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GB/T 42968.8-2023 English PDF

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GB/T 42968.8-2023: Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
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GB/T 42968.8-2023English439 Add to Cart 4 days [Need to translate] Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method Valid GB/T 42968.8-2023

PDF similar to GB/T 42968.8-2023


Standard similar to GB/T 42968.8-2023

GB/T 43770   SAMR 76   SJ/T 11460.6.4   GB/T 42968.4   GB/T 42968.2   GB/T 42969   

Basic data

Standard ID GB/T 42968.8-2023 (GB/T42968.8-2023)
Description (Translated English) Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard L56
Classification of International Standard 31.200
Word Count Estimation 22,262
Date of Issue 2023-09-07
Date of Implementation 2024-01-01
Issuing agency(ies) State Administration for Market Regulation, China National Standardization Administration

GB/T 42968.8-2023: Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method


---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 31.200 CCSL56 National Standards of People's Republic of China Integrated circuit electromagnetic immunity measurement Part 8.Radiated Immunity Measurement IC Stripline Method (IEC 62132-8.2012,IDT) Published on 2023-09-07 2024-01-01 Implementation State Administration for Market Regulation Released by the National Standardization Administration Committee

Table of contents

Preface III Introduction IV 1 Scope 1 2 Normative reference documents 1 3 Terms and Definitions 1 4 Overview 2 5 Test conditions 2 5.1 General 2 5.2 Supply voltage3 5.3 Frequency range 3 6 Test equipment 3 6.1 General 3 6.2 Cable 3 6.3 Shield 3 6.4 RF disturbance generator 3 6.5 IC Stripline 3 6.6 50Ω terminal 3 6.7 DUT Monitor 3 7 Test layout 3 7.1 General 3 7.2 Test configuration 4 7.3 EMC test board (PCB) 4 8 Test procedure 4 8.1 General 4 8.2 Run Check 4 8.3 Immunity measurement 5 9 test report 6 10 RF Immunity Acceptance Level 6 Appendix A (Normative) Field Strength Determination 7 Appendix B (Normative) Description of IC Stripline 9 Appendix C (informative) Geometric size limitations of closed strip lines 12 Reference 16

Foreword

This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1.Structure and Drafting Rules of Standardization Documents" Drafting. This document is Part 8 of GB/T 42968 "Measurement of Electromagnetic Immunity of Integrated Circuits". GB/T 42968 has released the following part. ---Part 1.General conditions and definitions; ---Part 8.Radiated immunity measurement IC stripline method. This document is equivalent to IEC 62132-8.2012 "Measurement of electromagnetic immunity of integrated circuits - Part 8.Measurement of radiated immunity of ICs" "Strip Line Method". Please note that some content in this document may be subject to patents. The publisher of this document assumes no responsibility for identifying patents. This document is proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This document is under the jurisdiction of the National Semiconductor Device Standardization Technical Committee (SAC/TC78). This document was drafted by. China Electronics Technology Standardization Institute, Fifth Research Institute of Electronics of the Ministry of Industry and Information Technology, Shenzhen North Testing Standards Technical Services Co., Ltd., Tianjin Advanced Technology Research Institute, Beijing Zhixin Microelectronics Technology Co., Ltd., Zhejiang Nuoyi Technology Co., Ltd., Yangxin Technology (Shenzhen) Co., Ltd., Guangzhou Chengzhen Electronic Technology Co., Ltd., Beijing Radio Measurement and Testing Institute, Xiamen Hainuoda Scientific Instrument Appliances Co., Ltd., Henan Kairui Vehicle Inspection and Certification Center Co., Ltd., China Household Electrical Appliances Research Institute, China National Accreditation Center for Conformity Assessment, Beijing Xinkejian Technology Co., Ltd., Southeast University, China Automotive Engineering Research Institute Co., Ltd., Guangdong Academy of Sciences Electronic and Electrical Research Institute, Qingdao Jinhuiyuan Electronics Co., Ltd., Lenovo (Beijing) Co., Ltd., Xi'an Youlai Test Technology Co., Ltd., and China Electric Power Research Institute Co., Ltd., Guangzhou Zhiyuan Electronics Co., Ltd. The main drafters of this document. Fu Jun, Cui Qiang, Fang Wenxiao, Liu Xiaojun, Wu Jianfei, Qiao Yanbin, Zheng Yimin, Ye Chang, Yang Hongbo, Li Nan, Liu Xingxun, Liang Jiming, Baiyun, Zhang Yanyan, Zhu Sai, Jin Dong, Liu Jia, Chen Yanning, Shao E, Zhou Xiang, Huang Xuemei, Zheng Hong, Li Depeng, Lu Feiyan, Liu Yiyong, He Wei, Chen Yongzhi, Chen Meishuang.

