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GB/T 17626.20-2014 English PDF

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GB/T 17626.20-2014: Electromagnetic compatibility -- Testing and measurement techniques -- Emission and immunity testing in transverse electromagnetic (TEM) waveguide
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GB/T 17626.20-2014English1214 Add to Cart 7 days [Need to translate] Electromagnetic compatibility -- Testing and measurement techniques -- Emission and immunity testing in transverse electromagnetic (TEM) waveguide Valid GB/T 17626.20-2014

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Standard similar to GB/T 17626.20-2014

GB/Z 17626.1   GB/T 17626.3   GB/T 17626.11   GB/T 17626.12   GB/T 17626.19   GB/T 17626.22   

Basic data

Standard ID GB/T 17626.20-2014 (GB/T17626.20-2014)
Description (Translated English) Electromagnetic compatibility -- Testing and measurement techniques -- Emission and immunity testing in transverse electromagnetic (TEM) waveguide
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard L06
Classification of International Standard 33.100.10; 33.100.20
Word Count Estimation 61,637
Date of Issue 12/12/2014
Date of Implementation 6/1/2015
Quoted Standard GB/T 4365-2003; IEC 61000-2-11-1999; IEC 61000-4-23; IEC/TR 61000-4-32; IEC/TR 61000-5-3; GB/T 6113.101-2008; GB/T 6113.104-2008; GB/T 6113.203-2008; CISPR 16-2-3-2006; GB 9254-2008
Adopted Standard IEC 61000-4-20-2010, IDT
Regulation (derived from) National Standards Bulletin 2014 No. 30
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary This standard specifies the method of using a variety of TEM waveguide electronic and electrical equipment emission and immunity testing. TEM waveguide with open (for example, stripline and electromagnetic pulse (EMP) simulators) and closed (for example,

GB/T 17626.20-2014: Electromagnetic compatibility -- Testing and measurement techniques -- Emission and immunity testing in transverse electromagnetic (TEM) waveguide


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Electromagnetic compatibility - Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguide ICS 33.100.10; 33.100.20 L06 National Standards of People's Republic of China Electromagnetic compatibility test and measurement technology Transverse electromagnetic (TEM) Waveguide emission and immunity test testingintransverseelectromagnetic (TEM) waveguide (IEC 61000-4-20.2010, IDT) Issued on. 2015-05-15 2015-08-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released

Table of Contents

Introduction Ⅲ 1 Scope and purpose 1 2 Normative references 1 3 Terms, definitions and abbreviations 2 3.1 Terms and definitions 2 3.2 Abbreviations 4 4 Overview 5 5 TEM waveguide claim 5 5.1 OVERVIEW 5 5.2 General requirements for the use of TEM waveguide 5 5.2.1 TEM mode verification 5 5.2.2 EUT test area and the maximum size of 6 Claim 6 5.2.3 available test area 5.3 pairs of the specific requirements of certain types of TEM waveguide and recommendations 8 5.3.1 open TEM waveguide arrangement 8 Alternative authentication method 5.3.2 Dual-port TEM waveguide TEM mode 8 6 EUT Type 9 6.1 Overview 9 6.2 small EUT 9 6.3 Large EUT 9 7 Laboratory test environment 9 7.1 Overview 9 7.2 Climate 9 7.3 Electromagnetic Environment 9 Evaluation and reporting of test results 8 9 Appendix A (normative appendix) TEM waveguide emission test 11 Appendix B (Normative Appendix) TEM waveguide immunity test 26 Appendix C (Normative Appendix) TEM waveguide HEMP transient test 31 Characteristics of Annex D (Informative Appendix) TEM waveguide 36 The calibration method Appendix E (Informative Appendix) TEM waveguide field probes 42 Standards and references 51 Figure A.1 cable outlet is located at the corner at the bottom and lead to a positive angle on the test region 19 Figure A.2 substantially orthogonal axis positioning device or test support means 20 Three orthogonal axis azimuth pattern A.3 21 radiated emission test 12 face/axis orientation test Figure A.4 typical EUT 21 22 a schematic diagram A.5 OATS Figure A.6 dual-port TEM cell (symmetric core plate) 22 Figure A.7 single-port TEM cell (asymmetric core plate) 23 Figure A.8 stripline (dual conductor) 24 Figure A.9 stripline (four conductors, balanced feeding) 25 Figure B.1 unipolar direction of TEM waveguide testing arrangement 29 Figure B.2 TEM waveguide midfield position dot area uniformly recognized 30 Figure spectral amplitude of 35 C.1 100kHz to 300MHz Figure D.1 simple waveguide (TEM wave does not exist) 40 Figure D.2 TEM mode transmission waveguide Example 40 Figure D.3 polarization vector 40 Figure D.4 transmission TEM wave transmission line 41 Figure D.5 single-port and dual-port TEM waveguide 41 Confirm the measurement point calibration area Figure E.1 Example 43 Figure E.2 probe arrangement 43 disrupt confirmation Figure E.3 reach the net power measurement field emission devices arranged in 46 Figure E.4 field probe calibration arrangement example 47 Figure E.5 Calibration another electric field probe calibration method of arrangement 49 Figure E.6 antenna and measurement instruments equivalent circuit 49 Extended Table 1 below normal value Uncertainty K 8 Measuring the position of the point table B.1 field homogeneity region confirmed 27 Table B.2 Test Level 28 Table C.1 current standards defined Radiated Immunity Test Level 35 Table E.1 calibration frequency point 44 Table E.2 small calibration field strength 44

