|
Std ID |
Description (Standard Title) |
|
SJ 21342-2018
|
(Very low noise test method)
|
|
SJ/T 10724-2013
|
Electroacoustics. General specification of measurement condenser microphones
|
|
SJ/T 10725-2013
|
Electroacoustics. Measurement methods of electroacoustic characteristics for measurement condenser microphones
|
|
SJ/T 9148-2013
|
Electroacoustics. Instruments for measurement of aircraft noise-Performance requirements for systems to measure on-third-octave band sound pressure levels in noise certification of transport-category aeroplanes
|
|
SJ 20269-1993
|
Verification regulation of model ESH3 test receiver
|
|
SJ 20225-1993
|
Verification regulation of LF group delay measuring set
|
|
SJ 20226-1993
|
Verification regulation of model 201/2 envelope delay measuring set
|
|
SJ 20230-1993
|
Verification regulation of model BJ2951A (JS-5A) transistor Hfe tester
|
|
SJ 20231-1993
|
Verification regulation of KDK double gate FET Yfs tester
|
|
SJ 20232-1993
|
Verification regulation of KDK double gate FET Gp tester
|
|
SJ 20233-1993
|
Verification regulation of model IMPACT-II semiconductor discrete device test sysytem
|
|
SJ 20234-1993
|
Verification regulation of model HP4145A semiconductor parameter analyzer
|
|
SJ 20235-1993
|
Verification regulation of model IC-1500 automatic tester
|
|
SJ 20236-1993
|
Verification regulation of the model GH2050/51 calibrator for transistor characteristic tracer
|
|
SJ 20237-1993
|
Verification regulation of model GH3123 IC automatic tester
|
|
SJ 20240-1993
|
Verification regulation of model HP4284A LCR precise measurement instruments
|
|
SJ 20248-1993
|
Verification reguation of model ED4070 dual-channel
|
|
SJ 20249-1993
|
Verification reguation of model BP28A LF spectrum analyzers
|
|
SJ 20250-1993
|
Verification reguation of model HP8590A RF spectrum analyzers
|
|
SJ 20251-1993
|
Verification reguation of model YH4020/YH4021/YH4022 spectrum analyzers
|
|
SJ 20254-1993
|
Verification regulation of model HP3785A Jitter generator and receiver
|
|
SJ 20255-1993
|
Verification regulation of model HP 3779 C primary multiplex analyzer (CEPT)
|
|
SJ 20256-1993
|
Verification regulation of model YH3910 TV field intensity measuring instrument
|
|
SJ 20257-1993
|
Verification regulation of model CC5361 degital TV signal generator
|
|
SJ 20258-1993
|
Verification regulation of model XB48 TV standard signal generator
|
|
SJ 20259-1993
|
Verification regulation of model 3195 PIF marker synthesizer
|
|
SJ 20260-1993
|
Verification regulation of model FM5671D TV modulator
|
|
SJ 20261-1993
|
Verification regulation of model SWOB5 polyskop
|
|
SJ 20262-1993
|
Verification regulation of model HS6110 electtroacoustic test system
|
|
SJ 20263-1993
|
Verification regulation of model PM5631G colour signal generator
|
|
SJ 20264-1993
|
Verification regulation of model TEK 1411 video signal generator mainframe
|
|
SJ 20265-1993
|
Verification regulation of colour bar signal generator modul TSG 11 in video signal generator type TEK 1411
|
|
SJ 20266-1993
|
Verification regulation of convergence pattern signal generator module TSG 12 in video signal generator type TEK 1411
|
|
SJ 20267-1993
|
Verification regulation of linearity test signal generator module TSG 13 in video signal generator type TEK 1411
|
|
SJ 20268-1993
|
Verification regulation of sync signal generator module SPG 11 in video signal generator type TEK 1411
|
|
SJ 20270-1993
|
Verification regulation of model YH1301 full solid state microwave sweep
|
|
SJ 20271-1993
|
Verification regulation of model HP8350B/HP83525B sweep generators
|
|
SJ 20272-1993
|
Verification regulation of model HP346B solid-state noise generators
|
|
SJ 20227-1993
|
Verification regulation of model QF 3370 frequency counter
|
|
SJ 20228-1993
|
Verification regulation of model Gould 1421 storage oscilloscope
|
|
SJ 20229-1993
|
Verification regulation of model SZ2 radar oscilloscopes
|
|
SJ 20241-1993
|
Verification regulation of YG series coil number tester
|
|
SJ 20245-1993
|
Verification regulation of LF digital phase meter
|
|
SJ 20246-1993
|
Verification regulation of HF digital phase meter
|
|
SJ 20247-1993
|
Verification regulation of HF digital phase standard
|
|
SJ 20242-1993
|
Verification regulation of model CC-10 large capacitance measuring instruments
|
|
SJ 20252-1993
|
Verification regulation of model HP8900 peak power meter
|
|
SJ 20238-1993
|
Verification regulation of model ZX-68, ZX-73 high resistance box
|
|
SJ 20239-1993
|
Verification regulation of model CO-14 precise decade capacitance box
|
|
SJ 20243-1993
|
Verification regulation of model HP4278A 1kHz/1MHz capacitance meter
|
|
SJ 20244-1993
|
Verification regulation of model CY16602 standards large capacitance box
