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JB/T 12457-2015 (JBT 12457-2015)

Chinese Standard: 'JB/T 12457-2015'
Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)Related StandardStatusGoogle Book
JB/T 12457-2015English209 Add to Cart Days<=3 Non-destructive testing instruments-Testing method of X-ray delector for circuit board detection JB/T 12457-2015 Valid JB/T 12457-2015
JB/T 12457-2015Chinese16 Add to Cart <=1-day [PDF from Chinese Authority, or Standard Committee, or Publishing House]

   

BASIC DATA
Standard ID JB/T 12457-2015 (JB/T12457-2015)
Description (Translated English) Non-destructive testing instruments. Testing method of X-ray delector for circuit board detection
Sector / Industry Mechanical & Machinery Industry Standard (Recommended)
Classification of Chinese Standard N78
Classification of International Standard 19.1
Word Count Estimation 8,860
Date of Issue 2015-10-10
Date of Implementation 2016-03-01
Drafting Organization Guangdong Zhengye Technology Co., Ltd
Administrative Organization National Standardization Technical Committee for Testing Machines
Regulation (derived from) PRC MIIT Announcement 2015 No.63

Related standard: JB/T 12455-2015    JB/T 12456-2015
Related PDF sample: GB/T 37930-2019    GB/T 37929-2019