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GB/T 43774-2024: Test for stress of flat panel display substrate glass - Point scan method
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| GB/T 43774-2024 | English | 219 |
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Test for stress of flat panel display substrate glass - Point scan method
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GB/T 43774-2024
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Basic data | Standard ID | GB/T 43774-2024 (GB/T43774-2024) | | Description (Translated English) | Test for stress of flat panel display substrate glass - Point scan method | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | L90 | | Classification of International Standard | 31.030 | | Word Count Estimation | 10,138 | | Date of Issue | 2024-03-15 | | Date of Implementation | 2024-10-01 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 43774-2024: Test for stress of flat panel display substrate glass - Point scan method---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 31.030
CCSL90
National Standards of People's Republic of China
Point scanning method for stress test of flat panel display substrate glass
Released on 2024-03-15
2024-10-01 Implementation
State Administration for Market Regulation
The National Standardization Administration issued
Foreword
This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents"
Drafting.
Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents.
This document was proposed and coordinated by the National Technical Committee for Semiconductor Equipment and Materials Standardization (SAC/TC203).
This document was drafted by. Bengbu Zhongguang Technology Co., Ltd., China Building Materials Glass New Materials Research Institute Group Co., Ltd., China Building Materials
China Academy of Materials Science Co., Ltd., Wuhan University of Technology, Glass New Materials Innovation Center (Anhui) Co., Ltd., Chengdu Zhongguang Optoelectronics Technology Co., Ltd.
Company, China Electronics Technology Standardization Institute, Dongxu Group Co., Ltd., Hebei Guangxing Semiconductor Technology Co., Ltd., Shenzhen Yinuocheng Electronics
Co., Ltd., Shenzhen Sidike Technology Co., Ltd.
The main drafters of this document are. Peng Shou, Zhang Chong, Cao Zhiqiang, Jin Liangmao, Nie Lanjian, Shen Yuguo, Ma Liyun, Guan Min, Qian Xuejun, Duan Meijiang,
Ren Hongcan, Zhou Xin, Zhang Xiaodong, Zhu Mingliu, Cheng Huifeng, Zheng Jijie, Zhu Yongqian, Wang Jing, Li Peiyue, Fu Bo, Wu Yiran, Zhao Junsha, Cao Kewei,
Chen Jiarui, Li Qing, Hu Hengguang, Zhang Yujiao, Nie Da, Huang Haocheng.
Point scanning method for stress test of flat panel display substrate glass
1 Scope
This document gives the experimental principle of the point scanning method for determining the stress of the flat panel display substrate glass, describes the test equipment, test
Test conditions, sample requirements, test steps, result expression, and test report.
This document is applicable to the stress test of flat panel display substrate glass with a thickness of 0.3mm~1.1mm and specifications of 11th generation and below.
Other glass materials are used for reference.
2 Normative references
The contents of the following documents constitute the essential clauses of this document through normative references in this document.
For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to
This document.
GB/T 7962.5 Test methods for colorless optical glass Part 5.Stress birefringence
GB/T 20919 Electronic digital outside micrometer
GB/T 36405 Flat glass stress test method
3 Terms and definitions
The terms and definitions defined in GB/T 7962.5, GB/T 36405 and the following apply to this document.
3.1
Point scanning method pointscanmethod
A method of setting measurement points at certain intervals and testing them one by one.
4 Test Principle
The photoelastic modulator is used to apply a certain phase difference to the linearly polarized light, and an optical path difference is formed when the sample has stress. The stress of the sample is the optical path difference.
The ratio of the difference to the photoelastic constant is given by formula (1).
σ =
(1)
Where.
σ---stress value, unit is megapascal (MPa);
δ---Optical path difference, in nanometers per centimeter (nm/cm);
B---Photoelastic constant, the unit is nanometer per centimeter megapascal [nm/(cm·MPa)].
5 Experimental equipment
5.1 Stress meter
The stress meter consists of a test platform, a launch system, a detection system, an electronic control system, a moving guide rail, a data processing system, and a computer, as shown in Figure 1.
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