Foreword

GB/T 17626 "electromagnetic compatibility test and measurement technology" currently includes the following components. GB/T 17626.1-2006 Electromagnetic compatibility - Testing and measurement techniques - Overview of immunity tests GB/T 17626.2-2006 Electromagnetic compatibility - Testing and measurement techniques - Electrostatic discharge immunity test GB/T 17626.3-2006 Electromagnetic compatibility - Testing and measurement techniques RFEMS test GB/T 17626.4-2008 Electromagnetic compatibility - Testing and measurement techniques - Electrical fast transient burst immunity test GB/T 17626.5-2008 Electromagnetic compatibility - Testing and measurement techniques - Surge (impact) immunity test GB/T 17626.6-2008 Electromagnetic compatibility - Testing and measurement techniques Immunity to conducted disturbances induced field GB/T 17626.7-2008 Electromagnetic compatibility - Testing and measurement techniques - power supply systems and equipment connected harmonics, interharmonics measurements and Measuring Instruments Guide GB/T 17626.8-2006 Electromagnetic compatibility - Testing and measurement techniques - Power frequency magnetic field immunity test GB/T 17626.9-2011 Electromagnetic compatibility - Testing and measurement techniques - Pulse magnetic field immunity test GB/T 17626.10-1998 electromagnetic compatibility test and measurement techniques - Damped oscillatory magnetic field immunity test GB/T 17626.11-2008 Electromagnetic compatibility Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity test GB/T 17626.12-2013 electromagnetic compatibility test and measurement techniques - Oscillatory waves immunity test GB/T 17626.13-2006 electromagnetic compatibility test and measurement technology AC power port harmonics and interharmonics including mains signaling Low frequency immunity tests GB/T 17626.14-2005 Electromagnetic compatibility Testing and measurement techniques - Voltage fluctuation immunity test GB/T 17626.15-2011 electromagnetic compatibility test and measurement technology scintillation Functional and design specifications GB/T 17626.16-2007 electromagnetic compatibility test and measurement technology 0Hz ~ 150kHz common mode conducted disturbances immunity test GB/T 17626.17-2005 electromagnetic compatibility test and measurement technology dc input power port immunity test ripple test GB/T 17626.24-2012 electromagnetic compatibility test and measurement techniques - Test methods HEMP conducted disturbance protection devices GB/T 17626.27-2006 Electromagnetic compatibility Testing and measurement techniques - Unbalance, immunity test GB/T 17626.28-2006 electromagnetic compatibility test and measurement techniques - Variation of power frequency, immunity test GB/T 17626.29-2006 electromagnetic compatibility test and measurement technology dc input power port voltage dips, short interruptions and Voltage variations immunity tests GB/T 17626.30-2012 electromagnetic compatibility test and measurement techniques - Power quality measurement methods GB/T 17626.34-2012 electromagnetic compatibility test and measurement technology main power greater than 16A per phase current voltage equipment Dips, short interruptions and voltage variations immunity tests This section is GB/T Part of 2,017,626. This section drafted in accordance with GB/T 1.1-2009 given rules. This section identical with the international standard IEC 61000-4-20.2010 (2nd edition) "Electromagnetic compatibility (EMC) - Part 4-20. Tests And measurement techniques - transverse electromagnetic (TEM) waveguides emission and immunity test. " Consistency correspondence between this part of international documents and normative references of our files are as follows. --- GB/T 4365-2003 Electrotechnical terminology Electromagnetic compatibility [IEC 60050 (161).1990, IDT] --- GB/T 6113.101-2008 radio disturbance and immunity measuring apparatus and methods - Part 1-1. Radio Disturbance and immunity measuring apparatus - Measuring apparatus (CISPR16-1-1.2006, IDT) --- GB/T 6113.104-2008 radio disturbance and immunity measuring apparatus and methods - Part 1-4. Radio Disturbance and immunity measuring apparatus - Ancillary equipment - Radiated disturbances (CISPR16-1-4.2005, IDT) --- GB/T 6113.203-2008 radio disturbance and immunity measuring apparatus and methods - Part 2-3. Radio Disturbance and immunity measuring method for measuring radiation harassment (CISPR16-2-3.2003, IDT) --- GB 9254-2008 Limits and methods of measurement of radio disturbance of information technology equipment (CISPR22.2006, IDT) This section makes the following editorial changes. --- 5.2.3.2 step d) a reference to correct the formula formula (3); --- Fixed 5.3.2 of the formula (8); --- Formula (A.12) in gi, f description changed to "gi, f --- TEM waveguide method from the measurement result obtained by converting OATS equivalent field Strong value in volts per meter (V/m) "; (1) the amount of interpretation of symbols --- supplemented formula; --- The original text before and after "verification" and "validation" of inconsistent use, this section unified "TEM verification" "field uniformity Confirm "area; --- Number of references were correct, and change the text in the corresponding reference number at. Electromagnetic Compatibility This part of the National Standardization Technical Committee (SAC/TC246) and focal points. This section is drafted. Southeast University, Shanghai Entry-Exit Inspection and Quarantine Bureau, China Electric Power Research Institute, Shanghai Measurement and Testing Technology Institute Study Institute, China Electronics Standardization Institute, China Institute of Metrology. The main drafters of this section. Yuan Zhou, Zhou Hong, Zhang Xian, Jing Xin Hui, Jiang Quanxing, Jenny Lee, Gong by Chen Li, Xie Ming. Electromagnetic compatibility test and measurement technology Transverse electromagnetic (TEM) Waveguide emission and immunity test

