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GB/T 36361-2018 English PDF

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GB/T 36361-2018: Accelerated life test method for LED
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PDF similar to GB/T 36361-2018


Standard similar to GB/T 36361-2018

SJ/T 11281   GB/T 18910.2   GB/T 36613   GB/T 36362   

Basic data

Standard ID GB/T 36361-2018 (GB/T36361-2018)
Description (Translated English) Accelerated life test method for LED
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard L45
Classification of International Standard 31.260
Word Count Estimation 14,142
Date of Issue 2018-06-07
Date of Implementation 2019-01-01
Issuing agency(ies) State Administration for Market Regulation, China National Standardization Administration

GB/T 36361-2018: Accelerated life test method for LED

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Accelerated life test method for LED ICS 31.260 L45 National Standards of People's Republic of China LED accelerated life test method Published on.2018-06-07 2019-01-01 Implementation National Market Supervision Administration China National Standardization Administration released Directory Preface III Introduction IV 1 Scope 1 2 Normative references 1 3 Terms and Definitions 1 4 General requirements 1 5 Constant Temperature Stress Test Procedure 2 6 Data Processing Method 3 7 Test Data Analysis and Processing 4 8 Test report 5 Appendix A (informative) Appendix 7 of the relevant data Reference 9

Foreword

This standard was drafted in accordance with the rules given in GB/T 1.1-2009. Please note that some of the contents of this document may involve patents. The issuing agency of this document does not assume responsibility for identifying these patents. This standard is under the jurisdiction of the Ministry of Industry and Information Technology (Electronics) of the People's Republic of China. This standard was drafted. China Electronics Technology Group Corporation 13th Institute, National Semiconductor Device Quality Supervision and Inspection Center. The main drafters of this standard. Zhao Min, Zhang Ruixia, Huang Jie, Liu Dongyue, Zhang Chenchao, Ru Zhiqin, Xu Lisheng, Li Changpu.

Introduction

Life tests are performed in the laboratory to simulate various conditions of use. To shorten the test time, without changing the conditions of the failure mechanism Next, the test was conducted by increasing the stress method, which was called accelerated life test. Accelerated life testing allows quick assessment of product life Life. This standard gives a constant temperature stress accelerated life test. Light-emitting diodes (abbreviated as LED) generally use the attenuation value of the luminous flux as a criterion to obtain test data. The conventional method requires a long test time. At the time of examination, this standard gives a method that can shorten the test time to obtain test data and a relatively simple data processing program (referred to as degradation The coefficient analysis method can obtain the lumen maintenance life of the LED in a short test time. White LEDs use both light flux attenuation and chromaticity parameters (correlated color temperature, color rendering index, color tolerance, etc.) drift as failure criteria At the same time, the life expectancy of the white LED can also be obtained by using the life test and accelerated life graph estimation method or the best linear unbiased estimation method. However, it requires a long test time, specific reference can be made to GB/T 2689.2-1981 "lifetime test and accelerated life test chart estimation method (For Weibull Distribution), GB/T 2689.4-1981 "Best Linear Unbiased Estimation Method for Life Test and Accelerated Life Test (for Weibu "" Distribution "" and GB/T 36362-2018 "LED application product reliability test point estimation and interval estimation (index distribution)." LED accelerated life test method

1 Scope

This standard specifies the test method for obtaining the LED luminous flux maintenance life through a constant temperature stress accelerated life test. This standard applies to visible light LEDs with slow degraded failure modes.

2 Normative references

The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this article Pieces. For undated references, the latest version (including all amendments) applies to this document. GB/T 2689.1-1981 General principles of constant stress life test and accelerated life test method SJ/T 11394-2009 Semiconductor light-emitting diode test method

3 Terms and Definitions

The following terms and definitions apply to this document. 3.1 Initial value initialvalue Accelerated life test initial (0h) measured photoelectric parameters. 3.2 LED lumen maintenance LED luminousmaintainlife Under the specified operating conditions, the LED luminous flux decays to the specified continuous operating time. Note 1. LED lumen maintenance units in hours (h). Note 2. The specified value is usually 70% of the initial value. Note 3. The radiated flux is generally for blue LEDs.

4 General requirements

4.1 Environmental conditions Unless otherwise specified, the relevant provisions of 4.1 in SJ/T 11394-2009 shall be followed. Measurements should be made at an ambient temperature of 25 °C ± 1 °C. Other environmental conditions should be as follows. a) The measurement environment should have no mechanical vibration, electromagnetic and light interference that affects the test accuracy; b) Unless otherwise specified, LED optoelectronic parameters should be performed under thermal equilibrium (to have sufficient warm-up time); c) The measurement system should be well grounded. 4.2 Measurement Conditions (Allowed Deviations) Unless otherwise specified, measurement conditions should meet the following requirements. a) Bias conditions should be within ±1% of the specified value; b) The allowable deviation of the input pulse frequency and duty cycle should be within ±2% of the specified value.

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