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Database: 189760 (25 Oct 2025)
SJ/T 1147-1993 English PDF
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SJ/T 1147-1993
: Test methods for dielectric loss angle tangent and dielectric canstant of organic film for use in capacitors
Status: Obsolete
SJ/T 1147: Evolution and historical versions
Standard ID
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Standard Title (Description)
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SJ/T 1147-1993
English
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Test methods for dielectric loss angle tangent and dielectric canstant of organic film for use in capacitors
Obsolete
SJ/T 1147-1993
SJ 1147-1977
English
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3 days [Need to translate]
(Chinese Industry Standard)
Obsolete
SJ 1147-1977
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Basic data
Standard ID
SJ/T 1147-1993 (SJ/T1147-1993)
Description (Translated English)
Test methods for dielectric loss angle tangent and dielectric canstant of organic film for use in capacitors
Sector / Industry
Electronics Industry Standard (Recommended)
Classification of Chinese Standard
L90
Word Count Estimation
3,319
Date of Issue
12/17/1993
Date of Implementation
6/1/1994
Older Standard (superseded by this standard)
SJ 1147-1977
Quoted Standard
SJ/T 1145; SJ/T 1146
Regulation (derived from)
Industry-Science (2010) No. 77
Summary
This standard applies to a thickness under normal weather conditions or under 2 ~ 50��m organic thin film capacitors with high temperature, the frequency of the measured values ??and the tangent of the dielectric loss angle of the dielectric constant 50Hz, 1kHz or 1MHz time.