GB/T 29849-2013 English PDF

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GB/T 29849-2013: Test method for measuring surface metallic contamination of silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 29849-2013	209	Add to Cart	3 days	Test method for measuring surface metallic contamination of silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry	Valid

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Basic data

Standard ID: GB/T 29849-2013 (GB/T29849-2013)
Description (Translated English): Test method for measuring surface metallic contamination of silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: H82
Classification of International Standard: 29.045
Word Count Estimation: 9,914
Quoted Standard: GB/T 25915.1-2010
Regulation (derived from): National Standards Bulletin No. 22 of 2013
Issuing agency(ies): General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary: This standard specifies: the use of inductively coupled plasma mass spectrometry (ICP-MS) was measured with a silicon photovoltaic cell surface trace metal impurity levels methods. This standard applies to: photovoltaic cells using silicon surface trace m

GB/T 29849-2013: Test method for measuring surface metallic contamination of silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Test method for measuring surface metallic contamination of silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry ICS 29.045 H82 National Standards of People's Republic of China Photovoltaic cell surface of the metal impurity content of silicon material Inductively Coupled Plasma Mass Measurement Issued on. 2013-11-12 2014-04-15 implementation Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China Standardization Administration of China released

Foreword

This standard was drafted in accordance with GB/T 1.1-2009 given rules. Please note that some of the content of this document may involve patents. Release mechanism of the present document does not assume responsibility for the identification of these patents. The standard equipment by the National Standardization Technical Committee and the semiconductor material (SAC/TC203) and focal points. This standard was drafted. the information industry materials for Quality Supervision and Inspection Center, China Electronics Standardization Institute, Jiangsu Zhongneng Polysilicon Technology Development Co., auxiliary materials and electronic functional State Quality Supervision and Inspection Center, Tianjin Central European Semiconductor Materials Technology Co., the company. The main drafters of this standard. Chulian Qing, Wang Yi, Xu Jing, Wang Xin, He Xiukun, Peihui Chuan, Fengya Bin, Lu Wenfeng, Zhang Xue-nan. Photovoltaic cell surface of the metal impurity content of silicon material Inductively Coupled Plasma Mass Measurement Warning. Use of this standard shall have a person experiences regular laboratory work. This standard does not point out all possible security issues. Users have the responsibility to take appropriate safety and health practices and to ensure compliance with the conditions relevant national regulations.

1 Scope

This standard specifies the use of inductively coupled plasma mass spectrometry (ICP-MS) was measured with a silicon photovoltaic cell surface trace metal impurities The method of content. This standard applies to solar cell silicon surface trace metal impurities in sodium, magnesium, aluminum, potassium, calcium, titanium, chromium, iron, nickel, copper, zinc, molybdenum content Determination. Measuring range of the respective elements shown in Table 1. Table 1 surface of the metal impurity content measured in units of nanograms per gram range Element name The element symbol measuring range Sodium Na 3 × 10-2 ~ 2 × 103 Magnesium Mg 2 × 10-2 ~ 2 × 103 Aluminum Al 2 × 10-2 ~ 2 × 103 Potassium K 2 × 10-2 ~ 2 × 103 Calcium Ca 4 × 10-2 ~ 2 × 103 Titanium Ti 1 × 10-2 ~ 2 × 103 Chromium Cr 1 × 10-2 ~ 2 × 103 Iron Fe 4 × 10-2 ~ 2 × 103 Ni Ni 1 × 10-2 ~ 2 × 103 Copper Cu 3 × 10-2 ~ 2 × 103 Zinc Zn 2 × 10-2 ~ 2 × 103 Molybdenum Mo 1 × 10-2 ~ 2 × 103

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein Member. For undated references, the latest edition (including any amendments) applies to this document. GB/T 25915.1-2010 cleanroom and associated controlled environments - Part 1. air cleanliness level

3 Method summary

The sample with nitric acid, hydrofluoric acid, hydrogen peroxide, and a mixture of water extraction certain time, after the samples were taken out, the leach solution is heated and evaporated ......

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