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GB/T 31958-2023: Substrate glass for amorphous silicon thin film transistor liquid crystal display device
Status: Valid GB/T 31958: Evolution and historical versions
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 31958-2023 | English | 419 |
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Substrate glass for amorphous silicon thin film transistor liquid crystal display device
| Valid |
GB/T 31958-2023
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| GB/T 31958-2015 | English | 599 |
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Substrate glass for thin film transistor liquid crystal display device
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GB/T 31958-2015
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PDF similar to GB/T 31958-2023
Basic data | Standard ID | GB/T 31958-2023 (GB/T31958-2023) | | Description (Translated English) | Substrate glass for amorphous silicon thin film transistor liquid crystal display device | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | Q34 | | Classification of International Standard | 81.040.30 | | Word Count Estimation | 22,216 | | Date of Issue | 2023-08-06 | | Date of Implementation | 2024-03-01 | | Older Standard (superseded by this standard) | GB/T 31958-2015 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 31958-2023: Substrate glass for amorphous silicon thin film transistor liquid crystal display device
---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 81.040.30
CCSQ34
National Standards of People's Republic of China
Replace GB/T 31958-2015
Amorphous silicon thin film transistor for liquid crystal display
Substrate glass
2024-03-01 Implementation
State Administration for Market Regulation
Released by the National Standardization Administration Committee
Foreword
This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1.Structure and Drafting Rules of Standardization Documents"
Drafting.
This document replaces GB/T 31958-2015 "Substrate Glass for Thin Film Transistor Liquid Crystal Displays" and is consistent with GB/T 31958-2015
In addition to structural adjustments and editorial changes, the main technical changes are as follows.
a) The terms and definitions of point defects, surface contamination, scratches, falling pieces, missing corners, and effective areas have been deleted (see 3.1~3.5 of the.2015 edition,
3.11), the definitions of positioning angle and right angle have been changed (see 3.4, 3.6, 3.12 and 3.14 of the.2015 version);
b) Changed the requirements for appearance quality (see 4.1, 4.1 of the.2015 version);
c) Changed the requirements for length deviation and width deviation (see 4.2.1,.2015 version of 4.2.1);
d) Changed the requirements for thickness difference (see 4.2.3, 4.2.2 of the.2015 version);
e) Changed the requirements for cutting angle deviation and positioning angle deviation (see 4.2.4, 4.2.3 of the.2015 edition);
f) The requirements for waviness and warpage have been changed (see 4.3 and 4.5, 4.3 and 4.4 of the.2015 edition);
g) Added surface roughness requirements (see 4.4);
h) Added thermal conductivity, softening point, annealing point, reheat line shrinkage, stress, elastic modulus, volume resistivity, dielectric constant, dielectric
Loss performance requirements (see 4.6);
i) Changed the performance indicators of average linear thermal expansion coefficient, density, and strain point (see 4.6, 4.5~4.7 of the.2015 version);
j) Changed the performance indicators of chemical durability (see 4.6, 4.9 of the.2015 version);
k) The test method for appearance quality has been changed (see 5.2,.2015 version of 5.2);
l) Changed the thickness measurement diagram (see 5.3.2, 5.3.2 of the.2015 version);
m) Changed the positioning angle and cut angle measurement diagram (see 5.3.3,.2015 version of 5.3.3);
n) Changed the test method and measurement diagram of right angle (see 5.3.4,.2015 version of 5.3.4);
o) The test method for waviness has been changed (see 5.4,.2015 version of 5.4);
p) Increased surface roughness, thermal conductivity, softening point, annealing point, reheat line shrinkage, stress, elastic modulus, volume resistivity, dielectric
Test methods for electrical constant and dielectric loss (see 5.5, 5.7, 5.9, 5.10, 5.12, 5.14, 5.15, 5.17~5.19);
q) The test method for warpage has been changed (see 5.6, 5.5 of the.2015 edition);
r) The test method for the average linear thermal expansion coefficient has been changed (see 5.8, 5.6 of the.2015 edition);
s) The test method for strain point has been changed (see 5.11, 5.8 of the.2015 edition);
t) The test method for density has been changed (see 5.13, 5.7 of the.2015 edition);
u) The test method for transmittance has been changed (see 5.16, 5.9 of the.2015 edition);
v) Changed the test method for chemical durability (see 5.20, 5.10 of the.2015 version);
w) The test method for alkali metal oxide content has been changed (see 5.21, 5.11 of the.2015 edition);
x) Added individual judgment content, including items listed in surface roughness and physical and chemical properties (see 6.3.4.1);
y) Changes in transportation and storage requirements (see 7.3 and 7.4,.2015 version of 7.3 and 7.4).