Introduction

To standardize the electromagnetic immunity measurement of integrated circuits and provide different electromagnetic immunity measurements for integrated circuit manufacturers and testing institutions Method, GB/T 42968 "Measurement of Electromagnetic Immunity of Integrated Circuits" specifies the general conditions, definitions and The test procedures and test requirements for different measurement methods are planned to be composed of 7 parts. ---Part 1.General conditions and definitions. The purpose is to specify general conditions and definitions for electromagnetic immunity measurements of integrated circuits. ---Part 2.Radiated immunity measurement TEM chamber and broadband TEM chamber methods. The purpose is to specify TEM cells and broadband Test procedures and test requirements for TEM chamber method. ---Part 3.Large current injection (BCI) method. The purpose is to specify the test procedures and test requirements for the large current injection method. ---Part 4.Radio frequency power direct injection method. The purpose is to specify the test procedures and test requirements for the direct injection method of radio frequency power. ---Part 5.Bench Faraday cage method. The purpose is to specify the test procedures and test requirements for the bench Faraday cage method. ---Part 8.Radiated immunity measurement IC stripline method. The purpose is to specify the test procedures and test requirements for the IC stripline method. ---Part 9.Radiated immunity measurement surface scanning method. The purpose is to specify the test procedures and test requirements for the surface scanning method. Integrated circuit electromagnetic immunity measurement Part 8.Radiated Immunity Measurement IC Stripline Method

1 Scope

This document describes the immunity of integrated circuits (ICs) to radio frequency (RF) radiated electromagnetic disturbances in the frequency range 150kHz~3GHz Measurement methods.

2 Normative reference documents

The contents of the following documents constitute essential provisions of this document through normative references in the text. Among them, the dated quotations For undated referenced documents, only the version corresponding to that date applies to this document; for undated referenced documents, the latest version (including all amendments) applies to this document. GB/T 42968.1-2023 Measurement of electromagnetic immunity of integrated circuits Part 1.General conditions and definitions (IEC 62132-1. 2015,IDT) Note. There is no technical difference between the quoted content of GB/T 42968.1-2023 and the quoted content of IEC 62132-1.2006. (IEV)-Chapter131.Circuittheory] Note. GB/T 2900.74-2008 Electrical terminology circuit theory (IEC 60050-131.2002, MOD). Note. GB/T 4365-2003 Electrical terminology electromagnetic compatibility (IEC 60050-161.1990 A1.1997 A2.1998, IDT). IEC 61000-4-20 Electromagnetic compatibility test and measurement techniques Emission and immunity tests in transverse electromagnetic (TEM) waveguides [E- Note. GB/T 17626.20-2014 Electromagnetic compatibility test and measurement technology Emission and immunity tests in transverse electromagnetic wave (TEM) waveguides (IEC 61000-4-20.2010, IDT).

3 Terms and definitions

The following terms and definitions defined in GB/T 42968.1-2023, IEC 60050-131 and IEC 60050-161 apply to this document. 3.1 A waveguide mode in which the electric and magnetic field components in the direction of transmission are much smaller than the main field components in the cross-section. 3.2 TEM waveguideTEMwaveguide An open or closed transmission line system in which electromagnetic waves are transmitted as transverse electromagnetic waves (TEM) to produce characteristics that meet test needs. Set the scene.

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