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JJF 1127-2004

JJF 1127-2004_English: PDF (JJF1127-2004)
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JJF 1127-2004English379 Add to Cart 3 days Calibration Specification for RF impedance/Meterial Analyzers JJF 1127-2004 Valid JJF 1127-2004

BASIC DATA
Standard ID JJF 1127-2004 (JJF1127-2004)
Description (Translated English) Calibration Specification for RF impedance/Meterial Analyzers
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard A56
Classification of International Standard 17.220
Word Count Estimation 15,131
Date of Issue 2004-09-21
Date of Implementation 2005-03-21
Older Standard (superseded by this standard) JJG 127-1986
Quoted Standard JJG 2011-1987; JJF 1059-1999
Drafting Organization Ministry of Information Industry Electronic Measurement Center
Administrative Organization National Radio Measurement Technical Committee
Regulation (derived from) 2004 technical regulations issued by national metrology (industrial measurement 2005 Volume 15, Issue 1)
Issuing agency(ies) State Administration of Quality Supervision, Inspection and Quarantine
Summary This standard applies to the calibration frequency range lMHz ~ 3. 0GHz, the basic working principle of the RF voltage and current ratio are given for various models of high frequency impedance and RF impedance/material analyzer calibration, the principles also apply to the same kind of LCR table.

JJF 1127-2004
Calibration Specification for RF impedance/Meterial Analyzers
National Metrology Technical Specification of the People's Republic
RF Impedance/Material Analyzer Calibration Specifications
Released on.2004-09-21
2005-03-21 implementation
The General Administration of Quality Supervision, Inspection and Quarantine issued
RF Impedance/Material Analyzer Calibration Specifications
Zers
Replace JJG127-1986
This specification was approved by the General Administration of Quality Supervision, Inspection and Quarantine on September 21,.2004, and
It will take effect on March 21,.2005.
Focal Point. National Radio Measurement Technology Committee
Drafting unit. Electronic Measurement Center of the Ministry of Information Industry
This specification is interpreted by the focal point
The main drafters of this specification.
Wang Wei (Electronic Metrology Center of the Ministry of Information Industry)
Participate in the drafters.
Zhang Guanhan (Electronic Metrology Center of the Ministry of Information Industry)
table of Contents
1 range (1)
2 Citations (1)
3 terms (1)
3.1 Short circuit unsupported air line (1)
3.2 Open unsupported air line (1)
4 Overview (1)
5 Measurement characteristics (2)
5.1 signal source (2)
5.2 DC Bias Voltage (2)
5.3 Impedance measurement (2)
6 Calibration conditions (2)
6.1 Environmental conditions (2)
6.2 Standard equipment and other equipment for calibration (2)
7 Calibration items and calibration methods (3)
7.1 Work normality check (3)
7.2 Calibration of frequency indication (3)
7.3 Calibration of signal level accuracy (3)
7.4 Calibration of DC bias voltage indication (4)
7.5 Calibration of Impedance Measurement Indicators (5)
8 Expression of calibration results (8)
9 re-study interval (8)
Appendix A Calibration Record Table Format (9)
RF Impedance/Material Analyzer Calibration Specifications
1 Scope
This calibration specification is applicable to the frequency range from 1MHz to 3.0GHz. The basic working principle is the RF voltage-current ratio.
Calibration of various types of high frequency and RF impedance/material analyzers for impedance, also applicable to LCR meters of the same principle
calibration.
2 Citations
JJG2011-1987 "RF impedance measuring instrument verification system"
JJF 1059-1999 "Evaluation and Representation of Measurement Uncertainty"
3 terms
3.1 short circuit unsupported air line
The air line when one end of the unsupported air medium coaxial transmission line is connected to the short circuiter.
3.2 Open unsupported air line
The air line when one end of the unsupported air medium coaxial transmission line is connected to the opener.
4 Overview
High frequency and RF impedance/material analyzers can be used in inductors and capacitors from 1MHz to 3.0GHz
High-frequency measurement and electrical performance evaluation of devices and resistors. This type of instrument uses the principle of RF current-voltage impedance measurement.
This method is derived from the high-frequency current-voltage method, and the current flowing through the device under test is converted into electricity by the unbalanced-balanced converter.
Pressure, therefore, two vector voltmeters Vi and VV are used in the system (VV detects the vector voltage applied to the device under test, Vi
The vector current flowing through the device under test is detected). If the measurement circuit is ideal (this means no stray admittance and residual
Impedance), the impedance of the device under test can be expressed as.
x=RV
Figure 1 IV measurement simplified circuit