Please note that some content in this document may be subject to patents. The publisher of this document assumes no responsibility for identifying patents.
This document is proposed by China Building Materials Federation.
This document is under the jurisdiction of the National Industrial Glass and Special Glass Standardization Technical Committee (SAC/TC447).
This document was drafted by. Caihong Group Co., Ltd., China National Building Materials Glass New Materials Research Institute Group Co., Ltd., Caihong Display Device Co., Ltd.
Co., Ltd., Bengbu Zhongguo Electronics Technology Co., Ltd., China National Testing and Testing Holding Group Co., Ltd., Beijing University of Technology, new glass materials
Innovation Center (Anhui) Co., Ltd., Dongxu Group Co., Ltd., Rainbow Group (Shaoyang) Special Glass Co., Ltd., Shenzhen Yuchuang Display Technology
Technology Co., Ltd., Hunan Shaohong Special Glass Co., Ltd.
The main drafters of this document. Wu Xiaoxi, Cao Zhiqiang, Jin Liangmao, Li Miao, Tian Yingliang, Li Junjie, Guan Min, Li Qing, Xue Xinjian, Zhao Jinbao,
Liu Zhengmao, Shen Yuguo, Zhang Xiaodong, Xu Lihua, Zhao Zhiyong, Guo Li, Duan Meijiang, Hu Hengguang, Gao Yu, Li Na, Sun Longwen, Fan Bo.
This document was first published in.2015 and this is the first revision.
Amorphous silicon thin film transistor for liquid crystal display
Substrate glass
1 Scope
This document specifies the requirements for substrate glass for amorphous silicon thin film transistor liquid crystal displays, test methods, inspection rules, packaging, marking,
Transportation and storage.
This document applies to the design, production, and research and development of substrate glass for amorphous silicon thin film transistor liquid crystal displays (hereinafter referred to as "substrate glass")
and testing.
2 Normative reference documents
The contents of the following documents constitute essential provisions of this document through normative references in the text. Among them, the dated quotations
For undated referenced documents, only the version corresponding to that date applies to this document; for undated referenced documents, the latest version (including all amendments) applies to
this document.
GB/T 1409 Measurement of permittivity and dielectric loss factor of electrical insulating materials at power frequency, audio frequency, and high frequency (including meter wave wavelength)
Recommended method
GB/T 1549 Chemical analysis methods for fiber glass
GB T2680-2021 Architectural glass visible light transmittance, direct sunlight transmittance, total solar energy transmittance, ultraviolet transmission
Compared with the determination of relevant window glass parameters
GB/T 2828.1-2012 Enumeration sampling inspection procedures Part 1.Batch-by-batch inspection sampling retrieved by acceptance quality limit (AQL)
plan
GB/T 5432 Glass density determination buoyancy method
GB/T 5700-2008 Lighting measurement methods
GB/T 16920 Determination of average linear thermal expansion coefficient of glass
GB/T 28195 Glass softening point test method
GB/T 31838.7-2021 Dielectric and resistive properties of solid insulating materials Part 7.Resistive properties (DC method) High temperature
Measure volume resistance and volume resistivity
GB/T 32639 Flat panel display substrate glass terminology
GB/T 32642 Measurement method for surface roughness of flat panel display substrate glass
GB/T 32643 Measurement method for surface waviness of flat panel display substrate glass
GB/T 32644-2016 Test method for chemical durability of flat panel display substrate glass
GB/T 37780 Test methods for elastic modulus, shear modulus and Poisson's ratio of glass materials
GB/T 38711 Test method for reheat shrinkage of ultra-thin glass Laser method
GB/T 38712 Test method for thermal conductivity of ultra-thin glass - Heat flow method
SJ/T 11039 Test method for annealing point and strain point of electronic glass
3 Terms and definitions
The terms and definitions defined in GB/T 32639, GB/T 38711 and the following apply to this document.
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