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| Delete | 1 | SJ 20743-1999_ENGLISH | Heat sink handbook Part 1: Thermal resistance curves | 1 | 7 | 1919 | | Need to translate |
| Delete | 2 | SJ 20761-1999_ENGLISH | General specification for light sources for aeronautics | 1 | 4 | 919 | | Need to translate |
| Delete | 3 | SJ 20742-1999_ENGLISH | Series of basic dimensions of telescopic slide rails | 1 | 2 | 199 | | Need to translate |
| Delete | 4 | SJ 20720-1998_ENGLISH | General specification for split Stirling cryocooler | 1 | 3 | 559 | | Need to translate |
| Delete | 5 | SJ 20719-1998_ENGLISH | Method of determination X value for mercury cadmium telluride for use in X-ray fluorimetry | 1 | 3 | 239 | | Need to translate |
| Delete | 6 | SJ 20718-1998_ENGLISH | Method of determination trace elements in mercury cadmium telluride crystal | 1 | 2 | 199 | | Need to translate |
| Delete | 7 | SJ 20739-1999_ENGLISH | General specification for battlefield reconnaissance radars | 1 | 4 | 839 | | Need to translate |
| Delete | 8 | SJ 20737-1999_ENGLISH | General specification for command telephone system on shipboard | 1 | 4 | 839 | | Need to translate |
| Delete | 9 | SJ 20732-1999_ENGLISH | General specification for radio frequency power amplifier mobile communication | 1 | 3 | 599 | | Need to translate |
| Delete | 10 | SJ 20714-1998_ENGLISH | Test method for sub-surface damage of gallium arsenide polished wafer by X-ray double crystal diffraction | 1 | 2 | 159 | | Need to translate |
| Delete | 11 | SJ 20713-1998_ENGLISH | Method for the determination of 12 species of impurities including copper, manganese, magnesium, vanadium, titanium in high-purity gallium used for gallium arsenide by ICP spectrometry | 1 | 3 | 239 | | Need to translate |
| Delete | 12 | SJ 20715-1998_ENGLISH | Specification for copper-beryllium alloy plate and strip for use in electronic components | 1 | 3 | 319 | | Need to translate |
| More PDF Samples Total (USD) | 7028.00 |