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GB/T 39771.2-2021: Optical radiation safety of LEDs - Part 2: Measurement methods
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| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 39771.2-2021 | English | 259 |
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Optical radiation safety of LEDs - Part 2: Measurement methods
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GB/T 39771.2-2021
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Basic data | Standard ID | GB/T 39771.2-2021 (GB/T39771.2-2021) | | Description (Translated English) | Optical radiation safety of LEDs - Part 2: Measurement methods | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | L53 | | Word Count Estimation | 14,148 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 39771.2-2021: Optical radiation safety of LEDs - Part 2: Measurement methods---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Optical radiation safety of LEDs - Part 2.Measurement methods
ICS 31.260
L53
National Standards of People's Republic of China
Semiconductor light-emitting diode light radiation safety
Part 2.Test Method
Released on 2021-03-09
2021-10-01 implementation
State Administration of Market Supervision and Administration
Issued by the National Standardization Management Committee
Table of contents
Foreword Ⅲ
1 Scope 1
2 Normative references 1
3 Terms and definitions 1
4 General requirements 1
4.1 Environmental conditions 1
4.2 Power supply 2
4.3 Warm-up time 2
4.4 Test site 2
4.5 Test equipment 2
4.6 Safety warning 2
5 Test requirements 2
5.1 Action spectrum function 2
5.2 Test field of view 3
5.3 Incident (receiving) aperture 3
5.4 Test distance 4
5.5 Maximum radiation 4
6 Test method 4
6.1 Irradiance 4
6.2 Radiance 6
6.3 Safety distance 7
6.4 Test report 7
Appendix A (Normative Appendix) Test Equipment 8
Foreword
GB/T 39771 "Semiconductor Light Emitting Diode Optical Radiation Safety" is divided into two parts.
---Part 1.Requirements and classification methods;
---Part 2.Test method.
This part is Part 2 of GB/T 39771.
This section was drafted in accordance with the rules given in GB/T 1.1-2009.
Please note that some of the contents of this document may involve patents. The issuing agency of this document is not responsible for identifying these patents.
This part is proposed and managed by the Ministry of Industry and Information Technology of the People's Republic of China.
Drafting organizations of this section. Hangzhou Zhejiang University Sanse Instrument Co., Ltd., Hangzhou Product Quality Supervision and Inspection Institute, China Electronic Technology Standards
Chemical Research Institute, Zhejiang Sanse Optoelectronics Technology Co., Ltd., Guangzhou Saixi Standard Testing and Research Institute Co., Ltd., National Lighting Quality Supervision and Inspection
Heart (Zhongshan).
The main drafters of this section. Qiao Bo, Wang Jianping, Qian Feng, Zhao Ying, Liu Xiujuan, Zhou Gang, Peng Zhenjian, Mou Tongsheng, Xu Ziyu, Li Junkai.
Semiconductor light-emitting diode light radiation safety
Part 2.Test Method
1 Scope
This part of GB/T 39771 specifies the general requirements and tests for the light radiation safety of semiconductor light-emitting diodes (hereinafter referred to as LED)
Requirements and test methods.
This section applies to single-chip or multi-chip LEDs with light radiation wavelengths in the near-ultraviolet and visible regions (300nm~780nm).
2 Normative references
The following documents are indispensable for the application of this document. For dated reference documents, only the dated version applies to this article
Pieces. For undated reference documents, the latest version (including all amendments) is applicable to this document.
GB/T 20145-2006 Photobiological safety of lamps and lamp systems
GB/T 30117.2-2013 Photobiological safety of lamps and lamp systems Part 2.Non-laser optical radiation safety related manufacturing requirements
guide
GB/T 39771.1-2021 Semiconductor Light Emitting Diode Optical Radiation Safety Part 1.Requirements and Classification Method
SJ/T 11394-2009 Semiconductor light-emitting diode test method
SJ/T 11395-2009 Semiconductor Lighting Terminology
3 Terms and definitions
GB/T 20145-2006, GB/T 30117.2-2013, GB/T 39771.1-2021, SJ/T 11394-2009 and SJ/T 11395-
The terms and definitions defined in.2009 and the following apply to this document.
3.1
Input aperture
The effective incident aperture size of the receiver for receiving LED light radiation.
Note. Also known as the receiving aperture, the unit is millimeter (mm).
3.2
Measurementdistance
The distance from the viewing source of the LED meter to the incident aperture of the test equipment.
Note. The unit is millimeter (mm).
4 General requirements
4.1 Environmental conditions
The LED test conditions should be carried out under the conditions specified in the relevant product documents. If there are no specified conditions, then the test conditions should follow
The following requirements.
a) Temperature. 25℃±3℃;
b) Relative humidity. no more than 65%.
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