1 Scope and purpose

GB/T 17626 in this section gives a method of using a variety of TEM waveguide electronic and electrical equipment emission and immunity testing. TEM waveguide with open (for example, stripline and electromagnetic pulse (EMP) simulators) and closed (for example, TEM chamber), may further Divided into single-port, dual-port and multi-port waveguide. TEM waveguide frequency range depends on the specific application of the test requirements and TEM waveguides Specific type. The purpose of this section is given by. --- TEM waveguide properties, including typical frequency ranges and limits on the size of the EUT; --- Confirmation method for electromagnetic compatibility, TEM waveguide (EMC) test; --- EUT (ie EUT housing and connection cable) definition; --- Test arrangement radiated emission tests, procedures and requirements in the TEM waveguide; --- Test arrangement radiated immunity test, the procedures and requirements in the TEM waveguide. NOTE. Test methods specified in this part of the electromagnetic radiation device for immunity and radiated emission measurements are concerned. Simulation and measurement of electromagnetic radiation for Quantitatively determine the final installation EME use state is not accurate enough, the main purpose of the provisions of the test method is to ensure the qualitative analysis of electromagnetic effects The obtained test results of different test equipment used repeatability. The purpose of this section is not applicable to test methods specified any particular product or system, but for all interested product committees Provide universal basic reference. For radiated emissions tests, the product should refer to the Commission the International Special Committee on Radio Interference (CISPR) Standard 1) select emission limits and test methods. For radiation immunity test, the Commission is responsible for the product selected equipment within its jurisdiction Select the appropriate test methods and immunity limits. This part of the test method described is independent of the GB/T 17626.32). 1) In the international electromagnetic compatibility standards, the standards for radiated emission test is part of CISPR standards. 2) Product Board, after consultation with "National Standardization Technical Committee on Radio Interference" and "National Standardization Technical Committee Electromagnetic Compatibility", and can be specified Using these different test methods.

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein Member. For undated references, the latest edition (including any amendments) applies to this document. IEC 60050 (161) International Electrotechnical Vocabulary Chapter 161 electromagnetic compatibility (Internationalelectrotechnical vocabulary-Chapter161. Electromagneticcompatibility) IEC 61000-2-11.1999 Electromagnetic compatibility - Part 2-11. Classification of environmental HEMP environment [Electromagneticcom- patibility (EMC) -Part 2-11. Environment-ClassificationofHEMPenvironments] IEC 61000-4-23 Electromagnetic compatibility - Part 4-23. Testing and measurement techniques - HEMP and other radiated disturbances protective devices Measurement Method [Electromagneticcompatibility (EMC) -Part 4-23. Testingandmeasurementtechniques- TestmethodsforprotectivedevicesforHEMPandotherradiateddisturbances] IEC /T R61000-4-32 Electromagnetic compatibility - Part 4-32. Testing and measurement techniques - HEMP simulator before [Electro-

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