SJ/T 11499-2015 PDF English
| Std ID | Version | USD | Buy | Deliver [PDF] in | Title (Description) |
| SJ/T 11499-2015 | English | 479 | Add to Cart | 3 days [Need to translate] | Test method for measuring electrical properties of monocrystalline silicon carbide |
Click to Preview a similar PDF
Basic data
| Standard ID | SJ/T 11499-2015 (SJ/T11499-2015) |
| Description (Translated English) | Test method for measuring electrical properties of monocrystalline silicon carbide |
| Sector / Industry | Electronics Industry Standard (Recommended) |
| Classification of Chinese Standard | H83 |
| Classification of International Standard | 29.045 |
| Word Count Estimation | 12,160 |
| Date of Issue | 2015-04-30 |
| Date of Implementation | 2015-10-01 |
| Quoted Standard | GB/T 14264; GB/T 30867-2014 |
| Regulation (derived from) | Ministry of Industry and Information Technology Announcement (2015 No. 28) |
| Issuing agency(ies) | Ministry of Industry and Information Technology |
| Summary | This Standard specifies the material conductivity type silicon carbide products, resistivity, mobility and carrier concentration of the test method. This Standard applies to (-263.15 ~ 426.85) within the temperature range ��, the resistivity at 1 �� 10 ^ 5��cm less crystalline silicon carbide single crystal 6H and 4H electrical performance testing. |