|
|
SJ/T 10444-1993
|
Eloctroacoustics terminology
|
|
SJ/T 10457-1993
|
Standard guide for depth profiling in auger electron spectroscopy
|
|
SJ/T 10458-1993
|
Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
|
|
SJ/T 10140-1991
|
Terms for superconductor electronics
|
|
SJ/T 10141-1991
|
Terms for cryelectronics
|
|
SJ 20897-2003
|
Specification for coating process of poly-para-xylylene vapour deposition
|
|
SJ/T 31057-1994
|
Requirements of Readiness and Methods of Inspection and Assessment for Surface Paint Production Line
|
|
SJ/T 11860-2022
|
(Electroplating solution test method)
|
|
SJ 21332-2018
|
(Ceramic shell and metal shell Technical requirements for electroless nickel plating)
|
|
SJ 21405-2018
|
(Microelectronics packaged metal casing Aluminum silicon casing plating process technical requirements)
|
|
SJ 20130A-2018
|
(Method for detecting adhesion strength of metal plating)
|
|
SJ 20146A-2018
|
(General Specification for Silver Plating)
|
|
SJ 20147.1A-2018
|
(Silver and silver alloy coating thickness test method X-ray fluorescence spectrometry)
|
|
SJ 20147.2A-2018
|
(Test methods for silver and silver alloy coatings Determination of residual salt)
|
|
SJ 20443A-2018
|
(Specification for rhodium plating)
|
|
SJ 20846A-2018
|
(Specification for gold gold cyanide for electroplating)
|
|
SJ 20910A-2018
|
(General specification for powder electrostatic coating)
|
|
SJ 20910-2004
|
General specification for powder spraying coating
|
|
SJ 20912-2004
|
Metallic coatings electroplated coatings of nickel for low-stressed
|
|
SJ 20890-2003
|
Treatment and painting of electronic equipment
|
|
SJ 20891-2003
|
Specification for autocatalytic plating of nickel-phosphorous alloy coatings
|
|
SJ 20892-2003
|
Specification for anodic coatings for aluminum and aluminum alloys
|
|
SJ 20893-2003
|
Specification for acid pickling and passivation for stainless steel
|
|
SJ 20813-2002
|
Specification for chemical conversion on aluminum and aluminum alloys
|
|
SJ 20817-2002
|
Finishes for electronic equipment
|
|
SJ 20818-2002
|
Metal plating and chemical treatment for electronic equipment
|
|
SJ 20846-2002
|
Specification for gold [Ⅰ] potassium cyanide for electroplating
|
|
SJ/T 11104-1996
|
Metallic coating. Electrodeposited gold and alloy coatings for engineering purposes
|
|
SJ/T 11105-1996
|
Metallic coatings. Test methods for electrodeposited gold and gold alloy coatings. Part 1: Determination of coating thickness
|
|
SJ/T 11106-1996
|
Metallic coatings. Test methods for electrodeposited gold and gold alloy coatings. Part 2: Environmental tests
|
|
SJ/T 11107-1996
|
Metallic coatings. Test methods for electrodeposited gold and gold alloy coatings. Part 3: Electrographic tests for porosity
|
|
SJ/T 11108-1996
|
Metallic coatings. Test methods for electrodeposited gold and gold alloy coatings. Part 4: Determination of gold content
|
|
SJ/T 11109-1996
|
Metallic coatings. Test methods for electrodeposited gold and gold alloy coatings. Part 5: Adhesion tests
|
|
SJ/T 11110-1996
|
Metallic coatings Electrodeposited silver and silver alloy coatings for engineering purposes
|
|
SJ/T 11111-1996
|
Methods coatings. Test methods for electrodeposited silver and silver alloy coatings. Part 1: Determination of coating thickness
|
|
SJ/T 11112-1996
|
Methods coatings. Test methods for electrodeposited silver and silver alloy coatings. Part 2: Adhesion tests
|
|
SJ 20515-1995
|
Test method for sheet resistance of gold plating layer
|
|
SJ 20516-1995
|
Analytical method of the purities for electrodeposited gold coating
|
|
SJ 20443-1994
|
Specification for electreposited coatings of rhodium
|
|
SJ/T 10537-1994
|
Typical technology for coating with coat
|
|
SJ/T 31050-1994
|
Requirements of readiness and methods of inspection and assessment for electroplating production lines
|
|
SJ/T 31052-1994
|
Requirements of readiness and methods of inspection and assessment for universal electroplating baths
|
|
SJ/T 31053-1994
|
Requirements of readiness and methods of inspection and assessment for barrel plating equipment
|
|
SJ/T 31058-1994
|
Requirements of Readiness and Methods of Inspection and Assessment for Electrostatic Spraying Production Line
|
|
SJ 20129-1992
|
Methods for measurement of metallic coating thickness
|
|
SJ 20130-1992
|
Test methods for adhesion of metallic coatings
|
|
SJ 20146-1992
|
Generic specification for electrodeposited silver Coating
|
|
SJ 20147.1-1992
|
Measurement methods for electrodeposited silver and silver alloy coating thickness Method by the X-ray fluorescent spectrometry
|
|
SJ 20147.2-1992
|
Determination methods for electrodeposited silver and silver alloy coatings Determination of the presence of residual salts
|