GB/T 24579-2009 English PDFUS$279.00 ยท In stock
Delivery: <= 3 days. True-PDF full-copy in English will be manually translated and delivered via email. GB/T 24579-2009: Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy Status: Valid
Basic dataStandard ID: GB/T 24579-2009 (GB/T24579-2009)Description (Translated English): Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy Sector / Industry: National Standard (Recommended) Classification of Chinese Standard: H80 Classification of International Standard: 29.045 Word Count Estimation: 12,126 Date of Issue: 2009-10-30 Date of Implementation: 2010-06-01 Quoted Standard: GB/T 11446.1; ISO 14644-1 Adopted Standard: SEMI MF1724-1104, MOD Regulation (derived from): National Standard Approval Announcement 2009 No.12 (Total No.152) Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China Summary: This standard specifies the use of acid leaching from the surface of the polycrystalline silicon pieces of metal impurities. And graphite furnace atomic absorption quantitative detection of trace metal impurities on the polysilicon block surface analysis methods. This standard applies to the alkali metal, alkaline earth metal and the first series of transition elements such as sodium, zinc detection, Nickel, aluminum, iron, chromium. This standard applies to all kinds of rods, blocks, grain, sheet-shaped multi- product or single crystal silicon surface to detect metal contaminants. Since the block, pieces or grains of irregular shape. Area is difficult to accurately determine. Calculated according to the sample weight. Weight of the sample used is 50g ~ 300g, LOD tied to 0. 01ng/g. GB/T 24579-2009: Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order. Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy ICS 29.045 H80 National Standards of People's Republic of China Acid leaching Atomic Absorption Spectrometry Polysilicon surface of the metal contaminants Posted 2009-10-30 2010-06-01 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released ForewordThis revised standard adopts SEMIMF1724-1104 "by acid extraction - atomic absorption spectrometry measurements polysilicon surface metal contamination." The standard format for SEMIMF1724-1104 been adjusted accordingly. For ease of comparison, the information listed in Appendix C of this standard Reg and reg SEMIMF1724-1104 control list. And SEMIMF1724-1104 modify the terms of the standard single line vertical Knowledge involved in their terms of margin. This standard compared with SEMIMF1724-1104, the main technical differences are as follows. --- Removed the "purpose", "keywords." --- The precision of the actual test results obtained in the laboratory instead of single precision and bias part of the original standard, and the original standard The precision and bias data as part of Appendix B. This standard Annex A, Annex B and Annex C is informative appendix. This standard by the National Standardization Technical Committee of semiconductor equipment and materials proposed. This standard by the National Standardization Technical Committee materials and equipment at the Technical Committee of semiconductor material. This standard was drafted. Ministry of Information Industry materials for Quality Supervision and Inspection Center, China Electronics Technology Group Corporation forty-sixth RESEARCH The study. The main drafters of this standard. Chulian Qing, Wang Yi, Wei Lijie. Acid leaching Atomic Absorption Spectrometry Polysilicon surface of the metal contaminants Without the addition of elements to be analyzed through a sample of acid leaching and analysis process for monitoring and analysis process, including purity acid leaching bottle Cleanliness, cross-contamination and environmental purity. ......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of GB/T 24579-2009_English be delivered?Answer: Upon your order, we will start to translate GB/T 24579-2009_English as soon as possible, and keep you informed of the progress. The lead time is typically 1 ~ 3 working days. The lengthier the document the longer the lead time.Question 2: Can I share the purchased PDF of GB/T 24579-2009_English with my colleagues?Answer: Yes. 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