SJ/T 10458-1993 PDF English
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| SJ/T 10458-1993 | English | 349 | Add to Cart | 3 days [Need to translate] | Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy |
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Basic data
| Standard ID | SJ/T 10458-1993 (SJ/T10458-1993) |
| Description (Translated English) | Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy |
| Sector / Industry | Electronics Industry Standard (Recommended) |
| Classification of Chinese Standard | A42 |
| Word Count Estimation | 10,125 |
| Date of Issue | 12/17/1993 |
| Date of Implementation | 6/1/1994 |
| Adopted Standard | ASTM E-1087, MOD |
| Summary | This standard applies to Auger electron spectroscopy technique (AES) and X-ray photoelectron spectroscopy technique (XPS), also applies to other sensitive surface analysis techniques (such as ion scattering spectroscopy technique, secondary ion mass spectrometry, etc.). This standard may involve hazardous operation, equipment and material, but did not explain all relevant safety issues. Before using this standard user should establish appropriate safety and health practices and determine the scope of application of this standard. |