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Database: 189759 (19 Oct 2025)
YD/T 3037.1-2023 English PDF
YD/T 3037.1: Evolution and historical versions
Standard ID
Contents [version]
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Standard Title (Description)
Status
PDF
YD/T 3037.1-2023
English
RFQ
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3 days [Need to translate]
(Test method for characteristics of mass storage interface between Universal Integrated Circuit Card (UICC) and terminal - Part 1: Terminal)
Valid
YD/T 3037.1-2023
YD/T 3037.1-2016
English
1359
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6 days [Need to translate]
Test methods for USB characteristic between UICC and ternninal interfiace - Part 1: Terminal
Obsolete
YD/T 3037.1-2016
YD/T 3037.1-2015
English
RFQ
ASK
3 days [Need to translate]
(Universal Integrated Circuit Card (UICC) and USB interface characteristics between the terminal test methods - Part 1: Terminal)
YD/T 3037.1-2015
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YD/T 3037.2
YD/T 3037.2
Basic data
Standard ID
YD/T 3037.1-2023 (YD/T3037.1-2023)
Description (Translated English)
(Test method for characteristics of mass storage interface between Universal Integrated Circuit Card (UICC) and terminal - Part 1: Terminal)
Sector / Industry
Telecommunication Industry Standard (Recommended)
Classification of Chinese Standard
M36
Date of Issue
2023-12-20
Date of Implementation
2024-04-01
Issuing agency(ies)
Ministry of Industry and Information Technology
Summary
This standard specifies the testing method for the characteristics of the large-capacity storage interface between the Universal Integrated Circuit Card (UICC) on the terminal and the terminal, mainly including: electrical characteristics, establishment of initial communication protocol, performance testing and functional testing. This standard applies to the development and production of terminal interfaces that support large-capacity storage interfaces.