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GB/T 31568-2015: Standard test method for determination of crystallite size of ZrO2 coatings by Scherrer equation
Status: Valid
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 31568-2015 | English | 279 |
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Standard test method for determination of crystallite size of ZrO2 coatings by Scherrer equation
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GB/T 31568-2015
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Basic data | Standard ID | GB/T 31568-2015 (GB/T31568-2015) | | Description (Translated English) | Standard test method for determination of crystallite size of ZrO2 coatings by Scherrer equation | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | A29 | | Classification of International Standard | 25.220.20 | | Word Count Estimation | 13,197 | | Date of Issue | 2015-05-15 | | Date of Implementation | 2016-01-01 | | Regulation (derived from) | National Standard Announcement 2015 No. 15 | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China | | Summary | This Standard specifies the determination of the application of X-ray diffraction Scherrer formula method of thermal spraying ZrO2 thermal barrier coating sample cube, squares, principle of the method of three-phase monoclinic ZrO2 grain size, test conditions and calculation steps and the like. This Standard applies to grain size 2 nm ~ 100 nm range, no internal nonuniform strain specimen. | GB/T 31568-2015: Standard test method for determination of crystallite size of ZrO2 coatings by Scherrer equation
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Standard test method for determination of crystallite size of ZrO2 coatings by Scherrer equation
ICS 25.220.20
A29
National Standards of People's Republic of China
Thermal sprayed thermal barrier coatings ZrO2
Scherrer formula grain size measurement method
Issued on. 2015-05-15
2016-01-01 implementation
Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China
Standardization Administration of China released
Foreword
This standard was drafted in accordance with GB/T 1.1-2009 given rules.
The standard proposed by China Machinery Industry Federation.
This standard layer Standardization Technical Committee (SAC/TC57) administered by the National Metal and non-metal cover.
This standard was drafted. Shanghai Institute of Ceramics, Chinese Academy of Sciences.
The main drafters of this standard. BASIC KNOWLEDGE Huangyue Hong, Nguyen sound Jie, Zeng Yi, SONG Li Xin.
Thermal sprayed thermal barrier coatings ZrO2
Scherrer formula grain size measurement method
1 Scope
This standard specifies the determination by X-ray diffraction method Scherrer formula ZrO2 thermal sprayed thermal barrier coating sample cubic, tetragonal, monoclinic three kinds
Principle of the method with ZrO2 grain size, test conditions and calculation steps, etc.
This standard applies to the grain size in the range of 2nm ~ 100nm, no internal strain uneven sample.
2 Terms and definitions
The following terms and definitions apply to this document.
2.1
ZrO2 thermal barrier coating thermalbarrierZrO2coatings
Thermal spraying ZrO2-based preparation process for preparing the coating material.
2.2
Grain crystalite
Internal molecules, atoms, which are small single crystals of regular arrangement.
2.3
Grain size crystalitesize
Lhkl
Grains on (hkl) planes in the normal direction of average size.
2.4
FWHM fulwidthathalfmaximumofpeakprofile; FWHM
Diffraction peak height maximum peak width at half.
3 PRINCIPLE OF THE METHOD
X-ray irradiation of the sample, measuring the resultant diffraction line, assuming that the sample is not complete without the crystal structure, the diffraction line broadening only
Caused by grain refinement, you can use the formula (1) (Scherrer formula) to calculate the grain size.
Lhkl =
Kλ
βhklcosθ
(1)
Where.
Lhkl --- grains average size (hkl) planes normal direction, in nanometers (nm);
K --- constant definition βhkl related. When βhkl defined as the full width at half time, K = 0.89;
λ --- experiments with X-ray wavelength, 0.154056nm;
βhkl --- sample a (hkl) crystal face diffraction peak caused by grain refinement FWHM (minus a backing), radians (rad);
θ --- (hkl) crystal face diffraction peak of Bragg angle in degrees (°).
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