
Zhou Xu (Institute of Electronics Industry Standardization, Ministry of Information Industry)
Wang Wei (Institute of Electronics Industry Standardization, Ministry of Information Industry)
table of Contents
1 range (1)
2 Citations (1)
3 Overview (1)
4 Measurement characteristics (1)
4.1 Device Power (1)
4.2 Precision Measurement Unit (1)
4.3 drive unit (2)
4.4 Comparison unit (2)
5 Calibration conditions (2)
5.1 Environmental conditions (2)
5.2 Measurement standards and other equipment (2)
6 Calibration items and calibration methods (2)
6.1 Equipment normality and device logic test functional check (2)
6.2 Device Power (DPS) Setting Voltage Parameter Calibration (2)
6.3 Device Power (DPS) Current Measurement Parameter Calibration (3)
6.4 Precision Measurement Unit (PMU) plus voltage measurement current parameter calibration (4)
6.5 Precision Measurement Unit (PMU) plus current measurement voltage parameter calibration (5)
6.6 Drive unit voltage setting parameter calibration (6)
6.7 Comparison unit voltage measurement parameter calibration (6)
7 Expression of calibration results (7)
8 re-study interval (7)
Appendix A Format of Internal and Small-Scale Digital Integrated Circuit Test Equipment Calibration Certificate (8)
Small and medium-sized digital integrated circuit test equipment calibration specification
1 Scope
This specification applies to small and medium-sized digital integration with a test clock frequency of less than 10 MHz and no time measurement unit.
Circuit test equipment calibration.
2 Citations
JJF 1059-1999 "Measurement and Expression of Measurement Uncertainty"
Note. When using this specification, care should be taken to use the current valid version of the above cited documents.
3 Overview
Small and medium-sized digital integrated circuit test equipment test objects are small and medium-sized digital integrated circuit devices. Simple
Logic function check and general DC parameter test capability. Device structure is relatively large-scale digital integrated circuit test equipment
The statement is relatively simple and does not have the ability to measure time parameters.
Its main structure consists of device power supply, precision measurement unit, drive/comparison unit and control unit. Its structure
The schematic is shown in Figure 1.
Figure 1 Schematic diagram of the structure of small-scale digital integrated circuit test equipment
This specification examines small and medium-sized digital integrated circuit test equipment through sub-parameter calibration and standard sample comparison check.
Line calibration to ensure traceability of its magnitude.
4 Measurement characteristics
4.1 Device Power Supply
4.1.1 Device Power Supply Voltage Setting Range. -40V~ 40V
4.1.2 Device Power Current Measurement Range. -500mA~ 500mA
4.2 Precision Measurement Unit
4.2.1 PMU pressurized flow measurement range. -20V~