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Database: 189760 (18 Oct 2025)
YD/T 3037.2-2023 English PDF
YD/T 3037.2: Evolution and historical versions
Standard ID
Contents [version]
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Standard Title (Description)
Status
PDF
YD/T 3037.2-2023
English
RFQ
ASK
3 days [Need to translate]
(Test method for characteristics of mass storage interface between Universal Integrated Circuit Card (UICC) and terminals - Part 2: UICC)
Valid
YD/T 3037.2-2023
YD/T 3037.2-2016
English
RFQ
ASK
8 days [Need to translate]
Test methods for USB characteristic between UICC and terminal interface - Part 2: UICC
Obsolete
YD/T 3037.2-2016
YD/T 3037.2-2015
English
RFQ
ASK
3 days [Need to translate]
(Universal Integrated Circuit Card (UICC) and USB interface characteristics between the terminal test methods - Part 2: UICC)
YD/T 3037.2-2015
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YD/T 3037.1
YD/T 3037.1
Basic data
Standard ID
YD/T 3037.2-2023 (YD/T3037.2-2023)
Description (Translated English)
(Test method for characteristics of mass storage interface between Universal Integrated Circuit Card (UICC) and terminals - Part 2: UICC)
Sector / Industry
Telecommunication Industry Standard (Recommended)
Classification of Chinese Standard
M36
Classification of International Standard
33.060.20
Date of Issue
2023-12-20
Date of Implementation
2024-04-01
Issuing agency(ies)
Ministry of Industry and Information Technology
Summary
This standard specifies the testing methods for the UICC part of the mass storage interface characteristics between the Universal Integrated Circuit Card (UICC) and the terminal, mainly including: physical characteristics, electrical characteristics, establishment of initial communication protocol, functional testing and performance testing. This standard applies to the development and production of UICC cards that support large-capacity storage interfaces.