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GB/T 15074-2025: General specification for EPMA quantitative analysis
Status: Valid GB/T 15074: Evolution and historical versions
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 15074-2025 | English | 439 |
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4 days [Need to translate]
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General specification for EPMA quantitative analysis
| Valid |
GB/T 15074-2025
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| GB/T 15074-2008 | English | 299 |
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3 days [Need to translate]
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General guide of quantitative analysis by EPMA
| Valid |
GB/T 15074-2008
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| GB/T 15074-1994 | English | 439 |
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General guide for EPMA quantitative analysis
| Obsolete |
GB/T 15074-1994
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PDF similar to GB/T 15074-2025
Basic data | Standard ID | GB/T 15074-2025 (GB/T15074-2025) | | Description (Translated English) | General specification for EPMA quantitative analysis | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | N53 | | Classification of International Standard | 71.040.99 | | Word Count Estimation | 22,290 | | Date of Issue | 2025-03-28 | | Date of Implementation | 10/1/2025 | | Older Standard (superseded by this standard) | GB/T 15074-2008 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 15074-2025: General specification for EPMA quantitative analysis---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 71.040.99
CCSN53
National Standard of the People's Republic of China
Replaces GB/T 15074-2008
General principles for quantitative electron probe analysis
Released on 2025-03-28
2025-10-01 Implementation
State Administration for Market Regulation
The National Standardization Administration issued
Table of contents
Preface III
1 Scope 1
2 Normative references 1
3 Terms and Definitions 1
4 Method Principle 1
5 Instruments and Standards 1
6 Sample preparation 3
7 Preparation before measurement 3
8 Measurement conditions 4
9 Measurement Step 5
10 Calculation of mass fraction of each element 6
11 Measurement uncertainty10
12 Analysis Report12
Appendix A (Informative) Example of evaluating the measurement uncertainty of electron probe quantitative analysis results 13
Foreword
This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents"
Drafting.
This document replaces GB/T 15074-2008 "General Rules for Electron Probe Quantitative Analysis Methods".
In addition to structural adjustments and editorial changes, the main technical changes are as follows.
a) The scope has been changed (see Chapter 1, Chapter 1 of the.2008 edition);
b) Added terms and definitions (see Chapter 3);
c) The statement of the principle of the method has been changed (see Chapter 4, Chapter 3 of the.2008 edition);
d) The main structure diagram and description of the electron probe have been changed (see 5.1.1, Chapter 4 of the.2008 edition);
e) Added the requirements for electron probe beam stability (see 5.1.2);
f) Added recommendations for electronic probe calibration/verification (see 5.1.2);
g) Changed the requirements for the environmental conditions of the electronic probe (see 5.2, Chapter 5 of the.2008 edition);
h) The selection principles, requirements and use of standards have been changed (see 5.3, Chapter 8 of the.2008 edition);
i) The requirements for sample preparation have been changed (see Chapter 6, 12.1 of the.2008 edition);
j) The preparation before measurement has been changed, the X-ray counting system has been deleted, and the requirement for comprehensive inspection of total error has been added (see Section 7).
Chapter 6 of the.2008 edition);
k) Changed the recommended value of accelerating voltage (see 8.1, 7.1 of the.2008 edition);
l) The electron beam selection principle has been changed (see 8.2.1, 7.2.1 of the.2008 edition);
m) Added spectral line interference solution (see 8.3.3);
n) The description of beam spot diameter has been changed, and the requirement that the beam spot diameters of the sample and the standard should be consistent has been added (see 8.4, 7.4 of the.2008 edition);
o) The purpose of qualitative analysis has been changed (see 9.1, 9.1 of the.2008 edition);
p) The recommendation on the order of element measurement has been changed (see 9.2.1, 12.2.2 of the.2008 edition);
q) The order of measuring the X-ray intensity of each element has been deleted (see 12.3 of the.2008 edition);
r) Added the handling method for light elements that cannot be tested (see 9.2.2);
s) The measurement formula for background strength has been changed (see 9.3.5, 11.6 of the.2008 edition);
t) The calculation formula for relative X-ray intensity has been changed (see 10.2, 9.4 of the.2008 edition);
u) The applicable scope of elements of the ZAF correction method has been changed (see 10.3.2.1, 13.2.1 of the.2008 edition);
v) Added the φ(ρz) method and XPP method (see 10.3.3 and 10.3.4);
w) The α coefficient correction method (BA method, α factor method) has been changed (see 10.3.5, 13.3 of the.2008 edition);
x) The number of standard samples selected for the calibration curve method has been changed (see 10.3.6.2, 13.4.2 of the.2008 edition);
y) Added the measurement uncertainty assessment step (see Chapter 11);
z) The requirements for analytical reports have been changed (see Chapter 12, Chapter 15 of the.2008 edition).
Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents.
This document was proposed and coordinated by the National Microbeam Analysis Standardization Technical Committee (SAC/TC38).
This document was drafted by. Beijing Institute of Geology, Nuclear Industry, Institute of Mineral Resources, Chinese Academy of Geological Sciences, Shougang Group Co., Ltd.,
Industrial Analysis and Testing Center of Guangdong Academy of Sciences.
The main drafters of this document are Ge Xiangkun, Fan Guang, Chen Zhenyu, Ju Xinhua and Wu Chaoqun.
This document was first issued in.1994, revised for the first time in.2008, and this is the second revision.
General principles for quantitative electron probe analysis
1 Scope
This document specifies the instrumentation, standard samples, sample preparation, and pre-measurement procedures for quantitative analysis using an electron probe microanalyzer (EPM).
Preparation, selection of measurement conditions, measurement process, measurement of electron beam incident current, calculation of mass fraction of each element, and measurement uncertainty
Assessment and reporting of results.
This document is applicable to the quantitative measurement and data processing of each element in the sample by electron probe, and the quantitative analysis of the scanning electron microscope with a spectrometer.
Analysis and reference implementation.
2 Normative references
The contents of the following documents constitute essential clauses of this document through normative references in this document.
For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to
This document.
GB/T 4883 Statistical processing and interpretation of data - Determination and processing of outliers in normal samples
GB/T 4930 Guidelines for the technical conditions of standard samples for microbeam analysis electron probe microanalysis
GB/T 13298 Metal microstructure inspection methods
GB/T 17359 Microbeam analysis of elements with atomic number not less than 11 by energy spectrometry
GB/T 17366 Preparation of samples for electron microprobe analysis of minerals and rocks
GB/T 20725 Guidelines for electron probe microanalysis using spectroscopy and qualitative point analysis
GB/T 21636 Terminology for Electron Probe Microanalysis (EPMA)
GB/T 27025 General requirements for the competence of testing and calibration laboratories
JJG901 Electron Probe Analyzer
3 Terms and definitions
The terms and definitions defined in GB/T 21636 apply to this document.
4 Principles of the method
The electron probe quantitative analysis method is a method for quantitative analysis of micro-area components.
The sample is bombarded with a concentrated electron beam to stimulate the characteristic X-rays of its constituent elements, and the characteristic X-rays are separated and the intensity is measured by a spectrometer.
The characteristic X-ray intensity of the sample is measured and compared with that of the standard sample (hereinafter referred to as the standard sample) under the same conditions. After calibration and calculation, the sample
The content of each element in the excited area.
5.Instruments and Standards
5.1 Electron Probe
5.1.1 The electron probe mainly consists of an electron gun, a lens system, an optical microscope, a sample chamber, a spectrometer, an X-ray measurement system, an image signal detector,
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