|
US$209.00 ยท In stock
Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email.
GB/T 25189-2010: Microbeam analysis -- Determination method for quantitative analysis parameters of SEM-EDS
Status: Valid
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 25189-2010 | English | 209 |
Add to Cart
|
3 days [Need to translate]
|
Microbeam analysis -- Determination method for quantitative analysis parameters of SEM-EDS
| Valid |
GB/T 25189-2010
|
PDF similar to GB/T 25189-2010
Basic data | Standard ID | GB/T 25189-2010 (GB/T25189-2010) | | Description (Translated English) | Microbeam analysis -- Determination method for quantitative analysis parameters of SEM-EDS | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | N53 | | Classification of International Standard | 71.040.99 | | Word Count Estimation | 9,993 | | Date of Issue | 2010-09-26 | | Date of Implementation | 2011-08-01 | | Quoted Standard | GB/T 4930; GB/T 17359-1998; GB/T 20726; JJF 1001 | | Regulation (derived from) | Announcement of Newly Approved National Standards No. 6 of 2010 (total 161) | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China | | Summary | This standard specifies the scanning electron microscopy energy dispersive spectroscopy quantitative analysis of chemical composition determination of the relevant parameters. This standard applies to the scanning electron microscope that affect the performance of quantitative analysis of the relevant parameters and the determination of the basic parameters spectrometer, and quantitative analysis of the elemental composition of the instrument to make a comprehensive analysis. | GB/T 25189-2010: Microbeam analysis -- Determination method for quantitative analysis parameters of SEM-EDS
---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Microbeam analysis.Determination method for quantitative analysis parameters of SEM-EDS
ICS 71.040.99
N53
National Standards of People's Republic of China
Microbeam analysis SEM EDS quantitative analysis
Determination of parameters
Issued on. 2010-09-26
2011-08-01 implementation
Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China
Standardization Administration of China released
Foreword
This standard by the National Standardization Technical Committee microbeam analysis and focal points.
This standard was drafted. Mineral Resources Research Institute, Chinese Academy of Geological Sciences.
The main drafters of this standard. Zhou Jianxiong, Chen Zhenyu.
Introduction
X-ray spectrometer is a scanning electron microscope common configuration, SEM - EDS accuracy quantitative analysis of the chemical composition depends not only on energy
Spectrometer, also depends on the properties of SEM. Scanning electron microscopy - energy dispersive spectroscopy quantitative analysis of performance testing can be both as a unified whole
consider.
Microbeam analysis SEM EDS quantitative analysis
Determination of parameters
1 Scope
This standard specifies the SEM - EDS analysis of the chemical composition of the quantitative determination of the relevant parameters.
This standard applies to the determination of scanning electron microscopy - related parameters and quantitative analysis of the performance of the basic parameters of the energy spectrum, and elemental as
Sub-quantitative analysis of the instrument to make a comprehensive analysis.
2 Normative references
The following documents contain provisions which, through reference in this standard and become the standard terms. For dated references, subsequent
Amendments (not including errata content) or revisions do not apply to this standard, however, encourage the parties to the agreement are based on research
Whether the latest versions of these documents. For undated reference documents, the latest versions apply to this standard.
GB/T 4930 micro beam analysis electron probe microanalysis standard specimen technical conditions Guidelines
GB/T 17359-1998 electron probe and scanning electron microscopy X-ray spectroscopy quantitative analysis General
GB/T 20726 semiconductor detector X-ray spectrometers
JJF1001 common measurement terms and definitions
3 SEM EDS quantitative analysis principles
Focused electron beam having a certain energy emitted SEM bombardment of the sample surface, generated by the excitation of characteristic X-ray elements. This
These characteristic X-rays detected by the semiconductor detector and after signal conversion, amplification and a series of processing and analysis, the sample can be obtained by
Characteristics containing the elements of X-ray intensity values and by comparison with the corresponding elements of the X-ray spectrum of a standard sample measurement and calculation of the correction
Li, a test sample can be obtained by quantitative analysis of the chemical composition.
4 basic parameters and the detection reference materials
4.1 Basic parameters
Basic parameters 4.1.1 Scanning electron microscopy. electron beam stability, repeatability working distance.
4.1.2 The basic parameters of spectrometers. energy resolution, X-ray energy efficiency and related equipment testing, etc.;
4.2 Reference substance detection
National electronic probe preferred national standardization administrative department issued the approval/SEM standard sample, in line with GB/T 4930
The relevant provisions. When the absence of appropriate national standard samples, the choice of the appropriate agency approved research standards.
Determination spectrometer energy resolution sample. use of manganese metal standard samples and PTFE sample.
Determination spectrometer detection efficiency of sample. using polished, smooth, clean, pure copper or pure nickel samples.
Determination spectrometer sample quantitative elemental analysis accuracy. recommend at least a selection of alloy (such as Fe-Cr-Ni alloy multi-element) and a
Silicate minerals (such as pyrope, olivine, etc.) or basaltic glass samples. Ultra-thin window spectrometer should also use Teflon or containing
Samples of the light elements (e.g., glassy carbon, silicon carbide, boron nitride, or calcium fluoride). Selected samples should be flat polished sample.
5 Technical requirements and measuring methods
5.1 SEM
Electron beam size should be digital display and scanning electron microscopy adjustable. Recommended with Faraday cup to monitor the electron beam. Experiments should be
Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of GB/T 25189-2010_English be delivered?Answer: Upon your order, we will start to translate GB/T 25189-2010_English as soon as possible, and keep you informed of the progress. The lead time is typically 1 ~ 3 working days. The lengthier the document the longer the lead time. Question 2: Can I share the purchased PDF of GB/T 25189-2010_English with my colleagues?Answer: Yes. The purchased PDF of GB/T 25189-2010_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet. Question 3: Does the price include tax/VAT?Answer: Yes. Our tax invoice, downloaded/delivered in 9 seconds, includes all tax/VAT and complies with 100+ countries' tax regulations (tax exempted in 100+ countries) -- See Avoidance of Double Taxation Agreements (DTAs): List of DTAs signed between Singapore and 100+ countriesQuestion 4: Do you accept my currency other than USD?Answer: Yes. If you need your currency to be printed on the invoice, please write an email to [email protected]. In 2 working-hours, we will create a special link for you to pay in any currencies. Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.
|