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GB/T 33720-2017 English PDF

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GB/T 33720-2017: Accelerated test method of luminous flux depreciation for LED lighting products
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PDF similar to GB/T 33720-2017


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Basic data

Standard ID GB/T 33720-2017 (GB/T33720-2017)
Description (Translated English) Accelerated test method of luminous flux depreciation for LED lighting products
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard K70
Classification of International Standard 29.140.01
Word Count Estimation 11,171
Date of Issue 2017-05-12
Date of Implementation 2017-12-01
Quoted Standard GB/T 2424.5; GB 7000.1; GB/T 24824-2009; GB/T 24826; GB/T 29294-2012; JJG 245; ANSI_ANSLG C78.377-2011
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary This standard specifies an accelerated test method for luminous flux attenuation of LED lighting products. This standard applies to the use of blue chip to stimulate the phosphor structure of the white LED as a light source of LED lighting products, including LED bulb, LED spotlights, LED straight tube lights, LED downlights, LED lights and LED tunnel lights. Other LED lighting products can refer to the implementation.

GB/T 33720-2017: Accelerated test method of luminous flux depreciation for LED lighting products

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Accelerated test method of luminous flux depreciation for LED lighting products ICS 29.140.01 K70 National Standards of People's Republic of China LED lighting products luminous flux decay accelerated test method 2017-05-12 released 2017-12-01 implementation General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China China National Standardization Management Committee released Directory Preface I Introduction II 1 Scope 1 2 normative reference document 1 3 Terms and definitions 1 4 Test Method 2 4.1 General requirements for testing 2 4.2 Number of samples 3 4.3 Test procedure 3 4.4 Qualified judgment 5 4.5 life expectancy 5 Reference 7

Foreword

This standard is drafted in accordance with the rules given in GB/T 1.1-2009. This standard is proposed and centralized by the Ministry of Science and Technology of the People's Republic of China. The drafting of this standard. State Key Laboratory of Semiconductor Lighting Joint Innovation (Beijing Semiconductor Lighting Technology Promotion Center), Changzhou Wu Into the area of semiconductor lighting application technology research institute, Hebei Lide Electronics Co., Ltd., Shanghai era of light lighting electrical detection Co., Ltd., China Institute of Semiconductor Research Institute, Hangzhou Remote Photoelectric Information Co., Ltd., National Semiconductor Device Quality Supervision and Inspection Center, Guangzhou 赛 West Standard Testing Research Institute Co., Ltd., Xiamen Hualian Electronics Co., Ltd., Foshan City, Star Optoelectronics Co., Ltd., Guangdong Dehao Runda Electric Co., Ltd., Huizhou Leishi Optoelectronics Technology Co., Ltd., Nanjing Henderson Technology Co., Ltd., Ningbo Liaoyuan Lighting Co., Ltd. Division, Ningbo Sheng spectrum Optoelectronic Semiconductor Co., Ltd., San An Optoelectronics Co., Ltd., Shanxi Guangyu Semiconductor Lighting Co., Ltd., Shanghai Ya Ming Ming Co., Ltd., Sichuan Jiuzhou Optoelectronics Technology Co., Ltd., Wuxi Huazhao Hong Optoelectronics Technology Co., Ltd., Shenzhen Lehman Optoelectronics Technology shares Co., Ltd., Shenzhen City, the Ming Technology Co., Ltd., Shenzhen million Run Technology Co., Ltd., Shenzhen City for Lighting Co., Ltd. The main drafters of this standard. Yuan Changan, Qian Cheng, Fan Xuejun, Zhang Guoqi, Xu Shaowei, Li Bo, Zhou Jie, Zhu Xiaodong, Huang Jie, Yu Anqi, FAN Jiajie, LI Jin-min, WANG Jun-xi, ZHAO Li-xia, PAN Jian-gen, ZHAO Lu-bing, ZHOU Gang, CHEN Jie, LI Cheng, XIE Wei, Xiong Fei, HAN Li-cheng, SUN Jian-jiang, CAI Wei-zhi, XU Min, ZHU Hua-rong, ZHONG Xiong, CHANG Bao-yan, TU Meng-long, LI Jiang-hai, LI Zhi-jiang, HUANG He-ming

Introduction

LED lighting products, the traditional reliability test method for a long time, high cost, seriously affected the speed of new product marketing. for Luminous flux attenuation estimated life of 25000h LED lighting products, usually need to product or its optical module at least 6000h test Test. The purpose of this standard is to develop a measurement of LED lighting products luminous flux attenuation of the accelerated test method, does not affect the reliability of the evaluation of fine Under the premise of the 6000h test time will be shortened to.2000h. The issuer of this document draws attention to the fact that the statement is in conformity with this document and may relate to Article 4.3 of this Standard and CN201210492481.3 Related to the use of patents. The issuer of this document has no position on the authenticity, validity and scope of the patent. The patent holder has assured the issuing authority of this document that the patent is not claimed by any person who uses the standard and that the claim does not contain any What conditions are attached. The statement of the patent holder has been filed with the issuing authority of this document and the relevant information can be obtained through the following contact information. Patent holder name. Beijing Semiconductor Lighting Technology Promotion Center Address. Haidian District, Beijing Zhongguancun South Road on the 2nd floor, Building B, 702 Please note that in addition to the above patents, some of the contents of this document may still involve patents. The issuer of this document does not undertake to identify these specialties Lee's responsibility. LED lighting products luminous flux decay accelerated test method

1 Scope

This standard specifies an accelerated test method for luminous flux attenuation of LED lighting products. This standard applies to the use of blue chip excitation phosphor structure of the white LED as a light source of LED lighting products, including LED ball Bulb, LED Spotlight, LED Straight Light, LED Downlight, LED Street Light and LED Tunnel Light. Other LED lighting products can refer to the implementation.

2 normative reference documents

The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article Pieces. For undated references, the latest edition (including all modifications) applies to this document. Electrical and electronic products - Environmental test - Temperature chamber - Performance verification GB 7000.1 lamps - Part 1. General requirements and tests Test methods for LED modules for general lighting applications GB/T 24824-2009 GB/T 24826 LED and LED modules for general lighting - Terms and definitions Performance requirements for LED downlights GB/T 29294-2012 JJG245 illuminance meter verification procedure ANSI_ANSLGC78.377-2011 US National Standard Light Solid Illumination Color Specification (AmericanNational StandardforElectricLamps-SpecificationsfortheChromaticityofSolidStateLightingProducts)

3 terms and definitions

GB 70.1, GB/T 24824-2009, GB/T 24826, GB/T 29294-2012 and the following terms and definitions Apply to this document. For ease of use, some of the terms and definitions in GB/T 29294-2012 are listed below. 3.1 Initial luminous flux initialvalueofluminousflux After the pretreatment test, the laboratory samples tested the luminous flux measured under ambient conditions. 3.2 Luminous flux retention rate luminousfluxmaintenancefactor The ratio of the luminous flux emitted by the sample to the specified luminous flux at a given time is expressed as a percentage. Note. rewrite GB/T 29294-2012, defined 3.24. 3.3 Ambient temperature ambienttemperature The temperature of the air or other media in the area near the sample. 3.4 Accelerated test time acceleratedtesttime The sum of the test times for the sample under specified accelerated test conditions.

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