HOME   Cart(5)   Quotation   About-Us Policy PDFs Standard-List
www.ChineseStandard.net Database: 189760 (25 Oct 2025)

GB/T 36474-2018 English PDF

US$359.00 ยท In stock
Delivery: <= 4 days. True-PDF full-copy in English will be manually translated and delivered via email.
GB/T 36474-2018: Semiconductor integrated circuit -- Measuring methods for double data rate 3 synchronous dynamic random-access memory (DDR3 SDRAM)
Status: Valid
Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)StatusPDF
GB/T 36474-2018English359 Add to Cart 4 days [Need to translate] Semiconductor integrated circuit -- Measuring methods for double data rate 3 synchronous dynamic random-access memory (DDR3 SDRAM) Valid GB/T 36474-2018

PDF similar to GB/T 36474-2018


Standard similar to GB/T 36474-2018

GB/T 43770   SAMR 76   SJ/T 11460.6.4   GB/T 20870.4   GB/T 36477   

Basic data

Standard ID GB/T 36474-2018 (GB/T36474-2018)
Description (Translated English) Semiconductor integrated circuit -- Measuring methods for double data rate 3 synchronous dynamic random-access memory (DDR3 SDRAM)
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard L56
Classification of International Standard 31.200
Word Count Estimation 18,191
Date of Issue 2018-06-07
Date of Implementation 2019-01-01
Issuing agency(ies) State Administration for Market Regulation, China National Standardization Administration

GB/T 36474-2018: Semiconductor integrated circuit -- Measuring methods for double data rate 3 synchronous dynamic random-access memory (DDR3 SDRAM)


---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Semiconductor integrated circuit--Measuring methods for double data rate 3 synchronous dynamic random access memory (DDR3 SDRAM) ICS 31.200 L56 National Standards of People's Republic of China Semiconductor integrated circuit Third Generation Double Data Rate Synchronous Dynamic Randomization Memory (DDR3 SDRAM) Test Method Memory(DDR3SDRAM) Published on.2018-06-07 2019-01-01 Implementation National Market Supervision Administration China National Standardization Administration released Directory Preface III 1 Scope 1 2 Normative references 1 3 Terms and Definitions 1 4 General requirements 2 4.1 General Rule 2 4.2 General Requirements for Functional Verification 2 4.3 Test Parameters for Electrical Parameters Test 2 4.4 Electrical Parameters Test Oscilloscope 2 4.5 Test Environment 2 5 Detailed Request 3 5.1 Functional Verification 3 5.2 Clock 3 5.3 Reading Data Parameter 6 5.4 write data parameters 8 5.5 Supply Current (IDD)/Data Pin Supply Current (IDDQ) 11

Foreword

This standard was drafted in accordance with the rules given in GB/T 1.1-2009. Please note that some of the contents of this document may involve patents. The issuing agency of this document does not assume responsibility for identifying these patents. This standard was proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This standard is under the jurisdiction of the National Semiconductor Device Standardization Technical Committee (SAC/TC78). This standard was drafted by. China Electronics Standardization Institute, Xi'an Ziguang Guoxin Semiconductor Co., Ltd., Shanghai High Performance Integrated Power Road Design Center, Wuhan Core Technology Co., Ltd., and Chengdu Hua Microelectronics Technology Co., Ltd. The main drafters of this standard. Kong Xianwei, Yin Mengdi, Yin Ping, Ju Peng Jin, College, Liu Jianming. Semiconductor integrated circuit Third Generation Double Data Rate Synchronous Dynamic Randomization Memory (DDR3 SDRAM) Test Method

1 Scope

This standard specifies the functional verification of the third generation double data rate synchronous dynamic random access memory (DDR3 SDRAM) for semiconductor integrated circuits. Identification and electrical parameter testing methods. This standard applies to the third generation of double data rate synchronous dynamic random access memory (DDR3 SDRAM) in the field of semiconductor integrated circuits. Functional verification and electrical parameter testing.

2 Normative references

The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this article Pieces. For undated references, the latest version (including all amendments) applies to this document. GB/T 17574-1998 Semiconductor device integrated circuit Part 2. Digital integrated circuits

3 Terms and Definitions

The following terms and definitions apply to this document. 3.1 Device under test deviceundertest; DUT Tested object during the test. 3.2 Automatic test system automatictestequipment;ATE Integrated integrated circuit test system. Automatic test system with multiple power supplies, digital test channels and dedicated test software Development environment. 3.3 Engineering Evaluation Board evaluationboard; EVB Test engineering evaluation board for functional verification. Engineering Evaluation Board Supports Processor Basic and Extended Functions with Input Output Port, and leave the necessary test interface. 3.4 Double data rate doubledatarate;DDR The architecture of two data transmissions in each clock cycle transfers data on the rising and falling clock edges, respectively. 3.5 Synchronous Dynamic Random Access Memory synchronousdynamicrandomaccessmemory; SDRAM With the clock as the data synchronization reference, it is necessary to continuously refresh the stored data and randomly specify the memory that stores the address.

Tips & Frequently Asked Questions:

Question 1: How long will the true-PDF of GB/T 36474-2018_English be delivered?

Answer: Upon your order, we will start to translate GB/T 36474-2018_English as soon as possible, and keep you informed of the progress. The lead time is typically 2 ~ 4 working days. The lengthier the document the longer the lead time.

Question 2: Can I share the purchased PDF of GB/T 36474-2018_English with my colleagues?

Answer: Yes. The purchased PDF of GB/T 36474-2018_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet.

Question 3: Does the price include tax/VAT?

Answer: Yes. Our tax invoice, downloaded/delivered in 9 seconds, includes all tax/VAT and complies with 100+ countries' tax regulations (tax exempted in 100+ countries) -- See Avoidance of Double Taxation Agreements (DTAs): List of DTAs signed between Singapore and 100+ countries

Question 4: Do you accept my currency other than USD?

Answer: Yes. If you need your currency to be printed on the invoice, please write an email to [email protected]. In 2 working-hours, we will create a special link for you to pay in any currencies. Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.