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JJF 1094-2002

JJF 1094-2002_English: PDF (JJF1094-2002)
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JJF 1094-2002English479 Add to Cart Days<=4 Evaluation of the characteristics of measuring instruments JJF 1094-2002 Valid JJF 1094-2002
 

BASIC DATA
Standard ID JJF 1094-2002 (JJF1094-2002)
Description (Translated English) Evaluation of the characteristics of measuring instruments
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard A50
Word Count Estimation 20,247
Date of Issue 2002-11-04
Date of Implementation 2003-02-04
Older Standard (superseded by this standard) JJF 1027-1991
Quoted Standard JJF 1001-1998; JJF 1059-1999; OIML D15; OIML R34
Drafting Organization China Institute of Metrology
Administrative Organization National Commission on legal metrology
Issuing agency(ies) State Administration of Quality Supervision, Inspection and Quarantine
Summary This standard specifies the basic principles and common methods for measuring instrument characteristics assessed, assessment applicable to assessment of measuring instruments, physical measuring tools, reference materials, measurement systems and other types of metrological characteristics of measuring instruments, measurement standards also apply to the assessment of the characteristics of measurement standards.

JJF 1094-2002
Evaluation of the characteristics of measuring instruments
National Metrology Technical Specification of the People's Republic
Measuring instrument characteristics
Released on November 11,.2002
2003-02-04 implementation
The General Administration of Quality Supervision, Inspection and Quarantine issued
Replacing JJF 1027-1991
Measurement Error and Data Processing
Measuring instrument
Accuracy assessment section
This specification was approved by the General Administration of Quality Supervision, Inspection and Quarantine on November 4,.2002, and
Implemented on February 4,.2003.
Focal Point. National Legal Metrology Technical Committee
Drafted by. China Institute of Metrology
China Aerospace Electromechanical Group Second Hospital 203
Guangdong Institute of Metrology
Guangzhou Institute of Metrology and Testing
This specification is interpreted by the focal point
Drafters of this specification.
Shi Changyan (China Institute of Metrology)
Ye Depei (203 institutes of the Second Academy of China Aerospace Electromechanical Group)
Chen Minghua (Guangdong Institute of Metrology)
Zhou Lubin (Guangzhou Metrology and Testing Institute)
table of Contents
1 range (1)
2 Citations (1)
3 basic terms (1)
4 Basic principles of measuring instrument characteristics (3)
4.1 Basis for evaluation of measuring instrument characteristics (3)
4.2 Forms of measuring instrument characteristics (3)
5 General method for measuring the characteristics of measuring instruments (4)
5.1 [indication] error (4)
5.2 Repeatability (6)
5.3 Accuracy level (7)
5.4 Response characteristics (11)
5.5 Sensitivity (12)
5.6 Discrimination [Threshold] (12)
5.7 Resolution (12)
5.8 Stability (13)
5.9 Drift (14)
5.10 Response time (14)
Measuring instrument characteristics
1 Scope
This specification specifies the basic principles and general methods for the evaluation of the characteristics of measuring instruments, and is applicable to measuring instruments and physical quantities.
Evaluation of the measurement characteristics of various measuring instruments such as tools, standard materials, and measurement systems, and also applicable to the measurement of measurement standards.
Evaluation of the characteristics of the measurement standard.
2 Citations
[1]JJF 1001-1998 "General Terms and Definitions of Measurement"
[2]JJF 1059-1999 "Evaluation and Representation of Measurement Uncertainty"
[3] OIML/D15 "Selection Principles for Characteristics of Measuring Instruments"
[4] OIML/R34 "Accuracy Level of Measuring Instruments"
Use of this specification should be done with the current valid version of the above cited documents.
3 basic terms
When describing the measurement characteristics of measuring instruments, the national metrological technical specification JJF 1001-1998 should be used.
Terms defined by the terms and definitions.
The terms and definitions used in this specification are consistent with JJF 1001-1998 General Terms and Definitions.
3.1 measuring instrument measuringinstrument
measuring tools
An appliance for measuring, either alone or in conjunction with an auxiliary device.
3.2 physical measurement materialmeasure
An appliance that reproduces or provides a given amount of one or more known values in a fixed form when in use.
Example. a) weight;
b) (single value or multi value, with or without a ruler);
c) standard resistance;
d) gauge block;
e) standard signal generator;
f) Reference material.
Note. The given amount here is also called the supply amount.
3.3 Measuring system measuringsystem
A complete set of measuring instruments and other equipment assembled for specific measurements.
Example. a) means for measuring the conductivity of a semiconductor material;
b) A device for calibrating the thermometer.
Note.
1 The measurement system can contain physical gauges and chemical reagents.