YS/T 666-2008 English PDFUS$189.00 · In stock
Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email. YS/T 666-2008: Chemical analysis methods of gallium for industrial use. Determination of impurity elements. Inductively coupled plasma atomic emission spectrometric method Status: Valid
Basic dataStandard ID: YS/T 666-2008 (YS/T666-2008)Description (Translated English): Chemical analysis methods of gallium for industrial use. Determination of impurity elements. Inductively coupled plasma atomic emission spectrometric method Sector / Industry: Nonferrous Metallurgy Industry Standard (Recommended) Classification of Chinese Standard: H12 Classification of International Standard: 77.120.99 Word Count Estimation: 7,731 Date of Issue: 2008-03-12 Date of Implementation: 2008-09-01 Quoted Standard: GB/T 602-2002 Regulation (derived from): NDRC Notice No. 25 of 2008 Issuing agency(ies): National Development and Reform Commission Summary: This standard specifies the industrial Jia silicon, sodium, potassium, magnesium, calcium, aluminum content determination. This standard applies to industrial Jia [99. 9% �� �� (%) �� 99. 995%] of silicon, sodium, potassium, magnesium, calcium, aluminum content. YS/T 666-2008: Chemical analysis methods of gallium for industrial use. Determination of impurity elements. Inductively coupled plasma atomic emission spectrometric method---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order. Chemical analysis methods of gallium for industrial use.Determination of impurity elements.Inductively coupled plasma atomic emission spectrometric method ICS 77.120.99 H12 People's Republic of China Nonferrous Metals Industry Standard Industrial Chemical analysis of gallium Determination of impurity elements Inductively coupled plasma atomic emission spectrometry Posted 2008-03-12 2008-09-01 implementation National Development and Reform Commission issued ForewordAppendix A of this standard is an informative annex. This standard by the National Standardization Technical Committee of non-ferrous metals and centralized. This standard by the Aluminum Corporation of China Henan Branch, China Nonferrous Metals Industry Institute of Standards Metrology and Quality is responsible for drafting. This standard by the Aluminum Corporation of China Shandong Branch, Chalco Guizhou Branch of China participated in the drafting. The main drafters of this standard. Liang Qian, ORTHOPAEDICS, Wang Xiaowen, Zhang to autumn, Zhang Xinyu. Industrial Chemical analysis of gallium Determination of impurity elements Inductively coupled plasma atomic emission spectrometry1 ScopeThis standard specifies the silicon, sodium, potassium, magnesium, calcium, aluminum content determination of gallium industry. This standard applies to industrial gallium [99.9% ≤ω (%) ≤99.995%] silicon, sodium, potassium, magnesium, calcium, aluminum content was measured. Measurement range Table 1. Table 1 Element measurement range /% Silicon 7 × 10-4 ~ 1 × 10-2 Sodium 5 × 10-4 ~ 1 × 10-2 K 5 × 10-4 ~ 1 × 10-2 Element measurement range /% Magnesium 5 × 10-4 ~ 1 × 10-2 Calcium 5 × 10-4 ~ 1 × 10-2 Aluminum 8 × 10-4 ~ 1 × 10-22 Normative referencesThe following documents contain provisions which, through reference in this standard and become the standard terms. For dated references, subsequent Amendments (not including errata content) or revisions do not apply to this standard, however, encourage the parties to the agreement are based on research Whether the latest versions of these documents. For undated reference documents, the latest versions apply to this standard. GB/T 602-2002 Chemical Reagent Determination of impurities in the preparation of standard solution used3 Method summarySamples with hydrochloric acid, nitric acid dissolved in a hot plate heating effect, the samples were made into a solution, in inductively coupled plasma atomic emission spectroscopy (ICP-AES) Determination on.4 Reagents and materials4.1 standard water are deionized water (resistivity greater than 18MΩ · cm). 4.2 HCl. BV-Ⅲ or sub-fluorine purified by distillation. 4.3 Nitrate. BV-Ⅲ or sub-fluorine purified by distillation. 4.4 standard stock solution. According to GB/T 602-2002 standard preparation of sodium, aluminum, magnesium, calcium, potassium, silicon elements of the stock solution, wherein the aluminum, silicon, Potassium standard stock solution at a concentration of 100μg/mL, sodium, magnesium, calcium standard stock solution concentration was 1000μg/mL. 4.5 preparation of mixed standard solution. Pipette aluminum standard stock solution (4.4) 10.00mL, sodium, magnesium, calcium standard stock solution (4.4) each 1000μL, was added 5mL hydrochloric acid (4.2), placed in a 100mL flask with deionized water (4.1) diluted to the mark, mix, Transferred to a polyethylene bottle storage. The solution containing calcium, sodium, magnesium, aluminum were 10μg/mL. 5 instruments, apparatus and appliances 5.1 inductively coupled plasma emission spectrometer. 5.2 Electric hot plate. 0 ℃ ~ 250 ℃. ......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of YS/T 666-2008_English be delivered?Answer: Upon your order, we will start to translate YS/T 666-2008_English as soon as possible, and keep you informed of the progress. The lead time is typically 1 ~ 3 working days. The lengthier the document the longer the lead time.Question 2: Can I share the purchased PDF of YS/T 666-2008_English with my colleagues?Answer: Yes. 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